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MEASUREMENT of INTERFERING SIGNALS

Measurement began our might”

(W. B. Yeats)

  1. Qi Yihong, Wu Jiyu, Zhang Zheng, et al.: Objective Total Isotropic Sensitivity Measurement. IEEE Trans. on EMC, Vol. 59, no. 6, 2017, pp. 1671 – 1676. DOI 10.1109/TEMC.2017.2707641

  2. Thiesson J., Tabbagh A., Simon F.-X, et al.: 3D linear inversion of magnetic susceptibility data acquired by frequency domain EMI. J. of Applied Geophysics, Vol. 136, 2017, pp. 165 – 177. DOI 10.1016/j.jappgeo.2016.10.038

  3. Zhang Ling, Li Xiao, Jiao Xiangyang, et al.: EMI Coupling Paths and Mitigation in Optical Transceiver Modules. IEEE Trans. on EMC, Vol. 59, no. 6, 2017, pp. 1848 – 1855. DOI 10.1109/TEMC.2017.2697761

  4. Lin Han-Nien, Chen Hung-Chi, Kuo Chung-Wei, et al.: Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits. IET Science, Measurement & Technology, Vol. 11, no. 5, 2017, pp. 655 – 665. DOI 10.1049/iet-smt.2016.0348

  5. Valente R., De Ruijter C., Vlasveld D., et al.: Set up for EMI Shielding Effectiveness Tests of Electrically Conductive Polymer Composites at Frequencies up to 3.0 GHz. IEEE Access, Vol. 5, 2017, pp. 16665 – 16675. DOI 10.1109/ACCESS.2017.2741527

  6. Chantana Jakapan, Mano Hiroyuki, Horio Yuhei, et al.: Spectral mismatch correction factor indicated by average photon energy for precise outdoor performance measurements of different-type photovoltaic modules. Renewable Energy, Vol. 114, Part: B, 2017, pp. 567 – 573. DOI 10.1016/j.renene.2017.07.061

  7. Kim Hyesoo, Kim Jonghoon J., Park Junyong, et al.: High-Frequency Modeling and Signal Integrity Analysis of a Silicone Rubber Socket for High-Performance Package. IEEE Trans. on Components, Packaging & Manufacturing Technology, Vol. 7, no. 8, 2017, pp. 1356 – 1368. DOI 10.1109/TCPMT.2017.2712362

  8. Kim Jonghoon J., Kim Heegon, Jung Daniel H., et al.: Signal Integrity Design and Analysis of a Multilayer Test Interposer for LPDDR4 Memory Test With Silicone Rubber-Based Sheet Contact. IEEE Trans. on EMC, Vol. 59, no. 4, Part: 1, 2017, pp. 1239 – 1251. DOI 10.1109/TEMC.2016.2639524

  9. Middelstaedt Lars, Lindemann Andreas: Methodology for analysing radiated EMI characteristics using transient time domain measurements. IET Power Electronics, Vol. 9, no. 10, 2016, pp. 2013 – 2018. DOI 10.1049/iet-pel.2015.0799

  10. Azpurua M.A., Pous M., Silva F.: A Single Antenna Ambient Noise Cancellation Method for In-Situ Radiated EMI Measurements in the Time-Domain. Proc. of Int. Symp. on Electromagnetic Compatibility - EMC Europe, 2016, pp. 501 – 506. DOI 10.1109/EMCEurope.2016.7739185

  11. Azpurua M.A., Pous M., Silva F.: Benefits of Full Time-Domain EMI Measurements for Large Fixed Installation. Proc. of Int. Symp. on Electromagnetic Compatibility - EMC Europe, 2016, pp. 514 – 519. DOI 10.1109/EMCEurope.2016.7739221

  12. Jeschke S., Hirsch H., Trautmann M., et al.: EMI Measurement on Electric Vehicle Drive Inverters using a Passive Motor Impedance Network. IEEE Conf.: Asia-Pacific Int. Symp. on Electromagnetic Compatibility (APEMC), 2016, pp. 292 – 294. DOI 10.1109/APEMC.2016.7523037

  13. Yuan Shih-Yi, Kang Wang-Cheng, Chen Chiu-Kuo: Near Field Program-dependent EMI Measurement and Data Reduction for IOMarking Method. IEEE Conf.: Asia-Pacific Int. Symp. on Electromagnetic Compatibility (APEMC), 2016, pp. 933 – 936. DOI 10.1109/APEMC.2016.7522911

  14. Song Tao, Wang Mengjun, Zuo Panpan, et al.: A Photoelectric Type Tunable Frequency Probe for Near-Field EMI Measurement. IEEE Conf.: Asia-Pacific Int. Symp. on Electromagnetic Compatibility (APEMC), 2016, pp. 997 – 999. DOI 10.1109/APEMC.2016.7522927

  15. Ahmad I.M., Eroglu A., Pomalaza-Raez C., et al.: Simulation and Modeling Technique for EMI measurement of the ECM motors in HVAC Systems. 7th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conf. (IEEE UEMCON), 2016. DOI 10.1109/UEMCON.2016.7777877

  16. Peng Hemeng, Hu Jianyao, Jiang Chunxu, et al.: Analysis for the EMI measurement and propagation path in Hybrid Electric Vehicle. IEEE Information Technology, Networking, Electronic & Automation Control Conf. (ITNEC), 2016, pp. 1087 – 1090. DOI 10.1109/ITNEC.2016.7560532

  17. Keller Matthias, Medler Jens: Use of FFT-based measuring instruments for EMI compliance measurements. ESA Workshop on Aerospace EMC (Aerospace EMC), 2016. DOI 10.1109/AeroEMC.2016.7504565

  18. Wang Xiaoxiao, Zhang Dongrong, Su Donglin, et al.: A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits. IEEE Trans on VLSI, Vol. 24, no. 5, 2016, pp. 1715 – 1727. DOI 10.1109/TVLSI.2015.2492000

  19. Auinger B., Freidl P., Gadringer M., et al.: EMC performance measurements for professional wireless microphone systems. Elektrotechnik und Informationstechnik, Vol. 133, no. 1, 2016, pp. 32 – 38. DOI 10.1007/s00502-016-0386-x

  20. Shekhar Shashank, Cho Duckhyung, Lee Hyungwoo, Cho Dong-Guk, Hong Seunghun: Nanoscale direct mapping of localized and induced noise sources on conducting polymer films. Nanoscale, Vol. 8, no. 2, 2016, pp. 835 – 842. DOI 10.1039/c5nr06896g

  21. Vogt A., Bruens H.-D., Wu Qi, et al.: A Measurement Setup for Quantification of Electromagnetic Interference in Metallic Casings. IEEE Trans. on EMC, Vol. 57, no. 6, 2015, pp. 1354 – 1364. DOI 10.1109/TEMC.2015.2452295

  22. Azpurua M.A., Pous M., Silva F.: On the Statistical Properties of the Peak Detection for Time-Domain EMI Measurements. IEEE Trans. on EMC, Vol. 57, no. 6, 2015, pp. 1374 – 1381. DOI 10.1109/TEMC.2015.2456983

  23. Azpurua M.A., Pous M., Silva F.: A Measurement System for Radiated Transient Electromagnetic Interference Based on General Purpose Instruments. Joint IEEE Int. Symp. on Electromagnetic Compatibility (EMC) and EMC Europe, 2015, pp. 1189 – 1194. DOI 10.1109/ISEMC.2015.7256338

  24. Ayed Ala, Dubois Tristan, Levant Jean-Luc, et al.: Immunity Measurement and Modeling of an ADC Embedded in a Microcontroller Using RFIP Technique. IEEE Trans. on EMC, Vol. 57, no. 5, 2015, pp. 955 – 962. DOI 10.1109/TEMC.2015.2422140

  25. Liu Qiaojue, Ding Weidong, Zhou Haibin, et al.: A Novel Strain Measurement System in Strong Electromagnetic Field. IEEE Trans. on Plasma Science, Vol. 43, no. 10, Part: 1, 2015, pp. 3562 – 3567. DOI 10.1109/TPS.2015.2418276

  26. Zhai Li, Bondarenko N., Xu Bingjie, et al.: A Measurement-Based Model of the Electromagnetic Emissions From a Power Inverter. IEEE Trans. on Power Electronics, Vol. 30, no. 10, 2015, pp. 5522 – 5531. DOI 10.1109/TPEL.2014.2384030

  27. Diouf F., Leferink F., Duval F., et al.: Wideband Impedance Measurements and Modeling of DC Motors for EMI Predictions. IEEE Trans. on EMC, Vol. 57, no. 2, 2015, pp. 180 – 187. DOI 10.1109/TEMC.2014.2370454

  28. Tan Junzhe, Zhao Dongsheng, Ferreira B.: A method for in-situ measurement of grid impedance and load impedance at 2 k-150 kHz. 9th Int. Conf. on Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015, pp. 443 – 448. ISBN:978-8-9570-8254-6

  29. Lin Ming-Shing, He Cyuan-Min, Hs Chung-I G.: Study of Magnetic Probes Used in EMI Measurements. Asia Pacific Symp. on Electromagnetic Compatibility (APEMC), 2015, pp. 399 – 401. DOI 10.1109/APEMC.2015.7175309

  30. Song Jian, Guo Yong Xin: Investigation of Measurement Uncertainties and Errors in EMI Measurement Apparatus. Asia Pacific Symp. on Electromagnetic Compatibility (APEMC), 2015, pp. 593 – 595. DOI 10.1109/APEMC.2015.7175319

  31. Li Kang-Rong, See Kye-Yak: Evaluation of Conducted EMI Measurement Without LISN Using Two-Port ABCD Network Approach for EMI Filter Design Under Real Operating Condition. Asia Pacific Symp. on Electromagnetic Compatibility (APEMC), 2015, pp. 632 – 635. DOI 10.1109/APEMC.2015.7175407

  32. Tsao Chia-Jui, Tu Meng-Hua, Wu Sung-Mao, et al.: Non-contacting Signal Transmission Measurement and Modeling by Coupling Theory. Asia-Pacific Microwave Conf. (APMC), Vol. 1-3, 2015. DOI 10.1109/APMC.2015.7411691

  33. Yuan Shih-Yi, Yeh Ting-Wei, Tang Yung-Chi, et al.: Time-domain EMI Measurement Methodology. 10th Int. Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015, pp. 174 – 178. DOI 10.1109/EMCCompo.2015.7358352

  34. Chunchun Sui, Siqi Bai, Ting Zhu, Cheng C., Beetner D.G.: New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter From Measurements. IEEE Trans. on EMC, Vol. 57, no. 4, 2015, pp. 877 – 884. DOI 10.1109/TEMC.2014.2388236

  35. Chobola Z., Lunak M., Vanek J., Hulicius E., Kusak I.: Low-Frequency Noise Measurements Used for Quality Assessment of GaSb Based Laser Diodes Prepared by Molecular Beam Epitaxy. J. of Electrical Engineering - Elektrotechnicky Casopis, Vol. 66, no. 4, 2015, pp. 226 – 230. DOI 10.2478/jee-2015-0036

  36. Hillebrand J., Kies S., Guhathakurta J., Simon S.: Signal Integrity Model Extraction Based on Computed Tomography Scans - Analysis of the Required Voxel Resolution. IEEE Trans. on EMC, Vol. 57, no. 4, 2015, pp. 847 – 857. DOI 10.1109/TEMC.2015.2435995

  37. Jian Song, Hon Tat Hui, Zhi Wei Sim: Investigation of Measurement Uncertainties and Errors in a Radiated Emission Test System. IEEE Trans. on EMC, Vol. 57, no. 2, 2015, pp. 158 – 163. DOI 10.1109/TEMC.2014.2366163

  38. Peng Li, Daochun Huang, Jiangjun Ruan, Xiaobo Niu: EM Measurements Between MV Switching Sources and Colocated Sensitive Circuit. IEEE Trans. on EMC, Vol. 57, no. 3, 2015, pp. 513 – 521. DOI 10.1109/TEMC.2015.2400230

  39. Altay O., Kalenderli O.: Wavelet base selection for de-noising and extraction of partial discharge pulses in noisy environment. IET Science, Measurement & Technology, Vol. 9, no. 3, 2015, pp. 276 – 284. DOI 10.1049/iet-smt.2013.0114

  40. Yue Hu, Chiampi M., Crotti G.: Characterisation system for the evaluation of digital partial discharge measuring instruments. IET Science, Measurement & Technology, Vol. 9, no. 7, 2015, pp. 817 – 825. DOI 10.1049/iet-smt.2014.0293

  41. Zhi Wei Sim, Jian Song: Radiated spurious emission measurements using fast Fourier transform-based time domain scan. IET Science, Measurement & Technology, Vol. 9, no. 7, 2015, pp. 882 – 889. DOI 10.1049/iet-smt.2014.0333

  42. Serra R., Nabi M.: Wireless coexistence and interference test method for low-power wireless sensor networks. IET Science, Measurement & Technology, Vol. 9, no. 5, 2015, pp. 563 – 569. DOI 10.1049/iet-smt.2014.0351

  43. Wei Liu: Optimal Estimation for Discrete-Time Linear Systems in the Presence of Multiplicative and Time-Correlated Additive Measurement Noises. IEEE Trans. on Signal Processing, Vol. 63, no. 17, 2015, pp. 4583 – 4593. DOI 10.1109/TSP.2015.2447491

  44. Guo Shuxia, Wang Yafeng, Liu Ruibing, Gao Ying: Multi-dimensional and complicated electromagnetic interference hardware-in-the-loop simulation method. J. of Systems Engineering & Electronics, Vol. 26, no. 6, 2015, pp. 1142 – 1148. DOI 10.1109/JSEE.2015.00124

  45. Pous M., Silva F.: Full-Spectrum APD Measurement of Transient Interferences in Time Domain. IEEE Trans. on EMC, Vol. 56, no. 6, 2014, pp. 1352 – 1360. DOI 10.1109/TEMC.2014.2352393

  46. Schlegel C., Mallay M., Touesnard C.: Atmospheric Magnetic Noise Measurements in Urban Areas. IEEE Magnetics Letters, Vol. 5, pp. 1 – 4, 2014, Article # 0800204. DOI 10.1109/LMAG.2014.2330337

  47. Ono H., Mizuno T., Takara H., Ichii K., Takenaga K., Matsuo,S., Yamada M.: Inter-core crosstalk measurement in multi-core fibre amplifier using multiple intensity tones. Electronics Lett., Vol. 50, no. 14, 2014, pp. 1009 – 1010. DOI 10.1049/el.2014.1373

  48. Rajamani V., West J.C., Bunting C.F.: Measurement and Simulation of the Induced Current on a Wire Using S-Parameter Method. IEEE Trans. on EMC, Vol. 56, no. 2, 2014, pp. 303 – 310. DOI 10.1109/TEMC.2013.2283070

  49. Monsef F., Cozza A.: Variability and Confidence Intervals of the Power Measured in a Reverberation Chamber. IEEE Trans. on EMC, Vol. 56, no. 5, 2014, pp. 1238 – 1241. DOI 10.1109/TEMC.2014.2305845

  50. Kim J.J., Changhyun Cho, Bumhee Bae, Sukjin Kim, Sunkyu Kong, Heegon Kim, Jung D.H., Jiseong Kim, Joungho Kim: Chip-Level Simultaneous Switching Current Measurement in Power Distribution Network Using Magnetically Coupled Embedded Current Probing Structure. IEEE Trans. on Components, Packaging & Manufacturing Technology, Vol. 4, no. 12, 2014, pp. 1963 – 1972. DOI 10.1109/TCPMT.2014.2362130

  51. I-Chyn Wey, Chien-Chang Peng, Hwang-Cherng Chow: Wide Bandwidth and High Precision Power Supply Noise Detector by Using Dual Peak Detection Sample and Hold Circuits. Int. Journal of Circuit and Theory Applications, Vol. 42, no. 5, 2014, pp. 529 – 541. DOI 10.1002/cta.1868

  52. Ameya Michitaka, Kurokawa Satoru: Automatic site-VSWR measurement using mobile robot platform. Int. Symp. on Electromagnetic Compatibility (EMC EUROPE), 2014, pp. 957 – 961. DOI 10.1109/EMCEurope.2014.6931041

  53. De Keulenaer T., Yu Ban, Torfs G., Sercu S., De Geest J., Bauwelinck J.: Measurements of millimeter wave test structures for high speed chip testing. IEEE 18th Workshop on Signal and Power Integrity (SPI), 2014, pp. 1 – 4. DOI 10.1109/SaPIW.2014.6844529

  54. Yu Zhanqing, Zhang Xiao, He Jinliang, Huang Yin, Qiu Wei: Measurements of electromagnetic interference in an operating ±800 kV DC converter station. XXXIth URSI General Assembly and Scientific Symp., 2014, pp. 1 – 4. DOI 10.1109/URSIGASS.2014.6929536

  55. Leca J.P., Froidevaux N., Dupre P., Jacquemod G., Braquet H.: EMI Measurements, Modeling, and Reduction of 32-Bit High-Performance Microcontrollers. IEEE Trans on EMC, Vol. 56, no. 5, 2014, pp. 1035 – 1044. DOI 10.1109/TEMC.2014.2304744

  56. Alnasser E.: The Stability Analysis of a Biopotential Measurement System Equipped With Driven-Right-Leg and Shield-Driver Circuits. IEEE Trans on Instr. & Meas., Vol. 63, no. 7, 2014, pp. 1731 – 1738. DOI 10.1109/TIM.2013.2293811

  57. Pous M., Silva F.: APD radiated transient measurements produced by electric sparks employing time-domain captures. Int. Symp. on Electromagnetic Compatibility (EMC EUROPE), 2014, pp. 813 – 817. DOI 10.1109/EMCEurope.2014.6931016

  58. Joodaki M., Attar A.: A radiated EMI measurement setup for un-buffered DRAM PCBs. Int. Symp. on Electromagnetic Compatibility (EMC EUROPE), 2014, pp. 756 – 759. DOI 10.1109/EMCEurope.2014.6931005

  59. Sun A.G., Crofton M.W., Young J.A., Cox W.A., Beiting E.J.: Time-domain radiated emissions measurement of laboratory simulated spacecraft on-orbit electrostatic discharge. Int. Symp. on Electromagnetic Compatibility (EMC EUROPE), 2014, pp. 775 – 780. DOI 10.1109/EMCEurope.2014.6931009

  60. Qi Huang, Xiaohua Wang, Wei Zhen, Pong P.W.T.: Broadband Point Measurement of Transient Magnetic Interference in Substations With Magnetoresistive Sensors. IEEE Trans on Magnetics, Vol. 50, no. 7, 2014, pp. 1 – 5. DOI 10.1109/TMAG.2013.2297394

  61. Mirtalaei S.M.M., Sadeghi S.H.H., Moini R.: A Combined Method-of-Moments and Near-Field Measurements for EMI Evaluation of Switched-Mode Power Supplies. IEEE Trans on Industrial Electronics, Vol. 61, no. 4, 2014, pp. 1811 – 1818. DOI 10.1109/TIE.2013.2267703

  62. Grobler I., Gitau M.N.: Modelling and measurement of high switching frequency conducted EMI. Conf. on IEEE Industrial Electronics Society (IECON), 2013, pp. 1031 – 1036. DOI 10.1109/IECON.2013.6699275

  63. Kiyoshige S., Ichimura W., Terasaki M., Kobayashi R., Kubo G., Otsuka H., Sudo T.: Measurement and analysis of anti-resonance peak in total PDN impedance. Int. Symp. on Electromagnetic Compatibility (EMC EUROPE), 2013, pp. 931 – 936. http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6653435&isnumber=6653179

  64. G. Giusi, G. Scandurra, C. Ciofi: Estimation Errors in 1/fγ Noise Spectra when Employing DFT Spectrum Analyzers. Fluct. Noise Lett., Vol. 12, no. 01, 2013, Article # 1350007. DOI 10.1142/S0219477513500077

  65. Benjamin Lenoir: Predicting the Variance of a Measurement with 1/f Noise. Fluct. Noise Lett., Vol. 12, no. 01, 2013, Article # 1350006. DOI 10.1142/S0219477513500065

  66. Ji Zhang, Kam K.W., Jin Min, Khilkevich V.V., Pommerenke D., Jun Fan: An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application. IEEE Trans on Instr. & Meas., Vol. 62, no. 3, 2013, pp. 648 – 658. DOI 10.1109/TIM.2012.2218678

  67. Tabbakh M.S., Morel F., Mrad R., Zaatar Y.: High frequency battery impedance measurements for EMI prediction. IEEE Int. Symp. on Electromagnetic Compatibility (EMC), 2013, pp. 763 – 767. DOI 10.1109/ISEMC.2013.6670512

  68. Huadong Li, Kye Yak See: Conversion Factors Between Common Detectors in EMI Measurement for Impulse and Gaussian Noises. IEEE Trans on EMC, Vol. 55, no. 4, 2013, pp. 657 – 663. DOI 10.1109/TEMC.2012.2227752

  69. Kostov K.S., Nee H.-P., Priecinsky M.: The input impedance of common mode and differential mode noise separators. IEEE Energy Conversion Congress and Exposition (ECCE), 2013, pp. 1688 – 1695. DOI 10.1109/ECCE.2013.6646910

  70. Fujita H., Takatani H., Tanaka Y., Kawaguchi S., Sato M., Sudo T.: Evaluation of PDN impedance and power supply noise for different on-chip decoupling structures. Int. Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013, pp. 142 – 146. DOI 10.1109/EMCCompo.2013.6735189

  71. Baev A., Gorbunova A., Konovalyuk M., Kuznetsov Y., Russer J.A.: Stochastic EMI sources localization based on ultra wide band near-field measurements. European Microwave Conf. (EuMC), 2013, pp. 11311134.

  72. Russer J.A., Braun S., Frech A., Russer P.: Time-domain measurement of spectra of stochastic electromagnetic fields. Int. Conf on Electromagnetics in Advanced Applications (ICEAA), 2013, pp. 1123 – 1126. DOI 10.1109/ICEAA.2013.6632417

  73. Decrock L., Catrysse J., Vanhee F., Pissoort D.: Measuring and simulating EMI on very small components at high frequencies. Int. Symp. on Electromagnetic Compatibility (EMC EUROPE), 2013, pp. 961 – 965. http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6653440&isnumber=6653179

  74. Osabe K., Kato T.: Proposal for evaluation method of proficiency test results on EMI measurement. IEEE Int. Symp. on Electromagnetic Compatibility (EMC), 2013, pp. 138 – 143. DOI 10.1109/ISEMC.2013.6670397

  75. Sun A.G., Crofton M.W., Young J.A., Cox W.A., Beiting E.J.: L-, S-, and C-Band EMI Measurement and Characterization of Spacecraft ESD Events. IEEE Trans on Plasma Science, Vol. 41, no. 12, 2013, pp. 3505 – 3511. DOI 10.1109/TPS.2013.2288099

  76. Adusumilli S., Almalkawi M., Devabhaktuni V.: A robust correction model based neural network modeling framework for electromagnetic simulations and RF measurements. 82nd Microwave Measurement Conference (ARFTG), 2013, pp. 1 – 6. DOI 10.1109/ARFTG-2.2013.6737364

  77. Fuketa Hiroshi, Takahashi Ryo, Takamiya Makoto, Nomura Masahiro, Shinohara Hirofumi, Sakurai Takayasu: Increase of Crosstalk Noise Due to Imbalanced Threshold Voltage Between nMOS and pMOS in Subthreshold Logic Circuits. IEEE Journal of SSC, Vol. 48, no. 8, Special Issue: SI, 2013, pp. 19861994. DOI 10.1109/JSSC.2013.2258831

  78. Teixeira H.M., Dghais W., Cunha T.R., Pedro J.C.: Measurement Setup for RF/Digital Buffers Characterization. IEEE Trans on Instr. & Meas., Vol. 62, no. 7, 2013, pp. 1892 – 1899. DOI 10.1109/TIM.2013.2248294

  79. Russer P., Russer J., Hoffmann C., Slim H.H.: Real-time EM spectrum and EM interference measurement techniques. European Microwave Conf. (EuMC), 2013, pp. 1115 – 1118. http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6686857&isnumber=6686544

  80. Moravek O., Hoffmann K., Polivka M., Jelinek L.: Precise Measurement Using Coaxial-to-Microstrip Transition Through Radiation Suppression. IEEE Trans on MTT, Vol. 61, no. 8, Part I, 2013, pp. 2956 – 2965. DOI 10.1109/TMTT.2013.2272380

  81. Goyal A., Swaminathan M., Chatterjee A.: One-Port Resonance-Based Test Technique for RF Interconnect and Filters Embedded in RF Substrates. IEEE Trans on Components, Packaging and Manufacturing Technology, Vol. 3, no. 2, 2013, pp. 236 – 246. DOI 10.1109/TCPMT.2012.2226582

  82. Tait G.B., Hager C., Slocum M.B., Hatfield M.O.: On Measuring Shielding Effectiveness of Sparsely Moded Enclosures in a Reverberation Chamber. IEEE Trans on EMC, Vol. 55, no. 2, 2013, pp. 231 – 240. DOI 10.1109/TEMC.2012.2220779

  83. Lei Zhao, Xiaofang Hu, Changqing Feng, Shaochun Tang, Shubin Liu, Qi An: A 1.6-Gsps High-Resolution Waveform Digitizer Based on a Time-Interleaved Technique. IEEE Trans on Nuclear Science, Vol. 60, no. 3, 2013, pp. 2180 – 2187. DOI 10.1109/TNS.2013.2257846

  84. Li H., See K.Y.: Conversion Factors Between Common Detectors in EMI Measurement for Impulse and Gaussian Noises. IEEE Trans on EMC, Vol. 55, no. 4, 2013, pp. 657 – 663. DOI 10.1109/TEMC.2012.2227752

  85. Amador E., Krauthauser H.G., Besnier P.: A Binomial Model for Radiated Immunity Measurements. IEEE Trans on EMC, Vol. 55, no. 4, 2013, pp. 683 – 691. DOI 10.1109/TEMC.2012.2231942

  86. Sanchez A.-M., Regue J.-R., Ribo M., Perez A., Rodriguez-Cepeda P., Pajares F.-J.: Automated Power-Line Filter Design Under High 50-Hz Current Load Conditions. IEEE Trans on EMC, Vol. 55, no. 4, 2013, pp. 717 – 724. DOI 10.1109/TEMC.2012.2225626

  87. Park H.H., Jang H.-T., Park H.-B., Choi C.: An EMI Evaluation Method for Integrated Circuits in Mobile Devices. IEEE Trans on EMC, Vol. 55, no. 4, 2013, pp. 780 – 787. DOI 10.1109/TEMC.2012.2227753

  88. Cuellar C., Idir N., Benabou A., Margueron X.: High frequency current probes for common-mode impedance measurements of power converters under operating conditions. Proc. of the European Conf. on Power Electronics and Applications (EPE), 2013, pp. 1 – 8 DOI 10.1109/EPE.2013.6631983

  89. Xiaoxia Zhou, Jing Li, Hongmei Fan, Bhobe A., Sochoux P., Jinghan Yu: High-frequency EMC design verification through full-wave simulations and measurements in Reverberation Chamber. IEEE Int. Symp. on Electromagnetic Compatibility (EMC), 2013, pp. 299 – 305. DOI 10.1109/ISEMC.2013.6670427

  90. Harada Yuji, Yoshikawa Kumpei, Miura Noriyuki, Nagata Makoto, Murata Akitaka, Agatsuma Syuji, Ichikawa Kouji: Power-Noise Measurements of Small-Scale Inverter Chains. IEEE Int. Meeting for Future of Electron Devices Kansai (IMFEDK), 2013.

  91. Rengarajan S.R.: Improving Signal Integrity in Time Domain Measurements of Antenna Boresight Fields. Proc of URSI Int. Symp. on Electromagnetic Theory, 2013, pp. 970 – 972.

  92. Grossman B., Fledell E., Aca E.: Adventures in measurement. IEEE Microwave Magazine, Vol. 14, no. 3, 2013, pp. 94 102. DOI 10.1109/MMM.2013.2240854

  93. Joohee Kim, Joungho Kim: Signal integrity modeling and measurement of TSV in 3D IC. Asia and South Pacific Design Automation Conference (ASP-DAC), 2013, pp.13 16. DOI 10.1109/ASPDAC.2013.6509551

  94. F. Wan, J.-X. Ge, Y. Zhou, B. Yu: Improved immunity measurement of a microcontroller to conducted continuous wave interference. Progress In Electromagnetics Research M, Vol. 31, 2013, pp. 117 – 127. http://www.jpier.org/PIERM/pierm31/09.13041902.pdf

  95. F. Wan, J.-X. Ge, M. Qu: Conducted emission measurement of a cell phone processor module. Progress In Electromagnetics Research C, Vol. 42, 2013, pp. 191 – 203. http://www.jpier.org/PIERC/pierc42/15.13060705.pdf

  96. Melia G.C.R., Robinson M.P., Flintoft I.D., Marvin A.C., Dawson J.F.: Broadband Measurement of Absorption Cross Section of the Human Body in a Reverberation Chamber. IEEE Trans on EMC, Vol. 55, no. 6, 2013, pp. 1043 – 1050. DOI 10.1109/TEMC.2013.2248735

  97. Medler J.: New requirements in the treatment of measurement instrumentation uncertainty in accordance with CISPR 16-4-2 edition 2. Asia-Pacific Symp. on Electromagnetic Compatibility (APEMC), 2012, pp. 377 – 380. DOI 10.1109/APEMC.2012.6237880

  98. Niitsu K., Sakurai M., Harigai N., Hirabayashi D., Yamaguchi T.J., Kobayashi H.: A reference-free on-chip timing jitter measurement circuit using self-referenced clock and a cascaded time difference amplifier in 65nm CMOS. 17th Asia and South Pacific Design Automation Conference (ASP-DAC), 2012, pp 553 – 554. DOI 10.1109/ASPDAC.2012.6165014

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