Home
Glossary
Acronyms
Beware
Contact
 
 

TWO-PORT NOISE PARAMETERS

Rules and models destroy genius and art”

(William Hazlitt)

  1. Himmelfarb M., Belostotski L.: On Impedance-Pattern Selection for Noise Parameter Measurement. IEEE Trans on MTT, Vol. 64, no. 1, 2016, pp. 258 – 270. DOI 10.1109/TMTT.2015.2504500

  2. Prinsloo D.S., Meyer P.: Multi-mode noise parameters for multi-port networks. IET Microwaves, Antennas & Propagation, Vol. 10, no. 3, 2016, pp. 333 – 338. DOI 10.1049/iet-map.2015.0458

  3. Dobrowolski J.A.: Differential Noise Figure and Gain De-Embedding: the Wave Approach. Int. J. of Electronics & Telecom., Vol. 62, no. 1, 2016, pp. 6569. DOI 10.1515/eletel-2016-0009

  4. Chie-In Lee, Wei-Cheng Lin, Yan-Ting Lin: An Improved Cascade-Based Noise Deembedding Method for On-Wafer Noise Parameter Measurements. IEEE ED Lett., Vol. 36, no. 4, 2015, pp. 291293. DOI 10.1109/LED.2015.2405915

  5. Andee Y., C. Arnaud, F. Graux, F. Danneville: De-embedding differential noise figure using the correlation of output noise waves. 85th Microwave Measurement Conference (ARFTG), 2015 , pp. 14. DOI 10.1109/ARFTG.2015.716291

  6. Ahmed A.-R., Yeom Kyung-Whan: An Extraction of Two-Port Noise Parameters From Measured Noise Powers Using an Extended Six-Port Network. IEEE Trans on MTT, Vol. 62, no. 10, 2014, pp. 24232434. DOI 10.1109/TMTT.2014.2345693

  7. Pyatykh S., Hesser J.: Image Sensor Noise Parameter Estimation by Variance Stabilization and Normality Assessment. IEEE Trans on Image Processing, Vol. 23, no. 9, 2014, pp. 39903998. DOI 10.1109/TIP.2014.2339194

  8. Jin X., Xu Z., Hirakawa K.: Noise Parameter Estimation for Poisson Corrupted Images Using Variance Stabilization Transforms. IEEE Trans on Image Processing, Vol. 23, no. 3, 2014, pp. 13291339. DOI 10.1109/TIP.2014.2300813

  9. Mäkitalo M., Foi A.: Noise Parameter Mismatch in Variance Stabilization, with an Application to Poisson–Gaussian Noise Estimation. IEEE Trans on Image Processing, Vol. 23, no. 12, 2014, pp. 53485359. DOI 10.1109/TIP.2014.2363735

  10. Vladica Đorđević, Zlatica Marinković, Vera Marković, Olivera Pronić-Rančić: Extraction of Pospieszalski's noise model parameters of microwave FETs based on ANNs. Symp. on Neural Network Applications in Electrical Eng. (NEUREL), 2014, pp. 51 – 54. DOI 10.1109/NEUREL.2014.7011457

  11. Ong S.N., Yeo K.S., Chew K.W.J., Chan L.H.K.: Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs. IEEE Trans on MTT, Vol. 62, no. 9, 2014, pp. 19731985. DOI 10.1109/TMTT.2014.2340375

  12. Fellas K., Mavredakis N., Pflanzl W., Seebacher E., Bucher M.: Simple 1/f noise parameter extraction method for high-voltage MOSFETs. Int. Conf on Microelectronics (MIEL), 2014, pp. 8992. DOI 10.1109/MIEL.2014.6842092

  13. Colangeli S., Cleriti R., Palombini D., Limiti E.: Numerical evaluation of cable noise parameters under cryogenic thermal gradients. 9th European Microwave Integrated Circuits Conf (EuMIC), 2014, pp. 194197. DOI 10.1109/EuMIC.2014.6997825

  14. Mohd S.K.K., Noh N.M., Sidek O.: Evaluation of noise parameter characterization methods for radio frequency integrated circuit (RFIC) device. Journal of Optoelectronics & Advanced Materials, Vol. 16 , no. 5-6, 2014, pp. 591 – 599.

  15. Andee Y., Prouvee J., Graux F., Danneville F.: Determination of noise figure of differential circuits using correlation of output noise waves. Electronics Lett., Vol. 50, no. 9, 2014, pp. 665 – 666. DOI 10.1049/el.2014.0212

  16. Ivković N., Marinković Z., Pronić-Rančić O., Marković V.: New Neural Procedure for Extraction of Parameters of Microwave FET Noise Models. Telfor Journal, Vol. 5, no. 2, 2013, pp. 156 – 160.

  17. Mukherjee C., Maiti C.K.: Channel thermal noise modeling and high frequency noise parameters of tri-gate FinFETs. 20th IEEE Int. Symp on the Physical & Failure Analysis of Integrated Circuits (IPFA), 2013, pp. 732 – 735. DOI 10.1109/IPFA.2013.6599265

  18. Ivrlac M.T., Lehmeyer B., Nossek J.A., Hofmann C.A., Lankl B.: Estimation of Noise Parameters in Multi-Antenna Receivers using Digitized Signal Samples. Int. ITG Workshop on Smart Antennas (WSA), 2013, pp. 1 – 6.

  19. Boglione L.: Considerations on the 4NTo/Tm Ratio and the Noise Correlation Matrix of Active and Passive Two-Port Networks. IEEE Trans on MTT, Vol. 61, no. 12, 2013, pp. 4145 – 4153. DOI 10.1109/TMTT.2013.2287859

  20. Dietrich J. L.: Unified Theory of Linear Noisy Two-Ports. IEEE Trans on MTT, Vol. 61, no. 11, 2013, pp. 3986 – 3997. DOI 10.1109/TMTT.2013.2284492

  21. Zhou Qiuzhan, Liu Xiang, Liu Pingping : A Novel Method for Analyzing the Noise Characteristic of Solar Cells with E-n-I-n Model. Chinese Journal of Electronics, Vol. 22, no. 4, 2013, pp. 683 – 688.

  22. Sevimli O., Parker A.E., Mahon S.J., Fattorini A.P.: De-embedding System Noise from Two-Channel Low-Frequency Noise Measurements. Int. Conf on Noise and Fluctuations (ICNF), 2013, pp. 1 – 4. DOI 10.1109/ICNF.2013.6579002

  23. Hadjiloucas S., Walker G.C., Bowen J.W.: One-Port De-Embedding Technique for the Quasi-Optical Characterization of Integrated Components. IEEE Sensors Journal, Vol. 13, no. 1, 2013, pp. 111 – 123. DOI 10.1109/JSEN.2012.2226713

  24. Ramesh R., Madheswaran M., Kannan K.: Physical noise model of a uniformly doped nanoscale FinFET photodetector. Optik, Vol. 123, no. 12, 2012, pp. 1087 – 1094. DOI 10.1016/j.ijleo.2011.07.037

  25. Tagro Y., N. Waldhoff, D. Gloria, S. Boret, G. Dambrine: In Situ Silicon-Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction Using Multi-Impedance Method for Transistor Characterization. IEEE Trans on Semiconductor Manufacturing, Vol. 25, no. 2, 2012, pp. 170 – 177. DOI 10.1109/TSM.2011.2181673

  26. Boglione L.: A noise parameters extraction procedure suitable for on-wafer device characterization. Int. Semiconductor Conf. Dresden-Grenoble (ISCDG), 2012, pp. 135 – 138. DOI 10.1109/ISCDG.2012.6360037

  27. Colangeli S., Ciccognani W., Palomba M., Limiti E.: Automated determination of device noise parameters using multi-frequency, source-pull data. 7th European Microwave Integrated Circuits Conf (EuMIC), 2012, pp. 163 – 166.

  28. Acito N., Diani M., Corsini G.: Signal-Dependent Noise Modeling and Model Parameter Estimation in Hyperspectral Images. IEEE Trans on Geoscience and Remote Sensing, Vol. 49, no. 8, 2011, pp. 2957 – 2971. DOI 10.1109/TGRS.2011.2110657

  29. Robens M., Wunderlich R., Heinen S.: Differential Noise Figure De-Embedding: A Comparison of Available Approaches. IEEE Trans on MTT, Vol. 59, no. 5, 2011, pp. 1397 – 1407. DOI 10.1109/TMTT.2010.2103093

  30. Garcia-Perez Ó, Gonzalez-Posadas V., Garcia-Munoz L.E., Segovia-Vargas D.: Noise-Figure Measurement of Differential Amplifiers Using Nonideal Baluns. IEEE Trans on MTT, Vol. 59, no. 6, 2011, pp. 1658 – 1664. DOI 10.1109/TMTT.2011.2124469

  31. Kenneth H.K. Yau, Chevalier P., Chantre A., Voinigescu S.P.: Characterization of the Noise Parameters of SiGe HBTs in the 70–170-GHz Range. IEEE Trans on MTT, Vol. 59, no. 8, 2011, pp. 1983 – 2000. DOI 10.1109/TMTT.2011.2153869

  32. Yau K.H.K., Chevalier P., Chantre A., Voinigescu S.P.: Characterization of the Noise Parameters of SiGe HBTs in the 70–170-GHz Range. IEEE Trans. on MTT, Vol. 59, no. 8, 2011, pp. 1983 – 2000. DOI 10.1109/TMTT.2011.2153869

  33. Jianjun Gao: Direct parameter-extraction method for MOSFET noise model from microwave noise figure measurement. Solid-State Electronics, Vol. 63, no. 1, 2011, pp 42 – 48. DOI 10.1016/j.sse.2011.05.011

  34. Randa J., Dunsmore J., Dazhen Gu, Ken Wong, Walker D.K., Pollard R.D.: Verification of Noise-Parameter Measurements and Uncertainties. IEEE Trans on Instr. & Meas., Vol. 60, no. 11, 2011, pp. 3685 – 3693. DOI 10.1109/TIM.2011.2138270

  35. Belostotski L.: On the Number of Noise Parameters for Analyses of Circuits With MOSFETs. IEEE Trans on MTT, Vol. 59, no. 4, 2011, pp. 877 – 881. DOI 10.1109/TMTT.2011.2109734

  36. Meys R.P., Boukerroum F.: Broadband Noise System Allows Measurements According to Both Standard Methods. IEEE Trans on Instr. & Meas., Vol. 60, no. 4, 2011, pp. 1316 – 1327. DOI 10.1109/TIM.2010.2087813

  37. Xi Sung Loo, Kiat Seng Yeo, Chew K.W.J., Chan L.H.K., Shih Ni Ong, Manh Anh Do, Chirn Chye Boon: An Accurate Two-Port De-Embedding Technique for RF/Millimeter-Wave Noise Characterization and Modeling of Deep Submicrometer Transistors. IEEE Trans on MTT, Vol. 59, no. 2, 2011, pp. 479 – 487. DOI 10.1109/TMTT.2010.2097770

  38. Ferrero A., Garelli M., Grossman B., Choon S., Teppati V.: Uncertainty in multiport S-parameters measurements. Microwave Measurement Conference (ARFTG), 2011, pp. 1 – 4. DOI 10.1109/ARFTG77.2011.6034578

  39. Pal'a J., BydzovskyJ., Stoyka V., Kovac F.: Stabilization of the Barkhausen Noise Parameters. IEEE Trans on Magnetics, Vol. 46, no. 2, 2010, pp. 207 – 209. DOI 10.1109/TMAG.2009.2034019

  40. Tiemeijer L.F., Pijper R.M.T., van der Heijden E.: Complete On-Wafer Noise-Figure Characterization of 60-GHz Differential Amplifiers. IEEE Trans on MTT, Vol. 58, no. 6, 2010, pp. 1599 – 1608. DOI 10.1109/TMTT.2010.2049167

  41. Pasquet D., Andrei C., Lesénéchal D., Descamps P.: New measurement method for two-port noise parameters. Int. Symp. on Physics & Eng. of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010, pp. 1 – 3. DOI 10.1109/MSMW.2010.5545989

  42. Mohd S.K.K., Zulkifli T.Z.A., Sidek O.: A general on-wafer noise figure de-embedding technique with gain uncertainity analysis. IEICE Electronics Express, Vol. 7, no. 4, 2010, pp. 302 – 307. DOI 10.1587/elex.7.302

  43. Sakian P., Janssen E., Essing J., Mahmoudi, R., van Roermund, A.: Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits. Microwave Measurement Conference (ARFTG), 2010, pp. 1 – 4. DOI 10.1109/ARFTG76.2010.5700051

  44. Belostotski L., Haslett J.W.: Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers. IEEE Trans on MTT, vol. 58, no 1, 2010, pp. 236 – 250. DOI 10.1109/TMTT.2009.2036411

  45. Garelli M., Ferrero A., Bonino S.: A Complete Noise- and Scattering-Parameters Test-Set. IEEE Trans on MTT, Vol. 57, no. 3, 2009, pp. 716 – 724. DOI 10.1109/TMTT.2009.2013315

  46. Weinreb S.: Fundamentals of Noisy Networks. Low Noise Figure Measurements at Cryogenic and Room Temperatures, Workshop, Gothenburg, Sweden, 2009. http://radiometer.caltech.edu/papers.html

  47. Yin-Cheng Chang, Shuw-Guann Lin, Hsien-Yuan Liao, Hwann-Kaeo Chiou, Ying-Zong Juang: On-wafer differential noise figure and large signal measurements of low-noise amplifier. European Microwave Conf. (EuMC), 2009, pp. 699 – 702.  http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5296568&isnumber=5295900

  48. Chih-Hung Chen, Ying-Lien Wang, Bakr M.H., Zheng Zeng: Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements. IEEE Trans. on Instr. & Meas., Vol. 57, no. 11, 2008, pp. 2462 – 2471. DOI 10.1109/TIM.2008.925021

  49. Giannini F., Bourdel E., Pasquet D.: A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements. IEEE Trans on Instr. & Meas., Vol. 57, no. 2, 2008, pp. 261 – 267. DOI 10.1109/TIM.2007.909491

  50. Pasquet D., Bourdel E., Quintanel S., Ravalet T., Houssin P.: New Method for Noise-Parameter Measurement of a Mismatched Linear Two-Port Using Noise Power Wave Formalism. IEEE Trans on MTT, Vol. 56, no. 9, 2008, pp. 2136 – 2142. DOI 10.1109/TMTT.2008.2002235

  51. Yan Cui, Guofu Niu, Ying Li, Taylor, S.S., Qingqing Liang, Cressler J.D.: On the Excess Noise Factors and Noise Parameter Equations for RF CMOS. IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Syst. (SiRF), 2007, pp. 40 – 43. DOI 10.1109/SMIC.2007.322764

  52. Wang Jun: A Modified F50 Technique to Determine the Noise Parameters of Active Microwave Devices. IEEE Int. Symp on Microwave, Antenna, Propagation & EMC Technologies for Wireless Comm. (MAPE), 2007, pp. 315 – 318. DOI 10.1109/MAPE.2007.4393610

  53. Wong K., Pollard R., Shoulders B., Rhymes L.: Using a mismatch transmission line to verify accuracy of a high performance noise figure measurement system. ARFTG Conf. Digest, 2007, pp. 1 – 5. DOI 10.1109/ARFTG.2007.5456324

  54. Kim-Ming Chen, Guo-Wei Huang, Han-Yu Chen, Hsin-Hui Hu, Wen-Shiang Liao, Chun-Yen Chang: Extraction of Correlated Base and Collector Current RF Noise Sources in SiGe HBTs. IEEE Int. Conf of Electron Devices and Solid-State Circuits (EDSSC), 2007, pp. 765 – 768. DOI 10.1109/EDSSC.2007.4450238

  55. Navid R., T.H. Lee, R.W. Dutton: A Circuit-Based Noise Parameter Extraction Technique for MOSFETs. IEEE Int. Symp. ISCAS, 2007, pp. 3347 – 3350. DOI 10.1109/ISCAS.2007.378228

  56. Weatherspoon M.H., Dunleavy L.P.: Experimental validation of generalized equations for FET cold noise source design. IEEE Trans on MTT, Vol. 54, no. 2, 2006, pp. 608 – 614. DOI 10.1109/TMTT.2005.862674

  57. Belkin S.: Differential Circuit Characterization with Two-Port S-Parameters. IEEE Microwave Magazine, Vol. 7, no. 6, 2006, pp. 86 – 99. DOI 10.1109/MW-M.2006.250318

  58. Froberg N.M., Ackerman E.I., Cox C.H.: Analysis of signal to noise ratio in photonic beamformers. Proc. IEEE Aerospace Conf. (AERO), 2006 pp. 12. DOI 10.1109/AERO.2006.1655823

  59. Zadeh A.R., Nikmehr S.: Noise Considerations in Cascaded Single-Stage Distributed Amplifiers. Int. Conf. on Electrical and Computer Engineering (ICECE), 2006, pp. 92 – 95. DOI 10.1109/ICECE.2006.355298

  60. Asgaran S., Deen M.J., Chih-Hung Chen: An analytical method to determine MOSFET's high frequency noise parameters from 50-W noise figure measurements. IEEE Radio Frequency Integrated Circuits (RFIC) Symp., 2006, pp. 304 DOI 10.1109/RFIC.2006.1651151

  61. Selim M.A., Salama A.E.: Accurate high frequency noise modeling in SiGe HBTs. IEEE Int. Symp on Circuits and Systems (ISCAS), Vol. 3, 2005, pp. 3011 – 3014. DOI 10.1109/ISCAS.2005.1465261

  62. Wang Jun: Measurement of noise figure of active microwave devices and the extraction of noise feature parameters. IEEE Int. Symp on Microwave, Antenna, Propagation & EMC Technologies for Wireless Comm. (MAPE), Vol. 1, 2005, pp. 581 – 586. DOI 10.1109/MAPE.2005.1617978

  63. Jianjun Gao, Xiuping Li, Lin Jia, Hong Wang, Boeck G.: Direct extraction of InP HBT noise parameters based on noise-figure measurement system. IEEE Trans. on MTT, Vol. 53, no. 1, 2005, pp. 330 – 335. DOI 10.1109/TMTT.2004.839919

  64. Wiatr W., Walker D.: Systematic Errors of Noise Parameter Determination Caused by Imperfect Source Impedance Measurement. IEEE Trans on Instr & Meas, Vol. 54, no. 2, 2005, pp. 696 – 700. DOI 10.1109/TIM.2005.843534

  65. Tierneijer L.F., Haverns R.J., de Kort A., Scholten A.: Improved Y-Factor Method for Wide-Band On-Wafer Noise Parameters Measurements. IEEE Trans on MTT, Vol 53, no. 9, 2005, pp. 2917 – 2924. DOI 10.1109/TMTT.2005.854243

  66. Burns J.G., Fudem H., Murphy M.R.: Measuring the on wafer noise figure of a W-band LNA - an application. 65th ARFTG Conf. Digest, 2005, pp. 4 – 17. DOI 10.1109/ARFTGS.2005.1500566

  67. Youssef A., Haslett J.: Guidelines for the noise optimization of 0.18 μm CMOS tuned LNAs. IEEE Int. Midwest Symp. on Circuits and Systems (MWSCAS), Vol. 3, 2004, pp. Iii-9 – 12. DOI 10.1109/MWSCAS.2004.1354278

  68. Banerjee G., Becher D.T., Hung C., Allstot D.J., Soumyanath K.: Measurement and modeling of noise parameters for desensitized low noise amplifiers. Proc. of the IEEE 2004 Custom Integrated Circuits Conf., 2004, pp. 387 – 390. DOI 10.1109/CICC.2004.1358829

  69. Wiatr W., Walker D.: Systematic Errors in Noise Parameter Determination Due to Imperfect Source Impedance Measurement. Conf. on Precision Electromagnetic Measurements (CPEM), 2004, pp. 416 – 417. DOI 10.1109/CPEM.2004.305285

  70. Liang Q., J.D. Cressler, G. Niu, Y. Lu, G. Freeman, D.C. Ahlgren, R.M. Malladi, K. Newton, D.L. Harame: A simple four-port parasitic deembedding methodology for high-frequency scattering parameter and noise characterization of SiGe HBTs. IEEE Trans on MTT, Vol. 51, no. 11, 2003, pp. 2165 – 2174. DOI 10.1109/TMTT.2003.818580

  71. Long S., Escotte L., Graffeuil J., Brasseau F., Cazaux J.L.: On-wafer noise characterization of low-noise amplifiers in the Ka-band. IEEE Trans on Instr. & Meas., Vol. 52, no. 5, 2003, pp. 1606 – 1610. DOI 10.1109/TIM.2003.817156

  72. Kolding T.E., Iversen C.R.: Simple noise deembedding technique for on-wafer shield-based test fixtures. IEEE Trans on MTT, Vol. 51, no. 1, 2003, pp. 11 – 15. DOI 10.1109/TMTT.2002.806938

  73. Fiegna C.: Analysis of gate shot noise in MOSFETs with ultrathin gate oxides. IEEE ED Lett., Vol. 24, no. 2, 2003, pp. 108 – 110. DOI 10.1109/LED.2002.807695

  74. Wang Jun: Two-port noise modeling of active microwave devices and its extraction of feature parameters. Proc. Int. Symp. on Antennas, Propagation and EM Theory (ISAPE), 2003, pp. 754 – 755. DOI 10.1109/ISAPE.2003.1276796

  75. Vähä-Heikkilä T., Lahdes M., Kantanen M.,Tuovinen J.: On-Wafer Noise Parameter Measurements at W-Band. IEEE Trans on MTT, Vol 51, no. 6, 2003, pp. 1621 – 1627. DOI 10.1109/TMTT.2003.812554

  76. Jianjun Gao, Choi Look Law, Hong Wang, Aditya S., Boeck G.: A new method for pHEMT noise-parameter determination based on 50-Ω noise measurement system. IEEE Trans. on MTT, Vol. 51, no. 10, 2003, pp. 2079 – 2089. DOI 10.1109/TMTT.2003.817680

  77. Collantes J.-M., Pollard R., Sayed M.: Effects of DUT Mismatch on the Noise Figure Characterization: A Comparative Analysis of Two Y-Factor Techniques. IEEE Trans. on Instr. & Meas., Vol 51, no. 6, 2002, pp. 1150 – 1156. DOI 10.1109/TIM.2002.808015

  78. De Dominicis M., Giannini F., Limiti E., Saggio G.: A Novel Impedance Pattern for Fast Noise Measurements. IEEE Trans. on Instr & Meas., Vol 51, no. 3, 2002, pp. 560 – 564. DOI 10.1109/TIM.2002.1017728

  79. Jung-Suk Goo, Hee-Tae Ahn, Ladwig D.J., Zhiping Yu, Lee T.H., Dutton R.W.: A noise optimization technique for integrated low-noise amplifiers. IEEE Journal of SSC, Vol. 37, no. 8, 2002, pp. 994 – 1002. DOI 10.1109/JSSC.2002.800956

  80. Basaran U., Berroth M.: High frequency noise modeling of SiGe HBTs using a direct parameter extraction technique. The 10th IEEE Int. Symp. on Electron Devices for Microwave and Optoelectronic Applic. (EDMO), 2002, pp. 189 – 195. DOI 10.1109/EDMO.2002.1174953

  81. Maya M.C., Lazaro A., Pradell L.: Cold-FET ENR Characterisation Applied to the Measurement of On-Wafer Transistor Noise Parameters. 32nd European Microwave Conf., 2002, pp.1 – 4. DOI 10.1109/EUMA.2002.339216

  82. Randa J.: Noise characterization of multiport amplifiers. IEEE Trans on MTT, Vol. 49, no. 10, 2001, pp. 1757 – 1763. DOI 10.1109/22.954781

  83. Niu G., Cressler J.D., Shiming Zhang, Ansley W.E., Webster C.S., Harame D.L.: A unified approach to RF and microwave noise parameter modeling in bipolar transistors. IEEE Trans on ED, Vol. 48, no. 11, 2001, pp. 2568 – 2574. DOI 10.1109/16.960384

  84. Rolfes I., Musch T., Schiek B.: A Highly Linear Digital Detector for Noise Parameter Measurements at Microwave Frequencies. European Microwave Conf. (EuMC), 2001, pp. 1 – 4. DOI 10.1109/EUMA.2001.338940

  85. Yao-Huang Kao, Meng-Ting Hsu, Yuan-Min Hsu: Extraction of noise source from noise parameters with RF CMOS devices. Proc. Asia-Pacific Microwave Conf. (APMC), Vol. 3, 2001, pp. 1326 – 1329. DOI 10.1109/APMC.2001.985380

  86. Rodriguez A., Dunleavy L. P., Kirby P.: Best Practice for On-Wafer Millimeter Wave Noise Figure Measurements. 57th ARFTG Conf. Digest-Spring, vol. 39, 2001, pp. 1 – 13. DOI 10.1109/ARFTG.2001.327455

  87. Chen Chih-Hung, Deen M.J.: A General Noise and S-Parameter Deembedding Procedure for On-Wafer High-Frequency Noise Measurements of MOSFETs. Trans on MTT, Vol. 49, no. 5, 2001, pp. 1004 – 1005. DOI 10.1109/22.920164

  88. Van der Bosch S., Martens L.: Experimental Verification of Pattern Selection for Noise Characterization. IEEE Trans. on MTT, Vol. 48, no. 1, 2000, pp. 156 – 158. DOI 10.1109/22.817485

  89. Follmann R., Berben J., Kother D., Waldow P., Borkes J., Wolff I.: A universal method for calculating and extracting the LF and RF noise behavior of nonlinear devices. 22nd Annual Gallium Arsenide Integr. Circ. (GaAs IC) Symp., 2000, pp. 47 – 51. DOI 10.1109/GAAS.2000.906420

  90. Acciari G., Giannini F., Limiti E., Saggio G.: Lowering the uncertainty in fast noise measurement procedures. Int. Conf on Microwave Radar and Wireless Communications (MIKON), Vol. 2, 2000, pp. 531 – 534. DOI 10.1109/MIKON.2000.913988

  91. Randa J.: Multiport Noise Characterization and Differential Amplifiers. ARFTG Conf. Digest-Spring, Vol. 37, 2000, pp. 1 – 10. DOI 10.1109/ARFTG.2000.327409

  92. Abidi A. A., Leete J.C.: De-embedding the noise figure of differential amplifiers. IEEE Journal of SSC, Vol. 34, no. 6, 1999, pp. 882 – 885. DOI 10.1109/4.766823

  93. McIntosh C.E., Pollard R.D., Miles R.E.: On the Feasibility of Using an Active Tuner for Measuring Microwave Noise Parameters. IEEE Trans. on Instr & Meas., Vol. 48, no. 6, 1999, pp. 1294 – 1299. DOI 10.1109/19.816151

  94. Stenarson J., Garcia M., Angelov I., Zirath H.: A General Parameter-Extraction Method for Transistor Noise Models. IEEE Trans. on MTT, Vol. 47, no. 12, 1999, pp. 2358 – 2363. DOI 10.1109/22.808982

  95. Lazaro A., Pradell L., O'Callaghan J.M.: FET noise-parameter determination using a novel technique based on 50-Ω noise-figure measurements. IEEE Trans. on MTT, Vol. 47, no. 3, 1999, pp. 315 – 324. DOI 10.1109/22.750233

  96. Beland P., Roy L., Labonte S., Stubbs M.: An enhanced on-wafer millimeter-wave noise parameter measurement system. IEEE Trans on Instr. & Meas., Vol. 48, no. 4, 1999, pp. 825 – 829. DOI 10.1109/19.779182

  97. Principato F., Ferrante G., Mantegna R.N.: A method for the analytical calculation of noise parameters of linear two-ports with crosscorrelated noise sources. IEEE Trans on CAS I : Fundamental Theory and Applications, Vol. 46, no. 8, 1999, pp. 1019 – 1022. DOI 10.1109/81.780382

  98. Guofu Niu, Ansley W.E., Shiming Zhang, Cressler J.D., Webster C.S., Groves R.A.: Noise parameter optimization of UHV/CVD SiGe HBT's for RF and microwave applications. IEEE Trans on ED, Vol. 46, no. 8, 1999, pp. 1589 – 1598. DOI 10.1109/16.777145

  99. Heymann P., Rudolph M., Prinzler H., Doerner R., Klapproth L., Bock G.: Experimental evaluation of microwave field-effect-transistor noise models. IEEE Trans on MTT, Vol. 47, no. 2, 1999, pp. 156 – 163. DOI 10.1109/22.744290

  100. Schmidt-Szalowski M., Wiatr W.: An Improved Method for Simultaneous Small-Signal and Noise Characterization of Two-Ports Using Multi-State Radiometer. 29th European Microwave Conf. Vol. 2, 1999, pp. 61 – 64. DOI 10.1109/EUMA.1999.338409  

  101. Van den Bosch S., Martens L.: Improved Impedance-Pattern Generation for Automatic Noise Parameter Determination. IEEE Trans. on MTT, Vol. 46, no. 11, 1998, pp. 1673 – 1678. DOI 10.1109/22.734556

  102. Lazaro A., Pradell L., O'Callaghan J.M.: Method for measuring noise parameters of microwave two-port. Electronics Lett., Vol. 34, no. 13, 1998, pp. 1332 – 1333. DOI 10.1049/el:19980942

  103. Przadka A., Webb K.J., Janes D.B.: Two-port noise and impedance measurements for two-terminal devices with a resonant tunneling diode example. IEEE Trans on MTT, Vol. 46, no. 9, 1998, pp. 1215 – 1220. DOI 10.1109/22.709459

  104. Wiatr W., Nosal Z.: Simultaneous noise and vector network analysis using radiometer systems. Int. Conf on Microwave Radar and Wireless Communications (MIKON), Vol. 4, 1998, pp. 198 – 229. DOI 10.1109/MIKON.1998.738471

  105. Garcia M., Stenarson J, Yhland K., Zirath H., Angelov I. : A New Extraction Method for the Two-Parameter FET Temperature Noise Model. IEEE Trans. on MTT, Vol. 46, no. 11, 1998, pp. 1679 – 1685. DOI 10.1109/22.734558

  106. Stolle R., Schiek B.: The Complete and Accurate Determination of Two-Port Noise Parameters without Seperate Measurements of the Two-Port Input Impedance. 28th European Microwave Conf., Vol. 1, 1998, pp. 241 – 246. DOI 10.1109/EUMA.1998.337994

  107. Lazaro A., Pradell L., Beltran A., O'Callaghan J.M.: Direct extraction of all four transistor noise parameters from 50 Ω noise figure measurements. Electronics Letters, Vol. 34, no. 3, 1998, pp. 289 – 291. DOI 10.1049/el:19980192

  108. Alam Tariq A., Pollard R.D., Snowden C. M.: The Determination of On-Wafer Noise Parameters at W-Band. 27th European Microwave Conf., 1997, Vol. 2, pp. 687 – 691. DOI 10.1109/EUMA.1997.337873

  109. Qian Cai, Gerber J., Rohde U.L., Daniel T.: HBT high-frequency modeling and integrated parameter extraction. IEEE Trans. on MTT, Vol. 45, no. 12, 1997, pp. 2493 – 2502. DOI 10.1109/22.643865

  110. Boglione L., Pollard R.D., Postoyalko V.: Analytical behavior of the noise resistance and the noise conductance for a network with parallel and series feedback. IEEE Trans on MTT, Vol. 45, no. 2, 1997, pp. 301 – 304. DOI 10.1109/22.557617

  111. Werling T., Bourdel E., Pasquet D., Boudiaf A.: Determination of wave noise sources using spectral parametric modeling. IEEE Trans on MTT, Vol. 45, no. 12, 1997, pp. 2461 – 2467. DOI 10.1109/22.643860

  112. Rouquette P., Gasquet D., Holden T., Moult J.: HBT's RF noise parameter determination by means of an efficient method based on noise analysis of linear amplifier networks. IEEE Trans on MTT, Vol. 45, no. 5, 1997, pp. 690 – 694. DOI 10.1109/22.575587

  113. Bareau P., Abdipour A., Pacaud A.: A new noise measurement method of noise parameters at microwave frequencies. IEEE Trans on Instr. & Meas., Vol. 46, no. 4, 1997, pp. 1044 – 1048. DOI 10.1109/19.650824

  114. Adamian V., Fenton R.: Verification of the Noise Parameter Instrumentation. ARFTG Conf. Digest-Spring, Vol. 31, 1997, pp. 181 – 190. DOI 10.1109/ARFTG.1997.327227

  115. Wiatr W., Schmidt-Szalowski M.: The Multistate Radiometer: A Novel Means for Broadband Noise and Small-Signal Characterization of Microwave Semiconductor Devices. ARFTG Conf. Digest-Spring, Vol. 31, 1997, pp. 171 – 180. DOI 10.1109/ARFTG.1997.327226

  116. Caddemi A., Di Prima F., Sannino M.: Dependence of the noise resistance of microwave FET's from the device characteristics. Int. Semiconductor Conference (CAS), Vol. 2, 1997, pp. 377 – 380. DOI 10.1109/SMICND.1997.651199

  117. O'Callaghan J.M., Alegret A., Pradell L., Corbella I.: Ill conditioning loci in noise parameter determination. Electronics Lett., Vol. 32, no. 18, 1996, pp. 1680. DOI 10.1049/el:19961127

  118. Benelbar R., Huyart B., Bosisio R.G.: Microwave Noise Caracterization of Two-Port Device Using an Uncalibrated Tunner. IEEE Trans. on MTT, Vol. 44, no. 10, 1996, pp. 1725 – 1728. DOI 10.1109/22.538965

  119. Laskar J., Bautista J.J., Nishimoto M., Hamai M., Lai R.: Development of accurate on-wafer, cryogenic characterization techniques. IEEE Trans. on MTT, Vol. 44, no. 7, 1996, pp. 1178 – 1183. DOI 10.1109/22.508659

  120. Van den Brink R.F.M.: The noise-tee - a lightwave device for microwave noise measurements. IEEE Trans on MTT, Vol. 44, no. 3, 1996, pp. 490 – 492. DOI 10.1109/22.486167

  121. Wiatr W., Szalowski M.-S.: Measurement of the transistor noise parameters using multi-state radiometer system. 26th EuMC, 1996, pp 178 – 181. DOI 10.1109/EUMA.1996.337547

  122. Jacobs I.: Dependence of optical amplifier noise figure on relative-intensity-noise. J. of Lightwave Technology, Vol. 13, no. 7, 1995, pp. 1461 – 1465. DOI 10.1109/50.400712

  123. Williams G.L.: Measuring amplifier noise on a noise source calibration radiometer. IEEE Trans on Instr. & Meas., Vol. 44, no. 2, 1995, pp. 340 – 342. DOI 10.1109/19.377847

  124. Timmermann C.C.: Exact S-parameter models boost SPICE. IEEE Circuits and Devices Magazine, Vol. 11, no. 5, 1995, pp. 17 – 22. DOI 10.1109/101.465897

  125. Escotte L., Sejalon F., Graffeuil J.: Noise parameter measurement of microwave transistors at cryogenic temperature. IEEE Trans on Instr. & Meas., Vol. 43, no. 4, 1994, pp. 536 – 543. DOI 10.1109/19.310165

  126. Danneville F., Happy H., Dambrine G., Belquin J.-M., Cappy A.: Microscopic noise modeling and macroscopic noise models: how good a connection? [FETs]. IEEE Trans on ED, Vol. 41, no. 5, 1994, pp. 779 – 786. DOI 10.1109/16.285031

  127. Paixao O.P., Jastrzebski A.K.: Analysis and sensitivities of noisy networks using nodal approach. IEEE Trans on MTT, Vol. 42, no. 7, 1994, pp. 1254 – 1260. DOI 10.1109/22.299764

  128. Andersen B.D., Cavin M., Belkerdid M.A., Malocha D.C.: Sensitivity analysis of one port and two port BAW and SAW resonator model parameters. Proc. of IEEE Int. Frequency Control Symp. (FREQ), 1994, pp. 308-314 DOI 10.1109/FREQ.1994.398319

  129. Adamski W.: Methods for Direct Reading Noise Measurements of Low-Gain Two-Ports. IEEE Trans. on MTT, Vol. 42, no. 3, 1994, pp. 411 – 414. DOI 10.1109/19.293459

  130. Nishimoto M., Hamai M., Laskar J.: Study and Development of On-Wafer Cryogenic Calibration Techniques. 44th ARFTG Conf. Digest-Fall, Vol. 26, 1994, pp. 63 – 67. DOI 10.1109/ARFTG.1994.327082

  131. Bareau P., Pacaud A.: Nouvelle méthode de mesure des paramètres de bruit d'un biporte. L'Onde électrique, Vol. 74, no. 6, 1994, pp 37 – 41.

  132. Chong K.: Understanding Noise-Figure Measurements. Microwaves & RF, Feb. 1994, pp 91 – 94.

  133. Martines G., Sannino M.: Proposal of up-to-date standards on methods of measuring noise in linear two-ports. 1994 Conf. on Precision Electromagnetic Measurements Digest., 1994, pp. 482 – 483. DOI 10.1109/CPEM.1994.333208

  134. Sannino M.: Proposal of Up-to-Date Standards on Methods of Measuring Noise Parameters of Microwave Transistors. 44th ARFTG Conference Digest-Fall, Vol. 26, 1994, pp. 81 – 88. DOI 10.1109/ARFTG.1994.327084

  135. Grosch T.O., Carpenter L.A.: Two-port to three-port noise-wave transformation for CAD applications. IEEE Trans on MTT, Vol. 41, no. 9, 1993, pp. 1543 – 1548. DOI 10.1109/22.245675

  136. Roth B., Kother D., Coady M., Sporkmann T.: A Combined Measurement Stand for Linear, Nonlinear and Noise Measurements of Microwave Devices and Circuits. ARFTG Conf. Digest-Fall, Vol. 24, 1993, pp. 61 – 66. DOI 10.1109/ARFTG.1993.327044

  137. Vasilescu G., Saint-Marc C., et al.: Estimating the Test Set Accuracy for Microwave Noise Measurements. Proc of MIOP'93, 1993, pp. 487 – 492.

  138. Boudiaf A., Laporte M.: An Accurate and Repeatable Technique for Noise Parameter Measurements. IEEE Trans. on Instr. and Meas., Vol. 42, no. 2, 1993, pp 532 – 537. DOI 10.1109/19.278618

  139. Escotte L., Plana R., Graffeuil J.: Evaluation of Noise Parameter Extraction Methods. IEEE Trans on MTT, Vol. 41, no. 3, 1993, pp. 382 – 387. DOI 10.1109/22.223735

  140. P.J. Tasker, W. Reinert, B. Hughes, J. Braunstein, M. Schlechtweg: Transistor noise parameter extraction using a 50-Ω measurement system. IEEE MTT-S Int. Microwave Symp. Digest, Vol. 3, 1993, pp. 1251 – 1254. DOI 10.1109/MWSYM.1993.277100

  141. Pucel R.A., Struble W., Hallgren R., Rohde U.L.: A general noise de-embedding procedure for packaged two-port linear active devices. IEEE Trans. on MTT, Vol. 40, no. 11, 1992, pp. 2013 – 2024. DOI 10.1109/22.168758

  142. Boudiaf A., LaPorte M., Dangla J., Vernet G.: Accuracy improvements in two-port noise parameter extraction method. IEEE MTT-S Int. Microwave Symp. Digest, Vol. 3, 1992, pp. 1569 – 1572. DOI 10.1109/MWSYM.1992.188316

  143. Vasilescu G., et al.: Checking by Simulation the Accuracy of Two Port Noise Parameters Extraction. Proc of IEEE ISCAS'92, 1992, pp. 1176 – 1179. DOI 10.1109/ISCAS.1992.230410

  144. Archer J.W., Batchelor R.A.: Fully automated on-wafer noise characterization of GaAs MESFETs and HEMTs. IEEE Trans. on MTT, Vol. 40, no. 2, 1992, pp. 209 – 216. DOI 10.1109/22.120092

  145. Guillaume P., Pintelon R., Schoukens J.: Parametric identification of two-port models in the frequency domain. IEEE Trans on Instr. & Meas., Vol. 41, no. 2, 1992, pp. 233 – 239. DOI 10.1109/19.137353

  146. Wedge S.W., Rutledge D.B.: Wave techniques for noise modeling and measurement. IEEE Trans on MTT, Vol. 40, no. 11, 1992, pp. 2004 – 2012. DOI 10.1109/22.168757

  147. Mokari M.E., Patience W.: A new method of noise parameter calculation using direct matrix analysis. IEEE Trans on CAS I : Fundamental Theory and Applications, Vol. 39, no. 9, 1992, pp. 767 – 771. DOI 10.1109/81.250168

  148. Lam V.M.T., Poole C.R., Yip P.C.L.: Exact noise figure of a noisy two-port with feedback. IEE Proc. G: Circuits, Devices and Systems, Vol. 139, no. 4, 1992, pp. 473 – 476. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=160071&isnumber=4193

  149. Tasker P. J., Reinart W., Braunstein J., Schlechtweg M.: Direct Extraction of All Four Transistor Noise Parameters from a Single Noise Figure Measurement. Tech. Digest 22nd European Microwave Conf., 1992, pp. 157 – 162. DOI 10.1109/EUMA.1992.335733

  150. Albinson B. M., Guo H., Schon M., Vicker H.: A New Programmable Load for Noise Parameter Determination. IEEE Trans. on MTT, Vol. 39, no. 2, 1991, pp. 216 – 223. DOI 10.1109/22.102963

  151. Koolen M.C.A.M., Geelen J.A.M., Versleijen M.P.J.G.: An improved de-embedding technique for on-wafer high-frequency characterization. IEEE Bipolar Circuits Technol. Meeting (BIPOL), 1991, pp. 188 – 191. DOI 10.1109/BIPOL.1991.160985

  152. Grace M., Vendelin G.: Accurate Noise Characterization of Low Noise Devices. ARFTG Conf. Digest-Winter, Vol. 20, 1991, pp. 90 – 96. DOI 10.1109/ARFTG.1991.324042

  153. Takeda S., Uchino A.: An Extended Four-Port Noise Matching Network. European Microwave Conf. (EuMC), Vol. 2, 1991, pp. 1481 – 1486. DOI 10.1109/EUMA.1991.336554

  154. Vasilescu G., et al.: A New Method to Solve Experimental Data Sets for Two-Port Noise Parameters. Proc of MIOP'90, 1990, pp. 507 – 512.

  155. Davidson A., Leake B., Strid E.: Accuracy Factors in Microwave Noise Parameters Measurements. Cascade Microtech, Appl. Note ACCNOISE 309, 1990. http://www.cmicro.com/support/publication-library

  156. Morris A.S., Trew R.J.: Simple noise analysis applied to power combiners. IEEE MTT-S Int. Microwave Symp. Digest (MTT), Vol. 3, 1990, pp. 1273 – 1275. DOI 10.1109/MWSYM.1990.99811

  157. McCamant A. J.: Error Analysis Aids Measurement of Noise Parameters. Microwave & RF, 1989, pp. 109 – 118.

  158. Vasilescu G., Krim M., et.al.: Exact Computation of Two-Port Noise Parameters. Electronics Letters, Vol. 25, no. 4, 1989, pp. 292 – 293. DOI 10.1049/el:19890203

  159. Davidson A.C., Leake B.A., Strid E.: Accuracy Improvements in Microwave Noise Parameter Measurements. IEEE Trans. on MTT, Vol. 37, no. 12, 1989, pp. 1973 – 1978. DOI 10.1109/22.44110 and 10.1109/22.64624

  160. Byzery B.: Automated Noise and Gain Measurement Set-Up and Application to Noise Modelling. 19th Europ. Microwave Conf., 1989, pp. 1201 - 1204 DOI 10.1109/EUMA.1989.334136

  161. O'Callaghan J.M., Mondal J.P.: A Vector Approach for Noise Parameter Fitting and Selection of Source Admittances. IEEE Trans on MTT, Vol. 39, 1989, pp. 1376 – 1382. DOI 10.1109/22.85413

  162. Morris A.S., Trew R.J.: Simple noise analysis applied to power combiners. IEEE MTT-S Int. Microwave Symp. Digest (MTT), Vol. 3, 1990, pp. 1273 – 1275. DOI 10.1109/MWSYM.1990.99811

  163. Dobrowolski J.A.: A CAD-oriented method for noise figure computation of two-ports with any internal topology. IEEE Trans on MTT, Vol. 37, no. 1, 1989, pp. 15 – 20. DOI 10.1109/22.20016

  164. D'Addario L.R.: Noise parameters of SIS mixers. IEEE Trans on MTT, Vol. 36, no. 7, 1988, pp. 1196 – 1206. DOI 10.1109/22.3656

  165. Leake B., Davidson A., Burcham T.: Improvements to the Accuracy of On-Wafer Noise Characterization, Using a Vector Network Analyzer. Cascade Microtech, Appl. Note NOISE 189, 1988. http://www.cmicro.com/support/publication-library

  166. Valk E.C., Routledge D., Vaneldik J.F., Landecker T.L.: De-embedding two-port noise parameters using a noise wave model. IEEE Trans. on Instr. & Meas. Vol. 37, no. 2, 1988, pp.195 – 200. DOI 10.1109/19.6051

  167. Hughes B., Tasker P.: Improvements to On-Wafer Noise Parameter Measurements. pp. 16 – 25. http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04119564

  168. Fraser A., Strid E, Leake B., Burcham T.: Repeatability and Verification of On-Wafer Noise Parameter Measurements. Microwave Journal, Vol. 31, no. 11, 1988, pp. 172 – 176. http://www.mwjournal.com/Archives/

  169. Hirsch V.A., Brunsman M.D., Miers T.H.: An Automated System for De-Embedded Measurements of Noise and Gain Parameters. 29th ARFTG Conf. Digest-Spring, Vol. 11, 1987, pp. 38 – 51. DOI 10.1109/ARFTG.1987.323854

  170. Valk E.C., Walker G., Vaneldik J.F., Routledge D.: A simple method of removing receiver noise from microwave noise measurements. Journal of the Institution of Electronic and Radio Eng., Vol. 57, no. 6, 1987, pp. 297 – 300. DOI 10.1049/jiere.1987.0098

  171. Albinsson B.: Noise parameter transformations of interconnected two-port networks. IEE Proc. H : Microwaves, Antennas and Propagation, Vol. 134, no. 2, 1987, pp. 125 – 129. DOI 10.1049/ip-h-2:19870025

  172. Krim M., Mayousse C., et al.: A Numerical Method to Obtain the Optimal Noise Parameters of a Linear Two-Port. Proc. of MIOP'87, Wiesbaden, 1987, pp 4A3.

  173. Pospieszalski M.: On the Measurement of Noise Parameters of Micro-wave Two-Ports. IEEE Trans. on MTT, Vol. 34, no. 4, 1986, pp. 456 – 458. DOI 10.1109/TMTT.1986.1133369

  174.  Pospieszalski M.W., Wiatr W.: Design of Microwave GaAs MESFET's for Broad-Band, Low-Noise Amplifier (Comments). IEEE Trans on MTT, Vol. 34, no. 1, 1986, pp. 194. DOI 10.1109/TMTT.1986.1133309

  175. Engberg J.: Noise Parameters of Embedded Noisy Two-Port Networks. IEE Proc., Vol. Pt. H, no. 1, 1985, pp. 17 – 22. DOI 10.1049/ip-h-2:19850003

  176. Calandra E.F., Martines G., Sannino M.: Characterization of GaAs FET's in Terms of Noise, Gain, and Scattering Parameters through a Noise Parameter Test Set. IEEE Trans. on MTT, Vol. 32, no. 3, 1984, pp. 231 – 236. DOI 10.1109/TMTT.1984.1132658

  177. Gupta M. S.: Impossibility of Linear Two-Port Noise-Parameter Measurement with a Single Temperature Noise Source. IEEE Trans. on Instr. & Meas. Vol. 32, no. 3, 1983, pp. 443 – 445. DOI 10.1109/TIM.1983.4315103

  178. Fanelli N.: A New Measurement Method of the Noise Parameters of Two-Port Devices. 1983 IEEE MTT-S Int. Microwave Symp. Digest, 1983, pp. 366 – 368. DOI 10.1109/MWSYM.1983.1130914

  179. Martines G., Sannino M.: Determination of Microwave Transistor Noise and Gain Parameters Through Noise-Figure Measurements Only. IEEE Trans. on MTT, Vol. 30, no. 8, 1982, pp. 1255 – 1259. DOI 10.1109/TMTT.1982.1131233

  180. Sutherland A.D.: On the Inherent Noise of an Ideal Two-Port Isolator. IEEE Trans on MTT, Vol. 30, no. 5, 1982, pp. 831 – 832. DOI 10.1109/TMTT.1982.1131149

  181. Blasquez G.A.: Une méthode de mesure simple et directe du facteur de bruit pour les amplificateurs et les transistors. Revue Phys. Appl., Vol. 15, 1980, pp. 1007 – 1012. DOI 10.1051/rphysap:019800015050100700

  182. Sannino M.: Simultaneous Determination of Device Noise and Gain Parameters Through Noise Measurements Only. Proc. of the IEEE, Vol. 68, no. 10, 1980, pp. 1343 – 1345. DOI 10.1109/PROC.1980.11859 and 10.1109/PROC.1982.12245

  183. Caruso G., Sannino M.: Determination of Microwave Two-Port Noise Parameters Through Computer-Aided Frequency Conversion Techniques. IEEE Trans. on MTT, Vol. 27, no. 9, 1979, pp. 779 – 783. DOI 10.1109/TMTT.1979.1129728

  184. Sannino M.: On the Determination of Device Noise and Gain Parameters. Proc. of the IEEE, Vol. 67, no. 9, 1979, pp. 1364 – 1365. DOI 10.1109/PROC.1979.11458

  185. Mitama M., Katoh H.: An Improved Computational Method for Noise Parameter Measurement. IEEE Trans. on MTT, Vol. 27, no. 6, 1979, pp. 612 – 615. DOI 10.1109/TMTT.1979.1129680

  186. Caruso G., Sannino M.: Computer-Aided Determination of Microwave Two-Port Noise Parameters. IEEE Trans. on MTT, Vol. 26, no. 9, 1978, pp. 639 – 648. DOI 10.1109/TMTT.1978.1129454

  187. Meys R.P.: A Wave Approach to the Noise Properties of Linear Microwave Devices. IEEE Trans. on MTT, Vol. 26, no. 1, 1978, pp. 34 – 37. DOI 10.1109/TMTT.1978.1129303

  188. Hartmann K.: Noise characterization of linear circuits. Trans. on CAS, Vol. 23, no. 10, 1976, pp. 581 – 590. DOI 10.1109/TCS.1976.1084139

  189. Iversen S.: The effect of feedback on noise figure. Proc. of the IEEE, Vol. 63, no. 3, 1975, pp. 540 – 542. DOI 10.1109/PROC.1975.9784

  190. Mamola G., Sannino M.: Source Mismatch Effects on Measurements of Linear Two-Port Noise Temperatures. IEEE Trans on Instr. & Meas., Vol. 24, no. 3, 1975, pp. 239 – 242. DOI 10.1109/TIM.1975.4314418

  191. Tucker R.S.: Low-Noise Design of Microwave Transistor Amplifiers (Short Papers). IEEE Trans on MTT, Vol. 23, no. 8, 1975, pp. 697 – 700. DOI 10.1109/TMTT.1975.1128650

  192. Hartmann K., Strutt M. J. O.: Changes of the Four Noise Parameters Due to General Changes of Linear Two-Port Circuits. IEEE Trans. on ED, Vol. 20, no. 10, 1973, pp. 874 – 877. DOI 10.1109/T-ED.1973.17761

  193. Kotyczka W., Leupp A., Strutt M.J.O.: Computer-Aided Determination of Two-Port Noise Parameters (CADON). Proc. of the IEEE, Vol. 58, 1970, pp. 1850 – 1851. DOI 10.1109/PROC.1970.8034

  194. Gupta M. S.: Determination of the Noise Parameters of a Linear Two-Port. Electronic Letters, Vol. 6, no. 17, 1970, pp. 543 – 544. DOI 10.1049/el:19700377

  195. Huber W.R.: Two-port equivalent noise generators. Proc. of the IEEE, Vol. 58, no. 5, 1970, pp. 807 – 809. DOI 10.1109/PROC.1970.7750

  196. Lane R. Q.: The Determination of Device Noise Parameters. Proc. of the IEEE, Vol. 57, 1969, pp. 1461 – 1462. DOI 10.1109/PROC.1969.7311

  197. Lange J.: Noise Characterization of Linear Two-Ports in Terms of Invariant Parameters. IEEE JSSC, Vol. 2, no. 2, 1967, pp. 37 – 40. DOI 10.1109/JSSC.1967.1049782

  198. Fukui H.: Available Power Gain, Noise Figure, and Noise Measure of Two-Ports and Their Graphical Representations. IEEE Trans. on Circuit Theory, Vol. 13, no. 2, 1966, pp. 137 – 142. DOI 10.1109/TCT.1966.1082556

  199. Haus H.A., Atkinson W.R., Branch G.M., Davenport W.B., Fonger W.H., Harris W.A., Harrison S.W., McLeod W.W., Stodola E.K., Talpey T.E.: Representation of Noise in Linear Twoports. Proc. of the IRE, Vol. 48, no. 1, 1960, pp. 6974. DOI 10.1109/JRPROC.1960.287381

Copyright 2010 © UNESCO - All Rights Reserved.