Multiplication is vexation,

Division is as bad,            

The Rule of 3 dots puzzle me,

And practice drives me mad”

(Elizabethan MS, dated 1570)

  1. E.G. del Conte, J.C. Teixeira, M.A. Campos, H.A. Piccolo, D.A.O. Oliva, L.R. Rodrigues: Barkhausen Noise Analysis as an Alternative Method to Online Monitoring of Milling Surfaces. IEEE Trans on Magnetics, Vol. 52, no. 5, 2016, pp. 1 – 4. DOI 10.1109/TMAG.2016.2514739

  2. Abboud D., Baudin S., Antoni J., et al.: The spectral analysis of cyclo-non-stationary signals. Mechanical Syst. and Signal Processing, Vol. 75, 2016, pp. 280 – 300.

  3. F.S. Neves, P.G.D. Agopian, J.A. Martino, B. Cretu, et al.: Low-Frequency Noise Analysis and Modeling in Vertical Tunnel FETs With Ge Source. IEEE Trans on ED, Vol. 63, no. 4, 2016, pp. 1658 – 1665. DOI 10.1109/TED.2016.2533360

  4. Gao Zeren, Xu Xiaohai, Su Yong, Zhang Qingchuan: Experimental analysis of image noise and interpolation bias in digital image correlation. Optics & Lasers in Engineering, Vol. 81, 2016, pp. 46 – 53.

  5. Olesen O.B., Petersen N.C.: Stochastic Data Envelopment Analysis - A review. European Journal of Operational Research, Vol. 251, no. 1, 2016, pp. 2 – 21. DOI 10.1016/j.ejor.2015.07.058

  6. Andersson A., Kovacs M., Larsson S.: Weak error analysis for semilinear stochastic Volterra equations with additive noise. J. of Mathematical Analysis and Applications, Vol. 437, no. 2, 2016, pp. 1283 – 1304. DOI 10.1016/j.jmaa.2015.09.016

  7. Li Huailiang, Tuo Xianguo, Shi Rui, et al.: A de-noising algorithm to improve SNR of segmented gamma scanner for spectrum analysis. Nuclear Instruments & Methods in Physics Research: Section A - Accelerators Spectrometers Detectors & Associated Equipment, Vol. 818, 2016, pp. 68 – 75. DOI 10.1016/j.nima.2016.02.047

  8. Kaloop M.R., Kim Dookie: De-noising of GPS structural monitoring observation error using wavelet analysis. Geomatics Natural Hazards & Risk, Vol. 7, no. 2, 2016, pp. 804 – 825. DOI 10.1080/19475705.2014.983186

  9. N. Arbel, L. Hirschbrand, S. Weiss, N. Levanon, A. Zadok: Continuously Operating Laser Range Finder Based on Incoherent Pulse Compression: Noise Analysis and Experiment. IEEE Photonics Journal, Vol. 8, no. 2, 2016, pp. 1 – 11. DOI 10.1109/JPHOT.2016.2528118

  10. J. Y. Lee, Q. Lin: Noise analysis in optomechanical inertial sensors. IEEE Int. Symp. on Inertial Sensors and Systems (ISISS), 2016, pp. 132 – 135. DOI 10.1109/ISISS.2016.7435565

  11. M. Hörberg, T. Emanuelsson, S. Lai, T.N.D. Thanh, H. Zirath, D. Kuylenstierna: Phase-Noise Analysis of an X-Band Ultra-Low Phase-Noise GaN HEMT Based Cavity Oscillator. IEEE Trans on MTT, Vol. 63, no. 8, 2015, pp. 2619 – 2629. DOI 10.1109/TMTT.2015.2447514

  12. A. Mahmoodi, H. Dehdashti Jahromi, M.H. Sheikhi: Dark Current Modeling and Noise Analysis in Quantum Dot Infrared Photodetectors. IEEE Sensors Journal, Vol. 15, no. 10, 2015, pp. 5504 – 5509. DOI 10.1109/JSEN.2015.2443014

  13. Biggio M., Bizzarri F., Brambilla A., Storace M.: Efficient transient noise analysis of non-periodic mixed analogue/digital circuits. IET Circuits, Devices & Systems, Vol. 9, no. 2, 2015, pp. 73 – 80. DOI 10.1049/iet-cds.2013.0438

  14. Grivet-Talocia S., Signorini G., Olivadese S.B., Siviero C., Brenner P.: Thermal Noise Compliant Synthesis of Linear Lumped Macromodels. IEEE Trans on Components, Packaging & Manufacturing Technology, Vol. 5, no. 1, 2015, pp. 75 – 85. DOI 10.1109/TCPMT.2014.2370096

  15. R. Vijay, A. Sharma, M. Kumar, V. Shende, T. Chakrabarti, Rajesh Gupta: GIS-Based Noise Simulation Open Source Software: N-GNOIS. Fluct. Noise Lett., Vol. 14, no. 01, 2015, Article # 1550005. DOI 10.1142/S0219477515500054

  16. Mahmutoglu A.G., Demir A.: Modeling and Simulation of Low-Frequency Noise in Nano Devices: Stochastically Correct and Carefully Crafted Numerical Techniques. IEEE Trans on CAD of Integrated Circuits and Systems, Vol. 34, no. 5, 2015, pp. 794 – 807. DOI 10.1109/TCAD.2014.2376985

  17. A. Gupta, V. Maheshwari, S. Sharma, R. Kar: Crosstalk noise and delay analysis for high speed on-chip global RLC VLSI interconnects with mutual inductance using 90nm process technology. Int. Conf. on Computing, Communication & Automation (ICCCA), 2015, pp. 1215 – 1219. DOI 10.1109/CCAA.2015.7148579

  18. J. Zhong, Y. Zhu, Sai-Weng Sin, Sen-Pang U, R.P. Martins: Thermal and Reference Noise Analysis of Time-Interleaving SAR and Partial-Interleaving Pipelined-SAR ADCs. IEEE Trans on CAS I: Regular Papers, Vol. 62, no. 9, 2015, pp. 2196 – 2206. DOI 10.1109/TCSI.2015.2452331

  19. A.G. Mahmutoglu, A. Demir: Analysis of Low-Frequency Noise in Switched MOSFET Circuits: Revisited and Clarified. IEEE Trans on CAS I: Regular Papers, Vol. 62, no. 4, 2015, pp. 929 – 937. DOI 10.1109/TCSI.2015.2388834

  20. Jooseung Kim, Dongsu Kim , Yunsung Cho , Daehyun Kang, et al.: Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier. IEEE Trans on MTT, Vol. 63, no. 12, 2015, pp. 4072 – 4082. DOI 10.1109/TMTT.2015.2495178

  21. G. Tu, F. Dong, Y. Wang, B. Culshaw, et al.: Analysis of Random Noise and Long-Term Drift for Tunable Diode Laser Absorption Spectroscopy System at Atmospheric Pressure. IEEE Sensors Journal, Vol. 15, no. 6, 2015, pp. 3535 – 3542. DOI 10.1109/JSEN.2015.2393861

  22. B. Li, T.T. Ng, X. Li, S. Tan, J. Huang: Revealing the Trace of High-Quality JPEG Compression Through Quantization Noise Analysis. IEEE Transactions on Information Forensics & Security, Vol. 10, no. 3, 2015, pp. 558 – 573. DOI 10.1109/TIFS.2015.2389148

  23. D. Zito, D. Pepe, A. Fonte: High-Frequency CMOS Active Inductor: Design Methodology and Noise Analysis. IEEE Trans on VLSI, Vol. 23, no. 6, 2015, pp. 1123 – 1136. DOI 10.1109/TVLSI.2014.2332277

  24. A. Iborra, M.J. Rodríguez-Álvarez , A. Soriano , F. Sánchez et al.: Noise Analysis in Computed Tomography (CT) Image Reconstruction using QR-Decomposition Algorithm. IEEE Trans on Nuclear Science, Vol. 62, no. 3, 2015, pp. 869 – 875. DOI 10.1109/TNS.2015.2422213

  25. Traverso P.A., Florian C., Filicori F.: A Fully Nonlinear Compact Modeling Approach for High-Frequency Noise in Large-Signal Operated Microwave Electron Devices. IEEE Trans on MTT, Vol. 63, no. 2, Part: 1, 2015, pp. 352 – 366. DOI 10.1109/TMTT.2014.2377737

  26. A. Zjajo, C. Galuzzi, R. van Leuken: Stochastic noise analysis of neural interface front end. IEEE Int. Symp on Circuits and Systems (ISCAS), 2015, pp. 169 – 172. DOI 10.1109/ISCAS.2015.7168597

  27. X. Yang, J. Liu, Z. Zheng, Y. Wang, et al.: Impact of P/E cycling on read current fluctuation of NOR Flash memory cell: A microscopic perspective based on low frequency noise analysis. IEEE Int. Reliability Physics Symp. (IRPS), 2015, pp. 5B.7.1 – 5B.7.6. DOI 10.1109/IRPS.2015.7112748

  28. I.A. Makda, M. Nymand: Common-mode noise analysis, modeling and filter design for a phase-shifted full-bridge forward converter. IEEE Int. Conf. on Power Electronics and Drive Systems (PEDS), 2015, pp. 1100 – 1105. DOI 10.1109/PEDS.2015.7203521

  29. M.A. Ghanad, C. Dehollain, M.M. Green: Noise analysis for time-domain circuits. IEEE Int. Symp on Circuits and Systems (ISCAS), 2015, pp. 149 – 152. DOI 10.1109/ISCAS.2015.7168592

  30. M.B. Hopkins, P. Lee: High frequency amplifiers for piezoelectric sensors noise analysis and reduction techniques. Proc of IEEE Int. Instrumentation & Measurement Technology Conf. (I2MTC), 2015, pp. 893 – 898. DOI 10.1109/I2MTC.2015.7151387

  31. J.G.M. Melo, F. Sill Torres: Noise analysis of integrated bulk current sensors for detection of radiation induced soft errors. Latin-American Test Symp. (LATS), 2015, pp. 1 – 6. DOI 10.1109/LATW.2015.7102515

  32. X. Deng, X. Lin, Y. Mo, M. Zhu: Analysis of phase noise in CMOS ring oscillator due to substrate noise. IEEE Dallas Circuits and Systems Conf. (DCAS), 2015, pp. 1 – 4. DOI 10.1109/DCAS.2015.7356599

  33. L.H.K. Duong, M. Nikdast, J. Xu, Z. Wang, et al.: Coherent crosstalk noise analyses in ring-based optical interconnects. Design, Automation & Test in Europe Conf. & Exhibition (DATE), 2015, pp. 501 – 506.

  34. K. Sehat, N. Masoumi: Crosstalk noise analysis for unequal length interconnects on PCBs using length dependent parameters. Int. Conf on Synthesis, Modeling, Analysis & Simulation Methods and Applications to Circuit Design (SMACD), 2015, pp. 1 – 4. DOI 10.1109/SMACD.2015.7301692

  35. A. Fişne, C. Toker: Analysis of clipping noise in visible light communications. Signal Processing and Communications Applications Conf. (SIU), 2015, pp. 1684 – 1687. DOI 10.1109/SIU.2015.7130176

  36. D. Lie, K. Chae, S. Mukhopadhyay: Analysis of the Performance, Power, and Noise Characteristics of a CMOS Image Sensor With 3-D Integrated Image Compression Unit. IEEE Trans on Components, Packaging & Manufacturing Technology, Vol. 4, no. 2, 2014, pp. 198 – 208. DOI 10.1109/TCPMT.2013.2295412

  37. P. Martin-Gonthier, P. Magnan: CMOS Image Sensor Noise Analysis Through Noise Power Spectral Density Including Undersampling Effect Due to Readout Sequence. IEEE Trans on ED, Vol. 61, no. 8, 2014, pp. 2834 – 2842. DOI 10.1109/TED.2014.2329500

  38. A. El-Gouhary, N.M. Neihart: An Analysis of Phase Noise in Transformer-Based Dual-Tank Oscillators. IEEE Trans on CAS I: Regular Papers, Vol. 61, no. 7, 2014, pp. 2098 – 2109. DOI 10.1109/TCSI.2014.2298276

  39. J.K. Hwang, Y. Liu: Noise Analysis of Power System Frequency Estimated From Angle Difference of Discrete Fourier Transform Coefficient. IEEE Trans on Power Delivery, Vol. 29, no. 4, 2014, pp. 1533 – 1541. DOI 10.1109/TPWRD.2014.2315618

  40. P. Li, W. Pan, X. Zou, W. Li, L. Yan, B. Luo: Spurious Noises Analysis of Microwave Photonic Filters Based on Phase Modulation to Intensity Modulation Conversion Using an Optical Notch Filter. J. of Lightwave Technology, Vol. 32, no. 20, 2014, pp. 3846 – 3853. DOI 10.1109/JLT.2014.2320257

  41. M. Nikdast, J. Xu , X. Wu , W. Zhang , Y. Ye , X. Wang , Z. Wang , Z. Wang: Systematic Analysis of Crosstalk Noise in Folded-Torus-Based Optical Networks-on-Chip. IEEE Trans on CAD of Integrated Circuits and Systems, Vol. 33, no. 3, 2014, pp. 437 – 450. DOI 10.1109/TCAD.2013.2288676

  42. J. Dobeš, J. Divín, J. Svatoň, F. Vejražka: Using the sensitivity analysis of the noise spectral density and the sensitivity analysis of the noise figure for practical circuit design. IEEE Int. Symp on Circuits and Systems (ISCAS), 2014, pp. 1676 – 1679. DOI 10.1109/ISCAS.2014.6865475

  43. A.G. Mahmutoglu, A. Demir: Modeling and analysis of nonstationary low-frequency noise in circuit simulators: Enabling non Monte Carlo techniques. IEEE/ACM Int. Conf. on Computer-Aided Design (ICCAD), 2014, pp. 309 – 315. DOI 10.1109/ICCAD.2014.7001368

  44. T. Contaret, J.L. Seguin, K. Aguir: Noise analysis of metal-oxide gas microsensors response to a mixture of NO2 and CO. Proc. of IEEE Sensors, 2014, pp. 285 – 288. DOI 10.1109/ICSENS.2014.6984989

  45. Y. Ren, W. Shen, K. Xiao: VR noise analysis and reduction in printed circuit board designs. IEEE Int. Symp. on Electromagnetic Compatibility (EMC), 2014, pp. 375 – 380. DOI 10.1109/ISEMC.2014.6899000

  46. P. Sun, J. Qin: Analysis of impulse noise based on wavelet transform for military applications. IEEE Autotest, 2014, pp. 183 – 187. DOI 10.1109/AUTEST.2014.6935143

  47. F. Hu, S. Lucyszyn: Noise analysis for multi-channel ‘THz Torch’ thermal infrared wireless communications systems. Asia-Pacific Microwave Conf., 2014, pp. 1276 – 1278.

  48. A. Unnisa, A.K. Dwivedi: Noise analysis on auto correlation of GPS coarse acquisition code. Int. Conf. on Communication and Network Technologies (ICCNT), 2014, pp. 178 – 181. DOI 10.1109/CNT.2014.7062750

  49. Y. Zhou, S. Sudhakaran, A. Naik, X. Chang, et al.: Modeling and measurement of noise aware clocking in power supply noise analysis. IEEE Conf. on Electrical Performance of Electronic Packaging & Systems (EPEPS), 2014, pp. 7 – 10. DOI 10.1109/EPEPS.2014.7103579

  50. E. Simoen, R. Ritzenthaler, T. Schram, M. Aoulaiche, et al.: Low-frequency noise analysis of DRAM peripheral transistors with La cap. IEEE Int. Conf. on Solid-State & Integrated Circuit Technology (ICSICT), 2014, pp. 1 – 3. DOI 10.1109/ICSICT.2014.7021489

  51. H. Soller, A. Komnik: Current Noise and Higher Order Fluctuations in Semiconducting Bilayer Systems. Fluct. Noise Lett., Vol. 12, no. 02, 2013, Article # 1340001. DOI 10.1142/S0219477513400014

  52. H. Sohn, R.H. Victora: Transition Noise Analysis of Recording Media With a Soft Underlayer (SUL) and an Antiferromagnetic Soft Underlayer (AF-SUL). IEEE Trans on Magnetics, Vol. 49, no. 2, 2013, pp. 824 – 828. DOI 10.1109/TMAG.2012.2212714

  53. J.W. Lee, E. Simoen, A. Veloso, M.J. Cho, H. Arimura, et al.: Low Frequency Noise Analysis for Post-Treatment of Replacement Metal Gate. IEEE Trans on ED, Vol. 60, no. 9, 2013, pp. 2960 – 2962. DOI 10.1109/TED.2013.2274152

  54. A. Homayoun, B. Razavi: Analysis of Phase Noise in Phase/Frequency Detectors. IEEE Trans on CAS I : Regular Papers, Vol. 60, no. 3, 2013, pp. 529 – 539. DOI 10.1109/TCSI.2012.2215792

  55. G.S. Muralidhar, A.C. Bovik, M.K. Markey: Noise Analysis of a New Singularity Index. IEEE Trans on Signal Processing, Vol. 61, no. 24, 2013, pp. 6150 – 6163. DOI 10.1109/TSP.2013.2283460

  56. D. Avila, E. Alvarez, A. Abusleme: Noise Analysis in Pulse-Processing Discrete-Time Filters. IEEE Trans on Nuclear Science, Vol. 60, no. 6, 2013, pp. 4634 – 4640. DOI 10.1109/TNS.2013.2283242

  57. E. Fernandez, F. Ramirez, A. Suarez, S. Sancho: Stability and Phase-Noise Analysis of Pulsed Injection-Locked Oscillators. IEEE Trans on MTT, Vol. 61, no. 1, 2013, pp. 482 – 491. DOI 10.1109/TMTT.2012.2228670

  58. B. Alavikia, N. Soltani, O.M. Ramahi: Efficient 2-D Finite-Difference Frequency-Domain Method for Switching Noise Analysis in Multilayer Boards. IEEE Trans on Components, Packaging & Manufacturing Technology, Vol. 3, no. 5, 2013, pp. 841 – 848. DOI 10.1109/TCPMT.2013.2242200

  59. A.G. Mahmutoglu, A. Demir, J. Roychowdhury: Modeling and analysis of (nonstationary) low frequency noise in nano devices: A synergistic approach based on stochastic chemical kinetics. IEEE/ACM Int. Conf. on Computer-Aided Design (ICCAD), 2013, pp. 500 – 507. DOI 10.1109/ICCAD.2013.6691163

  60. N. Mohan, V. Vaithianathan: Noise analysis of the input matching circuits for UWB Low Noise Amplifiers. Int. Conf. on Communications and Signal Processing (ICCSP), 2013, pp. 545 – 550. DOI 10.1109/iccsp.2013.6577114

  61. C.S. Paidimarry, B.P. Kumar, S. Katkoori: A novel approach to crosstalk noise analysis in CMOS inverter driven coupled RLC interconnects. Annual IEEE India Conf. (INDICON), 2013, pp. 1 – 6. DOI 10.1109/INDCON.2013.6726011

  62. A. Pinomaa, J. Ahola, A. Kosonen, P. Nuutinen: Noise analysis of a power-line communication channel in an LVDC smart grid concept. IEEE Int. Symp. on Power Line Comm and Its Applications (ISPLC), 2013, pp. 41 – 46. DOI 10.1109/ISPLC.2013.6525822

  63. M. Biggio, F. Bizzarri, A. Brambilla, M. Storace: Effects of numerical noise floor on the accuracy of time domain noise analysis in circuit simulators. IEEE Int. Symp on Circuits and Systems (ISCAS), 2013, pp. 2694 – 2697. DOI 10.1109/ISCAS.2013.6572434

  64. F. de Souza Campos, J.A.C. Ulson, J.W. Swart, M.J. Deen, O. Marinov, D. Karam: Temporal noise analysis and measurements of CMOS active pixel sensor operating in time domain. Symp. on Integrated Circuits and Systems Design (SBCCI), 2013, pp. 1 – 5. DOI 10.1109/SBCCI.2013.6644859

  65. R.V. Dallasen, G.I. Wirth: Low frequency noise models analysis and simulation using Forward Bulk Bias. Symp. on Microelectronics Technology and Devices (SBMicro), 2013, pp. 1 – 4. DOI 10.1109/SBMicro.2013.6676178

  66. A. Murata, S. Agatsuma, D. Ikoma, K. Ichikawa, T. Tsuda, et al.: Noise analysis using on-chip waveform monitor in bandgap voltage references. Int. Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013, pp. 226 – 231. DOI 10.1109/EMCCompo.2013.6735205

  67. S. Panda, B. Maji, C. Mukherjee, A.K. Mukhopadhyay: Thermal noise analysis of SGMOSFET for different substrate and gate oxides. Int. Conf. on Circuits, Power and Computing Technologies (ICCPCT), 2013, pp. 765 – 770. DOI 10.1109/ICCPCT.2013.6528839

  68. K.A. Jensen, V.C. Gaudet, P.M. Levine: Noise analysis and measurement of integrator-based sensor interface circuits for fluorescence detection in lab-on-a-chip applications. Int. Conf on Noise and Fluctuations (ICNF), 2013, pp. 1 – 4. DOI 10.1109/ICNF.2013.6578905

  69. V.B. Suresh, S. Kundu: On analyzing and mitigating SRAM BER due to random thermal noise. IEEE Computer Society Annual Symp. on VLSI (ISVLSI), 2013, pp. 159 – 164. DOI 10.1109/ISVLSI.2013.6654652

  70. M. Voicu, D. Pepe, D. Zito: Phase noise analysis of Colpitts and Hartley CMOS oscillators. Irish Signals and Systems Conf. (ISSC), 2013, pp. 1 – 5. DOI 10.1049/ic.2013.0030

  71. Realov S., Shepard K.L.: Analysis of Random Telegraph Noise in 45-nm CMOS Using On-Chip Characterization System. IEEE Trans on ED, Vol. 60, no. 5, 2013, pp 1716 – 1722. DOI 10.1109/TED.2013.2254118

  72. Hou L., Shi W., Chen S.: Noise Analysis and Optimization of Terahertz Photoconductive Emitters. IEEE Journal of Selected Topics in Quantum Electronics, Vol. 19, no 1, 2013, pp 8401305 DOI 10.1109/JSTQE.2012.2188781

  73. Ming-Long Fan, Hu V.P.-H., Yin-Nein Chen, Pin Su, Ching-Te Chuang: Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET. IEEE Trans on ED, Vol. 60, no. 6, 2013, pp 2038 – 2044. DOI 10.1109/TED.2013.2258157

  74. Alavikia B., Soltani N., Ramahi O.M.: Efficient 2-D Finite-Difference Frequency-Domain Method for Switching Noise Analysis in Multilayer Boards. IEEE Trans on Components, Packaging and Manufacturing Technology, Vol 3, no 5, 2013, pp 841 – 848. DOI 10.1109/TCPMT.2013.2242200

  75. Chulsoon Hwang, Jingook Kim, Achkir B., Jun Fan: Analytical Transfer Functions Relating Power and Ground Voltage Fluctuations to Jitter at a Single-Ended Full-Swing Buffer. IEEE Trans on Components, Packaging and Manufacturing Technology, Vol 3, no 1, 2013, pp 113 – 125. DOI 10.1109/TCPMT.2012.2226723

  76. Fan Yifeng, Rajab K. Z., Hao Yang: Noise analysis of broadband active metamaterials with non-Foster loads. Journal of Applied Physics, Vol. 113, no 23, 2013, pp 233905-1 – 233905-11. DOI 10.1063/1.4811437

  77. G.H. Shiue, J.H. Shiu, Y.C. Tsai, C.M. Hsu: Analysis of Common-Mode Noise for Weakly Coupled Differential Serpentine Delay Microstrip Line in High-Speed Digital Circuits. IEEE Trans on EMC, Vol. 54, no. 3, 2012, pp. 655 – 666. DOI 10.1109/TEMC.2011.2173765

  78. E. Alvarez, A. Abusleme: Noise power normalisation: extension of gm/Id technique for noise analysis. Electronics Lett., Vol. 48, no. 8, 2012, pp. 430 – 432. DOI 10.1049/el.2011.3730

  79. Y. Xie, J. Xu, J. Zhang, Z. Wu, G. Xia: Crosstalk Noise Analysis and Optimization in 5x5 Hitless Silicon-Based Optical Router for Optical Networks-on-Chip (ONoC). J. of Lightwave Technology, Vol. 30, no. 1, 2012, pp. 198 – 203. DOI 10.1109/JLT.2011.2178396

  80. B.G. Gawalwad, S.N. Sharma: Noise analysis of a CMOS inverter using the Itô stochastic differential equation. IEEE Int. Conf on Control Applications (CCA), 2012, pp. 344 – 349. DOI 10.1109/CCA.2012.6402336

  81. Liao F.-R., Lu S.-S.: A Waveform-Dependent Phase-Noise Analysis for Edge-Combining DLL Frequency Multipliers. IEEE Trans. on MTT, Vol. 60, no. 4, 2012, pp 1086 – 1096. DOI 10.1109/TMTT.2012.2183379

  82. Maffezzoni P., Levantino S.: Analysis of VCO Phase Noise in Charge-Pump Phase-Locked Loops. IEEE Trans. on Circuits and Systems I: Regular Papers, Vol. 59, no. 10, 2012, pp. 2165 – 2175. DOI 10.1109/TCSI.2012.2185312

  83. Matthaiou M., Zhong C.: Low-SNR Analysis of MIMO Weibull Fading Channels. IEEE Communications Letters, Vol. 16, no. 5, 2012, pp 694 – 697. DOI 10.1109/LCOMM.2012.030912.120227

  84. Mossberg M.: Analysis of Moments Based Methods for Fractional Gaussian Noise Estimation. IEEE Trans. on Signal Processing, Vol. 60, no. 7, 2012, pp 3823 – 3827. DOI 10.1109/TSP.2012.2191545

  85. Imran S.M.S., Yamada M., Kuwamura Y.: Theoretical Analysis of the Optical Feedback Noise Based on Multimode Model of Semiconductor Lasers. IEEE Journal of Quantum Electronics, Vol. 48, no. 4, 2012, pp 521 – 527. DOI 10.1109/JQE.2012.2186790

  86. Sharma Swati Preeti: BER Analysis of Incoherent SAC-OCDMA System Using ZVCC in a Noisy Environment. 2nd Int. Conf. on Advanced Computing & Communication Technologies (ACCT), 2012, pp 208 – 210. DOI 10.1109/ACCT.2012.35

  87. Majumder M.K, Pandya N.D, Kaushik B.K, Manhas S.K.: Analysis of crosstalk delay and area for MWNT and bundled SWNT in global VLSI interconnects. 13th Int. Symp. on ,Quality Electronic Design (ISQED), 2012, pp 291 – 297. DOI 10.1109/ISQED.2012.6187508

  88. Ning Ma, Barker J., Christensen H., Green P. : Combining Speech Fragment Decoding and Adaptive Noise Floor Modeling. IEEE Trans on Audio, Speech, and Language Processing, 2012, Vol. 20, no 3, pp. 818 – 827. DOI 10.1109/TASL.2011.2165945

  89. S. Revathi, R.Radhika : Signal Integrity modeling for high-speed DDRx Using Chip-Package Board analysis. Int. Journal of Power Control Signal and Computation (IJPCSC), Vol 3, no 1, 2012 ISSN: 0976-268X www.ijcns.com

  90. Ziyan Xu, Guofu Niu: Compact modeling based extraction of RF noise in SiGe HBT terminal currents. IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2012, pp.137 – 140. DOI 10.1109/SiRF.2012.6160162

  91. Everard J.: Low phase noise signal generation, Models and theory, Oscillators and their key elements, Fractional regenerative frequency division, Teaching. IEEE Int. Frequency Control Symposium (FCS), 2012, pp. 1 – 6. DOI 10.1109/FCS.2012.6243681

  92. Ng W., So H.C.: Multiple-Model Based Particle Filters for Frequency Tracking in a-Stable Noise. IEEE Trans on Aerospace and Electronic Systems, Vol. 47, no. 3, 2011, pp. 2254 – 2261. DOI 10.1109/TAES.2011.5937299

  93. Suh I., Roblin P.: Model Comparison for 1/f Noise in Oscillators With and Without AM to PM Noise Conversion. IEEE Trans on MTT, Vol. 59, no. 12, 2011, pp. 3129 – 3145. DOI 10.1109/TMTT.2011.2170086

  94. Lee H.K., Ward P.A., Duwel A.E., Salvia J.C., Qu Y.Q., Melamud R., Chandorkar S.A., Hopcroft M.A., Kim B., Kenny T.W.: Verification of the phase-noise model for MEMS oscillators operating in the nonlinear regime. 16th Int. Solid-State Sensors, Actuators and Microsystems Conf. (TRANSDUCERS), 2011, pp. 510 – 513. DOI 10.1109/TRANSDUCERS.2011.5969667

  95. Bin Xiao, Jinshu Wang: Marine noise simulation based on spectrum analysis. IEEE Int. Symp on VR Innovation (ISVRI), 2011, pp. 231 – 234. DOI 10.1109/ISVRI.2011.5759641

  96. Shmaliy Y.S.: An Iterative Kalman-Like Algorithm Ignoring Noise and Initial Conditions. IEEE Trans on Signal Processing, Vol. 59, no. 6, 2011, pp. 2465 – 2473. DOI 10.1109/TSP.2011.2129516

  97. Vitale F., Pijper R., van der Toorn R.: Compact noise modeling of SiGe Heterojunction Bipolar Transistors: Relevance of base-collector shot noise correlation and non quasi-static effects in the quasi-neutral emitter. IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2011, pp. 178 – 181. DOI 10.1109/BCTM.2011.6082776

  98. Kumar K., Chakravorty A.: Modeling high-frequency noise in SiGe HBTs using delayed minority charge. IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2011, pp. 183 – 186. DOI 10.1109/BCTM.2011.6082777

  99. Jin Tang, Babcock J.A., Krakowski T.L., Smith L., Cestra G.: Characterization and modeling of SiGe HBT low-frequency noise in inverse operating condition. IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2011, pp. 174 – 177. DOI 10.1109/BCTM.2011.6082775

  100. Pacheco-Sanchez A., Enciso-Aguilar M., Rodriguez-Mendez L., Ramirez-Garcia E.: Modeling high-frequency noise behavior in a SiGe Heterojunction Bipolar Transistor for different bias. SBMO/IEEE MTT-S Int.Microwave & Optoelectronics Conference (IMOC), 2011, pp. 901 – 904. DOI 10.1109/IMOC.2011.6169331

  101. Ito K., Matsumoto T., Nishizawa S., Sunagawa H., Kobayashi K., Onodera H. : Modeling of Random Telegraph Noise under circuit operation — Simulation and measurement of RTN-induced delay fluctuation. 12th Int. Symp. on Quality Electronic Design (ISQED), pp. 1 – 6., 2011, DOI 10.1109/ISQED.2011.5770698

  102. S. Müller, Xiaomin Duan, R. Rimolo-Donadio, H-D. Brüns, C. Schuster : Recent Developments of Via and Return Current Path Modeling. Int. Conf. on Electromagnetics in Advanced Applications (ICEAA), Torino, Italy, 2011, pp 1376 – 1379.

  103. Sheikhassadi H., Masoumi N., Hakimi A.: Crosstalk modeling in multiwalled carbon nanotubes as interconnects using the compact RC model. 15th IEEE Workshop on Signal Propagation on Interconnects (SPI), 2011, pp. 133 – 136.
    DOI 10.1109/SPI.2011.5898857

  104. Wen-Yan Yin, Wen-Sheng Zhao: Modeling of carbon nanotube (CNT) interconnects. 15th IEEE Workshop on Signal Propagation on Interconnects (SPI), 2011, pp. 79 – 82. DOI 10.1109/SPI.2011.5898845

  105. Schwarz M., F. Gronwald : EMI Analysis of a Generic Power Line Communication OFDM Data Link. EMC Europe Conf., York, United Kingdom, 2011, pp 625 – 628.

  106. R. Serizel, M. Moonen, J. Wouters, Sřren Holdt Jensen : Output SNR analysis of integrated active noise control and noise reduction in hearing aids under a single speech source scenario. Signal Processing, 2011, Vol. 91, no 8, pp 1719 – 1729. DOI 10.1016/j.sigpro.2011.01.016

  107. Pierobon M., Akyildiz I.: Diffusion-based Noise Analysis for Molecular Communication in Nanonetworks. IEEE Trans. on Signal Processing, vol. 59, no. 6, 2011, pp. 2532 – 2547.   DOI 10.1109/TSP.2011.2114656

  108. Kotzev M., R. Frech, H. Harrer, D. Kaller, A. Huber, T-M Winkel, H-D Brüns, C. Schuster: Crosstalk analysis in high density connector via pin fields for digital backplane applications using a 12-port vector network analyzer. 3rd Electronic System-Integration Technology Conf. (ESTC), 2010, pp 1 – 6. DOI 10.1109/ESTC.2010.5642944

  109. D'Amore, M, Sarto, M.S, Tamburrano, A.: Fast Transient Analysis of Next-Generation Interconnects Based on Carbon Nanotubes. IEEE Trans. on EMC, Vol. 52, no. 2, 2010, pp 496 – 503. DOI 10.1109/TEMC.2010.2045383

  110. Tong Boon Tang, Murray A.F., Roy S. : Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models. IEEE Trans on CAS I: Regular Papers, Vol. 57, no. 5, 2010, pp 1062 – 1070. DOI 10.1109/TCSI.2010.2043988

  111. Nilchi A., D. A.Johns : Analysis of Thermal Noise and the Effect of Parasitics in the Charge-Pump Integrator. Conf. on Ph.D. Research in Microelectronics and Electronics (PRIME), 2010, pp 1 – 4.

  112. Arakali A., Gondi S., Hanumolu P.K.: Analysis and Design Techniques for Supply-Noise Mitigation in Phase-Locked Loops. IEEE Trans on CAS I : Regular Papers, Vol. 57, no. 11, 2010, pp 2880 – 2889. DOI 10.1109/TCSI.2010.2052507

  113. Goz 7: 1/f Noise Modelling in SPICE. 2010 http://goz7.com/?p=115

  114. Yujeong Shim, Jongbae Park, Jaemin Kim, Eakhwan Song, Jeongsik Yoo, Junso Pak, Joungho Kim : Modeling and Analysis of Simultaneous Switching Noise Coupling for a CMOS Negative-Feedback Operational Amplifier in System-in-Package. IEEE Trans on EMC, Vol. 51, no 3, part 2, 2009, pp 763 – 773. DOI 10.1109/TEMC.2009.2026637

  115. Achar R. : Advanced modeling and simulation methodologies for signal integrity analysis. Int. Conf. on Recent Advances in Microwave Theory and Applications (MICROWAVE 2008), 2008, pp 279. DOI 10.1109/AMTA.2008.4763259

  116. Shizhong Mei: Analysis of charge pump phase locked loop in the presence of loop delay and deterministic noise. 51st Midwest Symp on Circuits and Systems (MWSCAS 2008), 2008, pp 193 – 196. DOI 10.1109/MWSCAS.2008.4616769

  117. Hong-Hyun Park, Soo Young Park, Hong Shick Min, Young June Park, Seonghoon Jin: Investigation of noise in silicon nanowire transistors through quantum simulations. Int. Conf. on Simulation of Semiconductor Processes and Devices (SISPAD 2008), 2008, pp. 73 – 76. DOI 10.1109/SISPAD.2008.4648240

  118. Ting-Kuang Wang, Sin-Ting Chen, Chi-Wei Tsai, Sung-Mao Wu, James L. Drewniak, Tzong-Lin Wu : Modeling Noise Coupling Between Package and PCB Power/Ground Planes With an Efficient 2-D FDTD/Lumped Element Method. IEEE Trans on Advanced Packaging, Vol. 30, no. 4, 2007, pp 864 – 871. DOI 10.1109/TADVP.2007.901764

  119. Tabard-Cossa V., D. Trivedi, M. Wiggin, N. N Jetha, A. Marziali : Noise analysis and reduction in solid-state nanopores. Nanotechnology, Vol. 18, 2007, pp 305505 (6 pages) DOI 10.1088/0957-4484/18/30/305505

  120. Zibar D., Mork J., Oxenlowe L.K., Clausen A.T.: Phase Noise Analysis of Clock Recovery Based on an Optoelectronic Phase-Locked Loop. Journal of Lightwave Technology, Vol. 25, no. 3, 2007, pp 901 – 914. DOI 10.1109/JLT.2006.890433

  121. Naeemi A., Meindl J. D.: Design and Performance Modeling for Single-Walled Carbon Nanotubes as Local, Semiglobal, and Global Interconnects in Gigascale Integrated Systems. IEEE Trans. on Electron Devices, Vol. 54, no. 1, 2007, pp. 26 – 37. DOI 10.1109/TED.2006.887210

  122. Calandra E.F., Di Maio B., Lupo D.: On the optimal design of multi-stage cascaded transistor amplifiers with noise, gain and mismatch constraints. 18th European Conf on Circuit Theory and Design, (ECCTD 2007), 2007, pp. 272 – 275. DOI 10.1109/ECCTD.2007.4529589

  123. Carlos Sanchez-Lopez, Esteban Tlelo-Cuautle: Symbolic Noise Analysis in Gm-C Filters. Electronics, Robotics and Automotive Mechanics Conf., Vol. 1, 2006, pp 49 – 53. DOI 10.1109/CERMA.2006.88

  124. Ibrahim M. A., J. A. Hamadamin : Noise Analysis of Phase Locked Loops. Proc of the 5th WSEAS Int. Conf on Telecommunications and Informatics, Istanbul, Turkey, 2006, pp 479 – 484.

  125. Hyunjeong Park, Hyungsoo Kim, Dong Gun Kam, Joungho Kim : Co-Modeling and Co-Simulation of Package and On-Chip Decoupling Capacitor for Resonant Free Power/Ground Network Design. Proc. of 55th Electronic Components and Technology Conf., 2005, pp 727 – 731. DOI 10.1109/ECTC.2005.1441350

  126. Marinkovic Z., Pronic O., Markovic V., Randelovic J.: Bias dependent scalable noise models of MESFETs/HEMTs based on neural networks. 7th Int. Conf. on Telecom. in Modern Satellite, Cable and Broadcasting Services, vol. 2, 2005, pp. 377 – 380. DOI 10.1109/TELSKS.2005.1572131

  127. Payam Heydari : Analysis of the PLL Jitter Due to Power/Ground and Substrate Noise. IEEE Trans on CAS I : Regular Papers, Vol. 51, no 12, 2004, pp 2404 – 2416. DOI 10.1109/TCSI.2004.838240

  128. Heung-Gyoon Ryu, Ying Shan Li, Jin-Soo Park: Nonlinear analysis of the phase noise in the OFDM communication system. IEEE Trans on Consumer Electronics, Vol. 50, no. 1, 2004, pp 54 – 63. DOI 10.1109/TCE.2004.1277841

  129. Mehotra A. : Noise Analysis of Phase-Locked Loops. IEEE Trans on CAS I : Regular Papers, Vol. 49, no 9, 2002, pp 1309 – 1316. DOI 10.1109/TCSI.2002.802347

  130. Heung-Gyoon Ryu, Hyun-Seok Lee: Analysis and minimization of phase noise of the digital hybrid PLL frequency synthesizer. IEEE Trans on Consumer Electronics, Vol. 48, no. 2, 2002, pp 304 – 312. DOI 10.1109/TCE.2002.1010136

  131. Chan S.C., Shephard K., Kim D-J.: Static Noise Analysis for Digital Integrated Circuits in Partially Depleted SoI Technology. IEEE Trans on CAD of Integr. Circ. & Syst., vol 21, no 8, Aug. 2002, pp 916 – 927. DOI 10.1109/TCAD.2002.800461

  132. Marinov O., Deen J., Loukanov V., Velikov V.: The Low Frequency Noise in Reverse Biased Rectifier Diodes. IEEE Trans. on ED, vol. 49, no. 1, Jan 2002, pp 184 – 187. DOI 10.1109/16.974768

  133. Yuan F., Opal A.: Adjoint Network of Periodically Switched Linear Circuits with Applications to Noise Analysis. IEEE Trans. on CAS, vol. 48, no. 2, Feb. 2001, pp 139 – 150. DOI 10.1109/81.904878

  134. Randa J.: Noise Characterization of Multiport Amplifiers. IEEE Trans on MTT, vol. 49, no. 10, Oct. 2001, pp 1757 – 1763. DOI 10.1109/22.954781

  135. Shih N.-F.: Excess Noise Analysis of Separate Absorption Multiplication Region Superlattice Avalanche Photodiodes. IEEE Trans. on ED, vol. 48, no. 6, June 2001, pp 1075 – 1081. DOI 10.1109/16.925229

  136. Carchon G., Nauwelaers B.: Power and Noise Limitations of Active Circulators. IEEE Trans. on MTT, vol. 48, no. 2, Feb. 2000, pp 316 – 319. DOI 10.1109/22.821785

  137. Giannetti R.: On Resistor-Induced Thermal Noise in Linear Circuits. IEEE Trans on Instr. & Meas., vol. 49, no.1, Feb. 2000, pp 87 – 88. DOI 10.1109/19.836315 and 10.1109/TIM.2002.997843

  138. Dong Y., Opal A.: Time-Domain Thermal Noise Simulation of Switched Capacitors Circuits and Delta-Sigma Modulators. IEEE Trans. on CAD of IC, vol. 19, no. 4, April 2000, pp 473 – 481. DOI 10.1109/43.838996

  139. Yuan F., Opal A.: Noise and Sensitivity Analysis of Periodically Switched Linear Circuits in Frequency Domain. IEEE Trans on CAS I, Vol. 47, no. 7, July 2000, pp 986 – 998. DOI 10.1109/81.855454

  140. Coram G.J., Wyatt J.L.: Poisson and Gaussian models for noisy devices. Proc. of 2000 IEEE Int. Symp on Circuits and Systems (ISCAS 2000), vol. 1, 2000, pp. 136 – 139. DOI 10.1109/ISCAS.2000.857045

  141. Coram, G.J., Wyatt J.L.: Poisson models for noisy nonlinear devices. Proc. of 1999 IEEE Int. Symp on Circuits and Systems (ISCAS 1999), vol. 5, 1999, pp. 318 – 321. DOI 10.1109/ISCAS.1999.777573

  142. Heymann P., Rudolph M., Prinzler H., Doerner R., Klapproth L., Bock G.: Experimental Evaluation of Microwave Field-Effect- Transistor Noise Models. IEEE Trans. on MTT, vol. 47, no. 2, Febr. 1999, pp 156 – 163. DOI 10.1109/22.744290

  143. Wyatt J.L., Coram G.J.: Nonlinear Device Noise Models: Satisfying the Thermodynamic Requirements. IEEE Trans on ED, vol. 46, no. 1, Jan. 1999, pp 184 – 193. DOI 10.1109/16.737458

  144. Toth L., Yusim I., Suyama K.: Noise Analysis of Ideal Switched-Capacitor Networks. IEEE Trans. on CAS. Part I, vol. 46, no. 3, March 1999, pp 349 – 363. DOI 10.1109/81.751308

  145. F. Bonani, G. Ghione, M. R. Pinto, R. K. Smith: An efficient approach to noise analysis through multidimensional physics-based models. IEEE Trans on ED., Vol. ED-45, no. 1, 1998, pp 261 – 269. DOI 10.1109/16.658840

  146. Rizolli V., Cecchetti C., Mastri F.: A Rigorous Frequency-Domain Approach to Large-Signal Noise in Nonlinear Microwave Circuits. IEEE Microwave and Guided Wave Let., vol. 8, no. 6, June 1998, pp 220 – 222. DOI 10.1109/75.678570

  147. Ingvarson F., Jeppson K.O.: A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters. Proc. of the 1998 Int. Conf. on Microelectronic Test Structures (ICMTS), 1998, pp. 159 – 164. DOI 10.1109/ICMTS.1998.688061

  148. Werling T., Bourdel E., Pasquet D., Boudiaf A.: Determination of wave noise sources using spectral parametric modeling. IEEE Trans. on MTT, vol. 45, no. 12, 1997, pp. 2461 – 2467. DOI 10.1109/22.643860

  149. Boglione L., Pollard R.D., Postoyalko V.: Analytical Behavior of the Noise Resistance and the Noise Conductance for a Network with Parallel and Series Feedback. IEEE Trans. on MTT, vol. 45 no. 3, March 1997, pp 301 – 304. DOI 10.1109/22.557617

  150. Demir A., Liu W.Y., Sangiovanni-Vincentelli: Time-Domain Non-Monte Carlo Noise Simulation for Nonlinear Dynamic Circuits with Arbitrary Excitations. IEEE Trans on CAD of Integr. Circ.& Syst., vol. 15, no. 5, May 1996, pp 493 – 505. DOI 10.1109/43.506137

  151. Leach W. M.: On the Calculation of Noise in Multistage Amplifiers. IEEE Trans. on CAS, part I, vol.42, no. 3, March 1995, pp 176 – 178. DOI 10.1109/81.376870

  152. Brinson M. E., Faulkner D.J.: A SPICE Noise Macromodel for Operational Amplifiers. IEEE Trans. on CAS, part I, vol.42, no. 3, March 1995, pp 166 – 168. DOI 10.1109/81.376873

  153. Paixao O. P., Jastrzebski A. K.: Analysis and Sensitivities of Noisy Networks Using Nodal Approach. IEEE Trans. on MTT, vol. 42, no. 7, July 1994, pp 1254 – 1260. DOI 10.1109/22.299764

  154. Vargas M., Pallas-Areny R.: The Seemingly Paradoxical Noise Behavior of Some Active Circuits. IEEE Trans. on Instr.& Meas., vol. 43, no. 5, Oct. 1994, pp 764 – 767. DOI 10.1109/19.328889

  155. Rizzoli V., Mastri F., Masotti D.: General Noise Analysis of Nonlinear Microwave Circuits by the Piecewise Harmonic Balance Technique. IEEE Trans. on MTT, vol. 42, no. 5, May 1994, pp 807 – 819. DOI 10.1109/22.293529

  156. Qizheng Gu, Tassoudji M.A., Poh S.Y., Shin R.T., Jin Au Kong: Coupled noise analysis for adjacent vias in multilayered digital circuits. IEEE Trans. on CAS I: Fundamental Theory and Applications, vol. 41, no. 12, 1994, pp. 796 – 804. DOI 10.1109/81.340842

  157. Shang Z.Q., Sewell J.L.: Efficient noise analysis methods for large non-ideal SC and SI circuits. Proc of 1994 IEEE Int. Symp. on Circuits and Systems (ISCAS '94), Vol. 5, 1994, pp. 565 – 568. DOI 10.1109/ISCAS.1994.409438

  158. Mokari E., Patience W.: A New Method of Noise Parameters Calculation Using Direct Matrix Analysis. IEEE Trans. on CAS, I Fundamental Theory and Applic., vol. 39, no. 4, Sept. 1993, pp 767 – 771. DOI 10.1109/81.250168

  159. Ghione G., Filicori F.: A Computationally Efficient Unified Approach to the Numerical Analysis of the Sensitivity and Noise of Semiconductor Devices. IEEE Trans. on CAD of Int. Circ. and Syst., vol. 12, no. 3, March 1993, pp 425 – 438. DOI 10.1109/43.215004

  160. Grosch T. O., Carpenter L.A.: Two-Port to Three-Port Noise Wave Transformation for CAD Applications. IEEE Trans. on MTT, vol. 41, no. 9, Sept. 1993, pp 1543 – 1548. DOI 10.1109/22.245675

  161. Dobrowolski J.A.: CAD oriented method for noise analysis of microwave circuits described by the nodal admittance matrix. IEE Proc – H: Microwaves, Antennas and Propagation, vol. 140, no. 4, 1993, pp. 321 – 325. INSPEC Accession Number: 4472811

  162. Caddemi A., Martines G., Sannino M.: CAD-oriented modeling of low-noise HEMTs. Proc. of the 35th Midwest Symp. on Circuits and Systems, vol. 2, 1992, pp.1489 – 1491. DOI 10.1109/MWSCAS.1992.271012

  163. Ortiz J., Denig C.: Noise Figure Analysis Using Spice. Microwave Journal, vol. 35, no. 4, April 1992, pp 89 – 94.

  164. Pyati V. P.: An Exact Expression for the Noise Voltage Across a Resistor Shunted by a Capacitor. IEEE Trans on CAS, I, vol. 39, no. 12, Dec. 1992, pp 1027 – 1029. DOI 10.1109/81.207729

  165. Hudec P.: Procedures for Exact Noise Analysis. Microwave Journal, Sept. 1992, pp 162 – 170.

  166. Heinen S., Kunisch J., Wolff I.: A Unified Framework for Computer Aided Noise Analysis of Linear and Nonlinear Microwave Circuits. IEEE Trans. on MTT, vol. 39, no. 12, Dec. 1991, pp 2170 – 2175. DOI 10.1109/22.106560

  167. Russer P., Müller S.: Noise Analysis of Linear Microwave Circuits. Int. Journal of Numerical Modelling: Electronic Networks Devices and Systems, vol. 3, 1991, pp 287 – 316. DOI 10.1002/jnm.1660030408

  168. Dobrowolski J.A.: Noise power sensitivities and noise figure minimization of two-ports with any internal topology. IEEE Trans. on MTT, vol. 39, no. 1, Jan. 1991, pp 136 – 140. DOI 10.1109/22.64617

  169. Buxton J.: New SPICE macromodel provides increased AC and transient performance and noise analysis capabilities. Proc of the 34th Midwest Symp on Circuits and Systems,Vol. 2, 1991, pp 588 – 591. DOI 10.1109/MWSCAS.1991.252093

  170. Hagen J. B.: Noise Parameter Transformation for Three Terminal Amplifiers. IEEE Trans. on MTT, vol. 38, no. 3, March 1990, pp 319 – 321. DOI 10.1109/22.45351

  171. Winson P. B., Lardizabal S. M., Dunleavy L.: A Table-Based Bias and Temperature-Dependent Small-Signal and Noise Equivalent Circuit Model. IEEE Trans.on MTT, vol.38, no. 6, June 1990, pp 46 – 51. DOI 10.1109/22.552031

  172. Vasilescu G., Alquié G.: Noise Figure Computation of Microwave Circuits. Proc of MIOP'89, Sindelfingen, Germany, 1989, pp P42.

  173. Dobrowolski J.A.: A CAD-Oriented Method for Noise Figure Computation of Two-Ports with Any Internal Topology. IEEE Trans. on MTT, vol. 37, no. 1, Jan. 1989, pp 15 – 20. DOI 10.1109/22.20016

  174. Pitzalis O. Jr.: Demystify Noise Circuit Modelling and Analysis. Microwaves & RF, Nov. 1990, pp 91 – 98.

  175. Middleton D.: S.O. Rice and the theory of random noise: some personal recollections. IEEE Trans on Information Theory, vol. 34, no. 6, 1988, pp. 1367 – 1373. DOI 10.1109/18.21273

  176. Compact Software: SuperCompact PC 4.0 Now Includes Nodal Noise Analysis Capability. Transm. Line News, vol 2, no 3, Sept 1988, pp 3 – 5.

  177. Rohde U., Pavio A, Pucel A.: Accurate Noise Simulation of Microwave Amplifiers Using CAD. Microwave Journal, Dec. 1988, pp 130 – 141.

  178. Argu Mens: OCTOPUS: Advanced Microwave Circuit Design and Noise Analysis Program. ArguMens, Duisburg, Germany, 1988.

  179. Vasilescu G.: Computer Aided Noise Analysis of Linear Multiport Networks. Electronics Letters, vol. 23, no. 7, 26th March 1987, pp 351 – 353. DOI 10.1049/el:19870259

  180. Kanaglekar N., McIntosh R.E., Bryant W.: Wave Analysis of Noise in Interconnected Multiport Networks. IEEE Trans. on MTT, vol. MTT-35, no. 2, Feb. 1987, pp 112 – 115. DOI

  181. Zein D., Chang C., Selbo K. M. A.: Efficient Method for Computing Noise in a General Purpose CAD Program in APL. IEEE Circ. & Devices Magazine, March 1985, pp 33 – 38.

  182. Rizzoli V., Lipparini A.: Computer-Aided Noise Analysis of Linear Multiport Networks of Arbitrary Topology. IEEE Trans. on MTT, vol. MTT-33, no. 12, Dec. 1985, pp 1507 – 1512. DOI 10.1109/TMTT.1985.1133247

  183. Rizzoli V., Lipparini A.: A CAD Solution to the Generalized Problem of Noise Figure Calculation. 1985 IEEE MTT-S Digest, pp 699 – 702. DOI 10.1109/MWSYM.1985.1132079

  184. Pallottino G. V.: Noise temperature of an active two-port with correlated noise generators. Alta Frequenza, vol. 50, no. 5, sept. 1981, pp 274 – 275.

  185. Hecken R. P.: Analysis of Linear Noisy Two-Ports Using Scattering Waves. IEEE Trans. MTT, vol. MTT-29, no. 10, Oct. 1981, pp 997 – 1004. DOI 10.1109/TMTT.1981.1130490

  186. Young G.P., Scanlan J.O.: Treatment of noise-figure calculations in microwave transistor amplifiers. Electronics Letters, vol. 16, no. 1, 1980, pp. 17 – 18. DOI 10.1049/el:19800015

  187. J.W. Haslett: Effects of Finite Source Impedance on Noise in Current Mirrors. Int. J. Electronics, Vol. 48, no. 6, 1980, pp. 527 – 531. DOI 10.1080/00207218008901135

  188. F.N. Trofimenkoff, J.W. Haslett, R.E. Smallwood: Hot Electron Thermal Noise Models for FET’s. Int. Journal Electronics, Vol. 44, no. 3, 1978, pp. 257 – 272. DOI 10.1080/00207217808900818

  189. Hillbrand H., Russer H.P.: An Efficient Method for Computer Aided Noise Analysis of Linear Amplifier Networks. IEEE Trans. on Circ. and Syst., Vol. CAS-23, no. 4, April 1976, pp 235 – 238. DOI 10.1109/TCS.1976.1084200 and 10.1109/TCS.1976.1084145

  190. Burr-Brown: Noise Analysis of FET Transimpedance Amplifiers. Burr-Brown, Application Bulletin AB-076.

  191. Haus H. A.: On Noise Analysis in Bulk Semiconductors. Solid- State Electronics, vol. 17, 1974, pp 1075 – 1081. doi:10.1016/0038-1101(74)90147-6

  192. Hartmann K., Kotyczka W., Strutt M.J.O.: Computerized Determination of Electrical Network Noise Due to Correlated and Uncorrelated Noise Sources. IEEE Trans. on Circuit Theory, vol. 20, May 1973, pp 321 – 322. DOI 10.1109/TCT.1973.1083669

  193. Branin F. H. Jr.: Network Sensitivity and Noise Analysis Simplified. IEEE Trans. on Circ. Theory, vol. CT-20, no. 3, May 1973, pp 285 – 288. DOI 10.1109/TCT.1973.1083675

  194. Saito S., Fujii Y., Iwamoto A.: Monte Carlo calculation and measurement of shot-noise reduction factor. IEEE Trans. on ED, vol. 19, no. 11, 1972, pp. 1190 – 1198. DOI 10.1109/T-ED.1972.17573

  195. Rohrer R., Nagel L., Meyer R., Weber L.: Computationally Efficient Electronic Circuit Noise Calculation. IEEE JSSC, vol. SC-6, no. 4, Aug. 1971, pp 204 – 213. DOI 10.1109/JSSC.1971.1050169

  196. Finnegan P. J.: Noise Analysis of Feedback Amplifiers. Electronic Eng., Oct. 1967, pp 612 – 616.

  197. Wen C.P., Rowe J.E.: Monte Carlo calculation of noise transport in a two-dimensional diode. IEEE Trans. on ED, vol. 11, no. 3, 1964, pp. 90 – 97. DOI 10.1109/T-ED.1964.15293

  198. Wadhwa R.P., Rowe J.E.: Monte Carlo calculation of noise transport in electric and magnetic fields. IEEE Trans. on ED, vol. 10, no. 6, 1963, pp. 378 – 388. DOI 10.1109/T-ED.1963.15263

  199. Lee Y.W., Cheatham T.P. Jr, Wiesner J.B.: Application of Correlation Analysis to the Detection of Periodic Signals in Noise. Proc of the IRE, vol. 38, no. 10, 1950, pp. 1165 – 1171. DOI 10.1109/JRPROC.1950.233423

  200. Rice S. O.: Mathematical Analysis of Random Noise. Bell Syst. Tech. J., vol. 23, July 1944, pp 282 – 332, vol. 24, Jan. 1945, pp 46 – 156. http://www.dtic.mil/cgi-bin/GetTRDoc?AD=ADB802399&Location=U2&doc=GetTRDoc.pdf

Copyright 2010 © UNESCO - All Rights Reserved.