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NOISE MEASUREMENT and PARAMETER EXTRACTION

Measurement began our might”

(W. B. Yeats)

  1. Salzenstein P., Wu T.Y.: Uncertainty analysis for a phase-detector based phase noise measurement system. Measurement, Vol. 85, 2016, pp. 118 – 123. DOI 10.1016/j.measurement.2016.02.026

  2. Fangzheng Zhang, Dengjian Zhu, Shilong Pan: Photonic-assisted wideband phase noise measurement of microwave signal sources. Electronics Lett., Vol. 51, no. 16, 2015, pp. 1272-1274 DOI 10.1049/el.2015.0810

  3. Groves P., Conroy P., Belostotski L., Okoniewski M.: Measuring antenna noise parameters using a set of Wheeler caps. 10th European Conf on Antennas and Propagation (EuCAP), 2016, pp. 1 – 4. DOI 10.1109/EuCAP.2016.7481866

  4. Andee Y.: Advanced Techniques for Noise Figure and Noise Parameters Measurement of Differential Amplifiers. Ph.D. dissertation, University of Lille 1, 2015, 114 pages. https://ori-nuxeo.univ-lille1.fr/nuxeo/site/esupversions/f2cba8d2-4f77-4335-917b-123ada6f5f50

  5. Weiming Yao, Gilardi G., Calabretta N., Smit M.K., Wale M.J.: Experimental and Numerical Study of Electrical Crosstalk in Photonic-Integrated Circuits. J. of Lightwave Technology, Vol. 33, no. 4, 2015, pp. 934 – 942. DOI 10.1109/JLT.2015.2391172

  6. Butta M., Ripka P., Kraus L.: Effect of Stress-Induced Anisotropy on the Noise of Ring-Core Fluxgate. IEEE Trans on Magnetics, Vol. 51, no.1, 2015, pp. 1 – 4. DOI 10.1109/TMAG.2014.2358793

  7. Tzu-Chien Hsueh, O'Mahony F., Mansuri M., Casper B.: An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements. IEEE Journal of Solid State Circ., Vol. 50, no. 7, 2015, pp. 1711 – 1721. DOI 10.1109/JSSC.2015.2431071

  8. Stadler A.W., Kolek A., Zawislak Z., Dziedzic A.: Noise Measurements of Resistors with the Use of Dual-Phase Virtual Lock-In Technique. Metrology and Measurement Systems, Vol. 22, no. 4, 2015, pp. 503 – 512. DOI 10.1515/mms-2015-0051

  9. Carniti P., Cassina L., Gotti C., Maino M., Pessina G.: A Technique for Noise Measurement Optimization with Spectrum Analyzers. Journal of Instrumentation, Vol. 10, 2015, Article # P08016. DOI 10.1088/1748-0221/10/08/P08016

  10. Zhu Dengjian, Zhang Fangzheng, Zhou Pei, et al.: Phase Noise Measurement of Wideband Microwave Sources Based on a Microwave Photonic Frequency Down-Converter. Optics Lett., Vol. 40, no. 7, 2015, pp. 1326 – 1329. DOI 10.1364/OL.40.001326

  11. Crossno J., Liu Xiaomeng, Ohki T.A., Kim Philip, Fong Kin Chung: Development of high frequency and wide bandwidth Johnson noise thermometry. Applied Physics Lett., Vol. 106, no. 2, 2015, Article # 023121. DOI 10.1063/1.4905926

  12. Katsivelis P.S., Gonos I.F., Stathopulos I.A.: Human-to-metal electrostatic discharge current measurements - Notes on the ESD current waveform. J. of Electrostatics, Vol. 77, 2015, pp. 182 – 190. DOI 10.1016/j.elstat.2015.08.006

  13. Andersen A., Dennison J.R., Sim A.M., et al.: Measurements of Endurance Time for Electrostatic Discharge of Spacecraft Materials: A Defect-Driven Dynamic Model. IEEE Trans on Plasma Science, Vol. 43, no. 9, 2015, Special no. SI, Part: 1, pp. 2941 – 2953. DOI 10.1109/TPS.2015.2428258

  14. Toyoda K., Kawano A., Miyazaki S., Cho M.: Flashover Discharge Measurement With Uniform Surface Charging and Modeling of Current Waveform. IEEE Trans on Plasma Science, Vol. 43, no. 9, 2015, Special no. SI, Part: 1, pp. 3064 – 3069. DOI 10.1109/TPS.2015.2404853

  15. Hoffmann R., Ferguson D., Patton J., et al.: AFRL Round-Robin Test Results on Plasma Propagation Velocity. IEEE Trans on Plasma Science, Vol. 43, no. 9, 2015, Special no. SI, Part: 1, pp. 3006 – 3013. DOI 10.1109/TPS.2015.2465865

  16. Lehmeyer B., M.T. Ivrlač, J.A. Nossek: LNA noise parameter measurement. European Conf on Circuit Theory and Design (ECCTD), 2015, pp. 1 – 4. DOI 10.1109/ECCTD.2015.7300071

  17. Sui Chunchun, Bai Siqi, Zhu Ting, et al.: New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter From Measurements. IEEE Trans on EMC, Vol. 57, no. 4, 2015, Special no. SI, pp. 877 – 884. DOI 10.1109/TEMC.2014.2388236

  18. Chobola Z., Lunak M., Vanek J., et al.: Low-Frequency Noise Measurements Used for Quality Assessment of GaSb Based Laser Diodes Prepared by Molecular Beam Epitaxy. J. of Electrical Engineering - Elektrotechnicky casopis, Vol. 66, no. 4, 2015, pp. 226 – 230. DOI 10.2478/jee-2015-0036

  19. Hati A., Nelson C.W., Howe D.A.: PM Noise Measurement at W-Band. IEEE Trans on Ultrasonics, Ferroelectrics and Frequency Control, Vol. 61, no. 12, 2014, pp. 1961 – 1966. DOI 10.1109/TUFFC.2014.006647

  20. Malik R., Kumpera A., Lorences-Riesgo A., Andrekson P.A., Karlsson M.: Frequency-resolved noise figure measurements of phase (in)sensitive fiber optical parametric amplifiers. Optics Express, Vol. 22, no. 23, 2014, pp. 27821 – 27832. DOI 10.1364/OE.22.027821

  21. Deng M., Poulain L., Gloria D., Quemerais T., Chevalier P., Lepilliet S., Danneville F., Dambrine G.: Millimeter-Wave In Situ Tuner: An Efficient Solution to Extract the Noise Parameters of SiGe HBTs in the Whole 130–170 GHz Range. IEEE Microwave & Wireless Comp. Lett., Vol. 24, no. 9, 2014, pp. 649 – 651. DOI 10.1109/LMWC.2014.2331762

  22. J. Randa: Comparison of noise-parameter measurement strategies: Simulation results for amplifiers. 84th Microwave Measurement Conf (ARFTG), 2014, pp. 1 – 8. DOI 10.1109/ARFTG.2014.7013402

  23. Ke Lin, Liu Hongwei, Lai Szu Cheng, et al.: A novel approach to investigate bulk carrier lifetime using low frequency fluctuation noise measurement. Semiconductor Science and Technology, Vol. 29, no. 12, 2014, Article # 125005. DOI 10.1088/0268-1242/29/12/125005

  24. Scandurra G., Giusi G., Ciofi C.: A very low noise, high accuracy, programmable voltage source for low frequency noise measurements. Review of Scientific Instruments, Vol. 85, no. 4, 2014, Article # 044702. DOI 10.1063/1.4870248

  25. Hashisaka Masayuki, Ota Tomoaki, Yamagishi Masakazu, Fujisawa Toshimasa, Muraki Koji: Cross-correlation measurement of quantum shot noise using homemade transimpedance amplifiers. Review of Scientific Instruments, Vol. 85, no. 5, 2014, Article # 054704. DOI 10.1063/1.4875588

  26. M. Borgarino, G. Betti Beneventi, V. Doga, P. Pavan: On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization. Microelectronics Journal, Vol. 45, no. 2, 2014, pp. 152 – 158. DOI 10.1016/j.mejo.2013.12.007

  27. Lagore R.L, Roberts B.R., Possanzini C., Saylor C., Fallone B G., De Zanche N.: A system for automated noise parameter measurements on MR preamplifiers and application to high B0 fields. NMR in biomedicine, Vol. 27, no. 8, 2014, pp. 926 – 938. DOI 10.1002/nbm.3138

  28. Jauregui R., Portilla J.: Optimum-Setting and Calibration Procedures for Heterodyne Measurements of Amplitude and Phase Noise in High-Frequency Amplifiers. Trans on MTT, Vol. 62, no. 5, 2014, pp. 1239 – 1248. DOI 10.1109/TMTT.2014.2315165

  29. Diebold S., Weissbrodt E., Massler H., Leuther A., Tessmann A., Kallfass I.: A W-Band Monolithic Integrated Active Hot and Cold Noise Source. Trans on MTT, Vol. 62, no. 3, 2014, pp. 623 – 630. DOI 10.1109/TMTT.2014.2299770

  30. Guo T.N.: Unique Measurement and Modeling of Total Phase Noise in RF Receiver. IEEE Trans on CAS II: Express Briefs, Vol. 60, no. 5, 2013, pp. 262 – 266. DOI 10.1109/TCSII.2013.2251966

  31. Anthur A.P., Venkitesh D.: High-resolution technique for simultaneous measurement of phase noise of multiwavelength optical systems. Electronics Lett., Vol. 49, no. 18, 2013, pp. 1165 – 1167. DOI 10.1049/el.2013.1784

  32. Wenchao Li, Xuezhi Wang, Xinmin Wang, Moran B.: Resolving phase measurement ambiguity in presence of coloured noise. Electronics Lett., Vol. 49, no. 18, 2013, pp 1188 – 1190. DOI 10.1049/el.2013.1209

  33. Mok S., Park P.G.: Normalised least-mean-square algorithm for adaptive filtering of impulsive measurement noises and noisy inputs. Electronics Lett., Vol. 49, no. 20, 2013, pp. 1270 – 1272. DOI 10.1049/el.2013.2482

  34. Muroga S., Arai K., Dhungana S., Okuta R., Endo Y., Yamaguchi M.: 3-D Magnetic-Near-Field Scanner for IC Chip-Level Noise Coupling Measurements. IEEE Trans on Magnetics, Vol. 49, no. 7, 2013, pp. 3886 – 3889. DOI 10.1109/TMAG.2013.2250264

  35. Pellegrini B., Basso G., Fiori G., Macucci M., Maione I.A., Marconcini P.: Improvement of the accuracy of noise measurements by the two-amplifier correlation method. Review of Scientific Instruments, Vol. 84, no. 10, 2013, pp. 104702 – 104702-11 DOI 10.1063/1.4823780

  36. Wenchao Li, Xuezhi Wang, Xinmin Wang, Moran B.: Distance Estimation Using Wrapped Phase Measurements in Noise. IEEE Trans on Signal Processing, Vol. 61, no. 7, 2013, pp.1676 – 1688. DOI 10.1109/TSP.2013.2238934

  37. Akgiray A.H., Weinreb S., Leblanc R., Renvoise M., Frijlink P., Lai R., Sarkozy S.: Noise Measurements of Discrete HEMT Transistors and Application to Wideband Very Low-Noise Amplifiers. Trans on MTT, Vol. 61, no. 9, 2013, pp. 3285 – 3297. DOI 10.1109/TMTT.2013.2273757

  38. Homann C., Riedle E.: Direct measurement of the effective input noise power of an optical parametric amplifier. Laser & Photonics Reviews, Vol. 7, no. 4, 2013, pp. 580 – 588. DOI 10.1002/lpor.201200119

  39. D. Russell, S. Weinreb: Cryogenic Self-Calibrating Noise Parameter Measurement System. IEEE Trans on MTT, Vol. 60, no. 5, 2012, pp. 1456 – 1467. DOI 10.1109/TMTT.2012.2188813

  40. Lambert H.C.: Cramer-Rao Bounds for Target Tracking Problems Involving Colored Measurement Noise. IEEE Trans. on Aerospace and Electronic Systems, Vol. 48, no. 1, 2012, pp. 620 – 636. DOI 10.1109/TAES.2012.6129659

  41. Tsormpatzoglou A., Hastas N.A., Khan S., Hatalis M., Dimitriadis C. A.: Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements. IEEE ED Letters, Vol. 33, no. 4, 2012, pp. 555 – 557. DOI 10.1109/LED.2012.2185677

  42. Bartolo R.E., Tveten A.B., Dandridge A.: Thermal Phase Noise Measurements in Optical Fiber Interferometers. IEEE Journal of Quantum Electronics, Vol. 48, no. 5, 2012, pp. 720 – 727. DOI 10.1109/JQE.2012.2190717

  43. Green J.E., Loh W.S., Marshall A.R.J., Ng B.K., Tozer R.C., David J.P.R., Soloviev S.I., Sandvik P.M.: Impact Ionization Coefficients in 4H-SiC by Ultralow Excess Noise Measurement. IEEE Trans. on ED, Vol. 59, no. 4, 2012, pp. 1030 – 1036. DOI 10.1109/TED.2012.2185499

  44. Qiu K., Dogandzic A.: Sparse Signal Reconstruction from Quantized Noisy Measurements via GEM Hard Thresholding. IEEE Trans. on Signal Processing, Vol. 60, no. 5, 2012, pp. 2628 – 2634. DOI 10.1109/TSP.2012.2185231

  45. Fernandez I., Angueira P., de la Vega David, Pena I., Guerra D., Gil, U. : Carrier and Noise Measurements in the Medium Wave Band for Urban Indoor Reception of Digital Radio. IEEE Trans. on Broadcasting, Vol. 58, no. 1, 2012, pp. 98 – 105. DOI 10.1109/TBC.2011.2165742

  46. Wiatr W.: Source-pull noise characterization of GaAs pHEMTs. Int. Conf on Microwave Radar and Wireless Communications (MIKON), Vol. 2, 2012, pp. 794 – 798. DOI 10.1109/MIKON.2012.6233579

  47. Rendek K., Satka A., Donoval D.: Measurement set-up for low-frequency noise characterization of GaN HEMT transistors. Int. Conf. Radioelektronika (RADIOELEKTRONIKA), 2012, pp. 1 – 4. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6207675&isnumber=6207636

  48. Ito K., Matsumoto T., Nishizawa S., Sunagawa H., Kobayashi K., Onodera H. : Modeling of Random Telegraph Noise under circuit operation — Simulation and measurement of RTN-induced delay fluctuation. 12th Int. Symp. on Quality Electronic Design (ISQED), 2011, pp.1 – 6. DOI 10.1109/ISQED.2011.5770698

  49. Kyoungchoul Koo, Myunghoi Kim, Sangrok Lee, Joungho Kim : Measurement and analysis of vertical noise coupling on low noise amplifier from on-chip switching-mode DC-DC converter in 3D-IC. IEEE Int. Symp. on Electromagnetic Compatibility (EMC), 2011, pp. 22 – 27. DOI 10.1109/ISEMC.2011.6038278

  50. Vojtech J., Premysl H.: Measurement of noise parameters of CW radar sensors. 78th Microwave Measurement Conf (ARFTG), 2011, pp. 1 – 4. DOI 10.1109/ARFTG78.2011.6183874

  51. Sevimli O., Parker A.E., Fattorini A.P., Harvey J.T.: Accurately measured two-port low frequency noise and correlation of GaAs based HBTs. 21st Int. Conf on Noise and Fluctuations (ICNF), 2011, pp. 275 – 278. DOI 10.1109/ICNF.2011.5994320

  52. de la Jarrige E.L., Escotte L., Gonneau E., Goutoule J.M.: SiGe HBT-based active cold load: Design, characterization and stability measurements. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp. 332 – 335. DOI 10.1109/ICNF.2011.5994335

  53. Tartarin J.G.: Diagnostic tools for accurate reliability investigations of GaN devices. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp. 452 – 457. DOI 10.1109/ICNF.2011.5994367

  54. Sevimli O., Parker A.E., Fattorini A.P., Harvey J.T.: Accurately measured two-port low frequency noise and correlation of GaAs based HBTs. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp. 275 – 278. DOI 10.1109/ICNF.2011.5994320

  55. Gabelli J., Reulet B.: Measurements of the third cumulant in quantum shot noise at high frequency. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp. 329 – 331. DOI 10.1109/ICNF.2011.5994334

  56. Khan M.I., Raahemifar K.: Measurement of optical impairments in OFDM based radio-over-fiber communication systems. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp. 409 – 412. DOI 10.1109/ICNF.2011.5994356

  57. Scandurra G., Ciofi C.: Impedance meter based on cross-correlation noise measurements. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp. 381 – 384. DOI 10.1109/ICNF.2011.5994349

  58. Nakamura S., Yamauchi Y., Hashisaka M., Chida K., Kobayashi K., Ono T., Leturcq R., Ensslin K., Saito K., Utsumi Y., Gossard A.C.: Experimental test of Fluctuation Theorem in a quantum coherent conductor. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp. 270 – 274. DOI 10.1109/ICNF.2011.5994319

  59. Clerk A. A., Devoret M.H., Girvin S.M., Marquardt F., Schoelkopf R.J.: Introduction to quantum noise, measurement, and amplification. Reviews of Modern Physics, Vol. 82, no. 2, 2010, pp. 1155 – 1208. DOI 10.1103/RevModPhys.82.1155

  60. Woon Song, Jung Hwan Park, Rehman, M., Yonuk Chong: Primary thermometry by the measurement of shot noise in a tunnel junction. 21st Int. Conf. on Noise and Fluctuations (ICNF), 2011, pp 88 – 89. DOI 10.1109/ICNF.2011.5994392

  61. Chengqing Wei, Yong-Zhong Xiong, Xing Zhou: Test Structure for Characterization of Low-Frequency Noise in CMOS Technologies. IEEE Trans on Instr. & Meas., Vol. 59, no 7, 2010, pp. 1860 – 1865. DOI 10.1109/TIM.2009.2028783

  62. L. Belostotski, J.W. Haslett: Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers. IEEE Trans on MTT, Vol. 58, no. 1, 2010, pp. 236 – 250. DOI 10.1109/TMTT.2009.2036411

  63. Waldhoff N., Tagro Y., Gloria D., Gianesello F., Danneville F., Dambrine G.: Validation of the 2 Temperatures Noise Model Using Pre-Matched Transistors in W-Band for Sub-65 nm Technology. Microwave and Wireless Components Letters, Vol. 20, no. 5, 2010, pp. 274 – 276. DOI 10.1109/LMWC.2010.2045588

  64. Leynia de la Jarrige E., Escotte L., Goutoule J.M., Gonneau E., Rayssac J.: SiGe HBT-Based Active Cold Load for Radiometer Calibration. Microwave and Wireless Components Letters, Vol. 20, no. 4, 2010, pp. 238 – 240. DOI 10.1109/LMWC.2010.2042564

  65. Gheidi H., Banai A.: Phase-Noise Measurement of Microwave Oscillators Using Phase-Shifterless Delay-Line Discriminator. IEEE Trans on MTT, Vol. 58, no. 2, 2010, pp. 468 – 477. DOI 10.1109/TMTT.2009.2038452

  66. Tiemeijer L.F., Pijper R.M.T., van der Heijden E.: Complete On-Wafer Noise-Figure Characterization of 60-GHz Differential Amplifiers. IEEE Trans on MTT, Vol. 58, no. 6, 2010, pp. 1599 – 1608. DOI 10.1109/TMTT.2010.2049167

  67. Cano J.L., Wadefalk N., Gallego-Puyol J.D.: Ultra-Wideband Chip Attenuator for Precise Noise Measurements at Cryogenic Temperatures. IEEE Trans on MTT, Vol. 58, no. 9, 2010, pp. 2504 – 2510. DOI 10.1109/TMTT.2010.2058276

  68. Masayuki Hashisaka, Yoshiaki Yamauchi, Kensaku Chida, Shuji Nakamura, Kensuke Kobayashi, Teruo Ono: Noise measurement system at electron temperature down to 20 mK with combinations of the low pass filters. Review of Scientific Instruments, Vol. 80, no. 9, 2009, pp. 096105. http://dx.doi.org/10.1063/1.3227029

  69. Dazhen Gu, Walker D.K., Randa J.: Variable Termination Unit for Noise-Parameter Measurement. IEEE Trans on Instr. & Meas., Vol. 58, no. 4, 2009, pp. 1072 – 1077. DOI 10.1109/TIM.2008.2007055

  70. Randa J.: Uncertainty Analysis for Noise-Parameter Measurements at NIST. IEEE Trans on Instr. & Meas., Vol. 58, no. 4, 2009, pp. 1146 – 1151. DOI 10.1109/TIM.2008.2007044

  71. Lataire J., Pintelon R.: Estimating a Nonparametric Colored-Noise Model for Linear Slowly Time-Varying Systems. IEEE Trans on Instr. & Meas., Vol. 58, no 5, 2009, pp. 1535 – 1545. DOI 10.1109/TIM.2009.2014509

  72. Fleddermann R., Trobs M., Steier F., Heinzel G., Danzmann K.: Intrinsic Noise and Temperature Coefficients of Selected Voltage References. IEEE Trans on Instr. & Meas., Vol. 58, no. 6, 2009, pp. 2002 – 2007. DOI 10.1109/TIM.2008.2006133

  73. Santrac B.M., Sokola M.A., Mitrovic Z., Zupunski I., Vujicic V.: A Novel Method for Stochastic Measurement of Harmonics at Low Signal-to-Noise Ratio. IEEE Trans on Instr. & Meas., Vol. 58, no. 10, 2009, pp. 3434 – 3441. DOI 10.1109/TIM.2009.2017661

  74. Benz S.P., Jifeng Qu, Rogalla H., White D.R., Dresselhaus P.D., Tew W.L., Sae Woo Nam: Improvements in the NIST Johnson Noise Thermometry System. IEEE Trans on Instr. & Meas., Vol. 58, no. 4, 2009, pp. 884 – 890. DOI 10.1109/TIM.2008.2007027

  75. Cannata G., Scandurra G., Ciofi C.: An ultralow noise preamplifier for low frequency noise measurements. Rev. of Scientific Instruments, Vol. 80, no. 11, 2009, pp. 114702 – 114702-8. DOI 10.1063/1.3258197

  76. Mandal S., Arfin S.K., Sarpeshkar R.: Sub-μHz MOSFET 1/f noise measurements. Electronics Lett., Vol. 45, no. 1, 2009, pp. 81 – 82. DOI 10.1049/el:20092638

  77. Garelli M., Ferrero A., Bonino S.: A Complete Noise- and Scattering-Parameters Test-Set. IEEE Trans on MTT, Vol. 57, no. 3, 2009, pp. 716 – 724. DOI 10.1109/TMTT.2009.2013315

  78. Weinreb S.: Fundamentals of Noisy Networks. Low Noise Figure Measurements at Cryogenic and Room Temperatures, Workshop, Gothenburg, Sweden, 2009. http://radiometer.caltech.edu/papers.html

  79. Tagro Y., Gloria D., Boret S., Morandini Y., Dambrine G.: In-situ silicon integrated tuner for automated on-wafer MMW noise parameters extraction using multi-impedance method for transistor characterization. Proc. of 22nd IEEE Int. Conf. on Microelec. Test Structures (ICMTS), 2009, pp. 184 – 188. ISBN 978-1-4244-4259-1. DOI 10.1109/ICMTS.2009.4814637

  80. Merchant C. A., Markovic N.: Current and shot noise measurements in a carbon nanotube-based spin diode. J. of Applied Physics, Vol. 105, no. 7, 2009, pp. 07C711 – 07C711-4. DOI 10.1063/1.3072020

  81. Chien-Mo Li J.C.-M., Po-Chou Lin, Chih-Ming Chiang, Chuo-Jan Pan, Chao-Wen Tseng: Effective and Economic Phase Noise Testing for Single-Chip TV Tuners. IEEE Trans on Instr. & Meas., Vol. 57, no. 10, 2008, pp. 2265 – 2272. DOI 10.1109/TIM.2008.922085

  82. Giannini F., Bourdel E., Pasquet D.: A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements. IEEE Trans on Instr. & Meas., Vol. 57, no. 2, 2008, pp 261 – 267. DOI 10.1109/TIM.2007.909491

  83. Tagro Y., Gloria D., Boret S., Morandini Y., Dambrine G.: In-situ silicon integrated tuner for automated on-wafer MMW noise parameters extraction of Si HBT and MOSFET in the range 60–110GHz. 72nd ARFTG Microwave Measurement Symp., 2008, pp. 119 – 122. DOI 10.1109/ARFTG.2008.4804284

  84. Konczakowska A., Cichosz J., Szewczyk A.: A New Method for RTS Noise of Semiconductor Devices Identification. IEEE Trans on Instr. & Meas., Vol. 57, no. 6, 2008, pp. 1199 – 1206. DOI 10.1109/TIM.2007.915098

  85. Belostotski L., Haslett J.W.: A Technique for Differential Noise Figure Measurement of Differential LNAs. IEEE Trans on Instr. & Meas., Vol. 57, no. 7, 2008, pp. 1298 – 1303. DOI 10.1109/TIM.2008.917673

  86. Angrisani L., Schiano Lo Moriello R., D'Arco M., Greenhall C.A.: A Digital Signal Processing Instrument for Real-Time Phase Noise Measurement. IEEE Trans on Instr. & Meas., Vol. 57, no. 10, 2008, pp. 2098 – 2107. DOI 10.1109/TIM.2008.922102

  87. Ho-Jin Song, Shimizu N., Kukutsu N., Nagatsuma T., Kado Y.: Microwave photonic noise source from microwave to sub-terahertz wave bands and its applications to noise characterization. IEEE Trans on MTT, Vol. 56, no. 12, 2008, pp. 2989 – 2997. DOI 10.1109/TMTT.2008.2007325

  88. Jankovic M., Breitbarth J., Brannon A., Popovic Z.: Measuring Transistor Large-Signal Noise Figure for Low-Power and Low Phase-Noise Oscillator Design. IEEE Trans on MTT, Vol. 56, no. 7, 2008, pp. 1511 – 1515. DOI 10.1109/TMTT.2008.924350

  89. Pasquet D., Bourdel E., Quintanel S., Ravalet T., Houssin P.: New method for noise-parameter measurement of a mismatched linear two-port using noise power wave formalism. IEEE Trans on MTT, Vol. 56, no. 9, 2008, pp. 2136 – 2142. DOI 10.1109/TMTT.2008.2002235

  90. Will K., Omar A.: Phase Measurement of RF Devices Using Phase-Shifting Interferometry. IEEE Trans on MTT, Vol. 56, no. 11, part 2, 2008, pp. 2642 – 2647. DOI 10.1109/TMTT.2008.2005892

  91. Chih-Hung Chen, Ying-Lien Wang, Bakr M.H., Zheng Zeng: Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements. IEEE Trans on Instr. & Meas., Vol. 57, no. 11, 2008, pp. 2462 – 2471. DOI 10.1109/TIM.2008.925021

  92. Yan Cui, Guofu Niu, Rezvani A., Taylor S.S.: Measurement and Modeling of Drain Current Thermal Noise to Shot Noise Ratio in 90nm CMOS. IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, (SiRF 2008), 2008, pp. 118 – 121. DOI 10.1109/SMIC.2008.36

  93. Gaier T., Samoska L., Fung A., Deal W.R., Radisic V., Mei X.B., Yoshida W., Liu P.H., Uyeda J., Barsky M., Lai R.: Measurement of a 270 GHz Low Noise Amplifier With 7.5 dB Noise Figure. IEEE Microwave and Wireless Components Letters, Vol. 17, no. 7, 2007, pp. 546 – 548. DOI 10.1109/LMWC.2007.899324

  94. Chambon C., Escotte L., Gribaldo S., Llopis O.: C-Band Noise-Parameter Measurement of Microwave Amplifiers Under Nonlinear Conditions. IEEE Trans on MTT, Vol. 55, no. 4, 2007, pp. 795 – 800. DOI 10.1109/TMTT.2007.893676

  95. Williams D.F., Clement T.S., Remley K.A., Hale P.D., Verbeyst F.: Systematic Error of the Nose-to-Nose Sampling-Oscilloscope Calibration. IEEE Trans on MTT, Vol. 55, no. 9, 2007, pp. 1951 – 1957. DOI 10.1109/TMTT.2007.904333

  96. Tae-Weon Kang, Jeong-Hwan Kim, Yurchuk E.F., Jeong-Il Park, Sargsyan M.V., Arsaev I.E., Ouzdin R.I.: Design, Construction, and Performance Evaluation of a Cryogenic 7-mm Coaxial Noise Standard. IEEE Trans on Instr. & Meas., Vol. 56, no. 2, 2007, pp. 439 – 443. DOI 10.1109/TIM.2007.891132

  97. Labenski J.R., Tew W.L., Nam S.W., Benz S.P., Dresselhaus P.D., Burroughs C.J.: Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz. IEEE Trans on Instr. & Meas., Vol. 56, no. 2, 2007, pp. 481 – 485. DOI 10.1109/TIM.2007.891070

  98. Florian C., Traverso P. A.: A Highly Flexible Measurement Set-Up for the LF Noise Up-Conversion and Phase-Noise Performance Characterization of Microwave Electron Devices. IEEE Instrumentation and Measurement Technology Conf. Proc., 2007, pp.1 – 6. DOI 10.1109/IMTC.2007.379012

  99. Randa J., Walker D.K.: On-Wafer Measurement of Transistor Noise Parameters at NIST. IEEE Trans on Instr. & Meas., Vol. 56, no. 2, 2007, pp. 551 – 554. DOI 10.1109/TIM.2007.891145 

  100. Aslam S., Jones H., Lakew B.: Low-frequency noise measurements of high-Tc superconducting films: effect of DC capacitor in experimental setup. Electronics Lett., Vol. 43, no. 23, 2007, pp. 1320 – 1321. DOI 10.1049/el:20072102

  101. Moschitta A., Carbone P.: Noise Parameter Estimation From Quantized Data. IEEE Trans on Instr. & Meas., Vol. 56, no. 3, 2007, pp. 736 – 742. DOI 10.1109/TIM.2007.895575

  102. Deen M.J., Chen C.-H., Asgaran S., Rezvani G.A., Tao J., Kiyota Y.: High-Frequency Noise of Modern MOSFETs: Compact Modeling and Measurement Issues. IEEE Trans on ED, vol. 53, no. 9, 2006, pp. 2062 – 2081. DOI 10.1109/TED.2006.880370

  103. Djukic D., van Ruitenbeek J. M.: Shot Noise Measurements on a Single Molecule. Nano Lett., Vol. 6, no. 4, 2006, pp. 789 – 793. DOI 10.1021/nl060116e http://www.physics.leidenuniv.nl/sections/cm/amc/publications/shotnoise%20PtD2-revised.pdf

  104. Banerjee G., Soumyanath K., Allstot D.J.: Measurement and modeling errors in noise parameters of scaled-CMOS devices. IEEE IEEE Trans on MTT, Vol. 54, no. 6, 2006, pp. 2336 – 2345. DOI 10.1109/TMTT.2006.875269

  105. Nick M., Banai A., Farzaneh F.: Phase-noise measurement using two inter-injection-locked microwave oscillators. IEEE Trans on MTT, Vol. 54, no. 7, 2006, pp. 2993 – 3000. DOI 10.1109/TMTT.2006.877423

  106. Blockley P.S., Scott J.B., Gunyan D., Parker A.E.: Noise considerations when determining phase of large-signal microwave measurements. IEEE Trans on MTT, Vol. 54, no. 8, 2006, pp. 3182 – 3190. DOI 10.1109/TMTT.2006.879136

  107. Kaija, T., Heino P.: The optimization of on-wafer shield-based test fixture layout. IEEE IEEE Trans on MTT, Vol. 54, no. 5, 2006, pp. 1975 – 1982. DOI 10.1109/TMTT.2006.872806

  108. Schiano L., Momenzadeh M., Fengming Zhang, Young Jun Lee, Kane T., Max S., Perkins P., Yong-Bin Kim, Lombardi F., Meyer F.J.: Measuring the timing jitter of ATE in the frequency domain. IEEE Trans on Instr. & Meas., Vol. 55, no. 1, 2006, pp. 280 – 289. DOI 10.1109/TIM.2005.861531

  109. Randa J., Gerecht E., Dazhen Gu, Billinger R.L.: Precision measurement method for cryogenic amplifier noise temperatures below 5 K. IEEE IEEE Trans on MTT, Vol. 54, no. 3, 2006, pp. 1180 – 1189. DOI 10.1109/TMTT.2005.864107

  110. Boudot R., Gruson Y., Bazin N., Rubiola E., Giordano V.: Design and measurement of low phase-noise X-band oscillator. Electronics Lett., Vol. 42, no. 16, 2006, pp. 929 – 931. DOI 10.1049/el:20061396

  111. Kawai N., Kawahito S.: Measurement of low-noise column readout circuits for CMOS image sensors. IEEE Trans on ED, Vol. 53, no. 7, 2006, pp. 1737 – 1739. DOI 10.1109/TED.2006.875813

  112. Van Deursen A.P.J., Smulders H.W.M., de Graaff R.A.A.: Differentiating/integrating measurement setup applied to railway environment. IEEE Trans on Instr. & Meas., Vol. 55, no. 1, 2006, pp. 316 – 326. DOI 10.1109/TIM.2005.858552

  113. Crupi F., Giusi G., Ciofi C., Pace C.: Enhanced sensitivity cross-correlation method for voltage noise measurements. IEEE Trans on Instr. & Meas., Vol. 55, no. 4, 2006, pp. 1143 – 1147. DOI 10.1109/TIM.2006.876392

  114. Giusi G., Crupi F., Pace C., Ciofi C., Groeseneken G.: Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics. IEEE Trans on ED, Vol. 53, no. 4, 2006, pp. 823 – 828. DOI 10.1109/TED.2006.870287

  115. Hu R.: Analysis of the Input Noise Contribution in the Noise Temperature Measurements. IEEE Microwave & Wireless Comp. Let., Vol 15, no. 3, 2005, pp. 141 – 143. DOI 10.1109/LMWC.2004.842832

  116. Gao J., Li X., Jia L., Wang H., Boeck G.: Direct Extraction of InP HBT Noise Parameters Based on Noise Figure Measurement System. IEEE Trans on MTT, Vol. 53, no. 1, 2005, pp. 330 – 334. DOI 10.1109/TMTT.2004.839919

  117. Witt T., Tang Y.-H.: Investigation of Noise in Measurements of Electronic Voltage Standards. IEEE Trans on Instr & Meas, Vol 54, no. 2, 2005 pp. 567 – 570. DOI 10.1109/TIM.2004.843096

  118. Lo C., Furse C.: Noise-Domain Reflectometry for Locating Wiring Faults. IEEE Trans on EC, Vol. 47, no. 1, 2005, pp. 97 – 104. DOI 10.1109/TEMC.2004.842109

  119. Kim Fung Tsang, Chung Ming Yuen: Phase noise measurement of free-running microwave oscillators at 5.8 GHz using 1/3-subharmonic injection locking. IEEE Microwave & Wireless Comp. Let., Vol. 14, no. 6, 2005, pp. 217 – 219. DOI 10.1109/LMWC.2005.845695

  120. Nam S. W., Benz S., Dresselhaus P., Burroughs C., Tew W., White R., Martinis J.M.: Progress on Johnson Noise Thermometry Using a Quantum Voltage Noise Source for Calibration. IEEE Trans on Instr& Meas, Vol. 54, no. 2, 2005, pp. 653 – 657. DOI 10.1109/TIM.2005.843574

  121. Alegria F.A.C., Serra A.M.: Uncertainty of ADC Random Noise Estimates Obtained with the IEEE 1057 Standard Test. IEEE Trans on Instr & Meas, Vol. 54, no. 1, 2005, pp. 110 – 116. DOI 10.1109/TIM.2004.840226

  122. Lee M.-H.J., Collier R.J.: Sheet resistance measurement of thin metallic films and stripes at both 130 GHz and DC. IEEE Trans on Instr. & Meas., Vol. 54, no. 6, 2005, pp. 2412 – 2415. DOI 10.1109/TIM.2005.858536

  123. Witt T.J., Yi-hua Tang: Investigations of noise in measurements of electronic voltage standards. IEEE Trans on Instr. & Meas., Vol. 54, no. 2, 2005, pp. 567 – 570. DOI 10.1109/TIM.2004.843096

  124. Ling Hao, Macfarlane J.C., Haining S., Gallop J.C.: HTS superconducting current comparator: dynamic range and noise limits. IEEE Trans on Instr. & Meas., Vol. 54, no. 2, 2005, pp. 584 – 587. DOI 10.1109/TIM.2005.843575

  125. Sae Woo Nam, Benz S.P., Dresselhaus P.D., Burroughs C.J. Jr., Tew W.L., White D.R., Martinis J.M.: Progress on Johnson noise thermometry using a quantum voltage noise source for calibration. IEEE Trans on Instr. & Meas., Vol. 54, no. 2, 2005, pp. 653 – 657. DOI 10.1109/TIM.2005.843574

  126. Weatherspoon M.H., Dunleavy L.P.: Vector corrected on-wafer measurements of noise temperature. IEEE Trans on Instr. & Meas., Vol. 54, no. 3, 2005, pp. 1327 – 1332. DOI 10.1109/TIM.2005.847218

  127. Wiatr W., Walker D.K.: Systematic errors of noise parameter determination caused by imperfect source impedance measurement. IEEE Trans on Instr. & Meas., Vol. 54, no. 2, 2005, pp. 696 – 700. DOI 10.1109/TIM.2005.843574

  128. Inaba H., Yanagimachi S., Feng-Lei Hong, Onae A., Koga Y., Matsumoto H.: Stability degradation factors evaluated by phase noise measurement in an optical-microwave frequency link using an optical frequency comb. IEEE Trans on Instr. & Meas., Vol. 54, no. 2, 2005, pp. 763 – 766. DOI 10.1109/TIM.2004.843113

  129. Perez J.-P., Myara M., Alabedra R., Orsal B., Leyris C., Tourrenc J.-P., Signoret P.: Low-frequency noise measurements as an investigation tool of pixel flickering in cooled Hg/sub 0.7/Cd/sub 0.3/Te focal plane arrays. IEEE Trans on ED, Vol. 52, no. 5, 2005, pp. 928 – 933. DOI 10.1109/TED.2005.846328

  130. Levinzon F.A.: Measurement of low-frequency noise of modern low-noise junction field effect transistors. IEEE Trans on Instr. & Meas., Vol. 54, no. 6, 2005, pp. 2427 – 2432. DOI 10.1109/TIM.2005.858534

  131. Otegi N., Collantes J.M., Sayed M.: Calibrated noise figure measurements in vector network analyser. Electronics Lett., Vol. 41, no. 18, 2005, pp 999 – 1000. DOI 10.1049/el:20051718

  132. Skartlien R., Oyehaug L.: Quantization error and resolution in ensemble averaged data with noise. IEEE Trans on Instr. & Meas., Vol. 54, no 3, 2005, pp. 1303 – 1312. DOI 10.1109/TIM.2005.847116

  133. Gasulla M., Xiujun Li, Meijer G.C.M.: The noise performance of a high-speed capacitive-sensor interface based on a relaxation oscillator and a fast counter. IEEE Trans on Instr. & Meas., Vol. 54, no. 5, 2005, pp. 1934 – 1940. DOI 10.1109/TIM.2005.853684

  134. Hu R.: Analysis of the input noise contribution in the noise temperature measurements. IEEE Microwave and Wireless Components Letters, Vol. 15, no. 3, 2005, pp. 141 – 143. DOI 10.1109/LMWC.2004.842832

  135. Ming-Hsiang Cho, Guo-Wei Huang, Yueh-Hua Wang, Lin-Kun Wu: A scalable noise de-embedding technique for on-wafer microwave device characterization. IEEE Microwave and Wireless Components Letters, Vol. 15, no. 10, 2005, pp. 649 – 651. DOI 10.1109/LMWC.2005.856685

  136. Laitinen T.A., Vainikainen P., Koskinen T., Kivekas O.: Amplitude-only and complex field measurements for characterizing radiated fields of mobile terminal antennas from a small number of samples. IEEE Trans on Instr. & Meas., Vol. 54, no. 5, 2005, pp. 1989 – 1996. DOI 10.1109/TIM.2005.853565

  137. Alegria F.A.C., da Cruz Serra A.M.: Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test. IEEE Trans on Instr. & Meas., Vol. 54, no. 1, 2005, pp. 110 – 116. DOI 10.1109/TIM.2004.840226

  138. Hoekstra E.: Large Signal Excitation Measurement Techniques for RTS Noise in MOSFETs. The Int. Conf. on Computer as a Tool (EUROCON 2005), Vol. 2, 2005, pp. 1863 – 1866. DOI 10.1109/EURCON.2005.1630344

  139. Koledintseva M., Kitaitsev A., Konkin V., Radchenko V.: Spectrum visualization and measurement of power parameters of microwave wide-band noise. IEEE Trans on Instr. & Meas., Vol. 53, no. 4, 2004, pp. 1119 – 1124. DOI 10.1109/TIM.2004.831178

  140. Vokurka K.: Measurement and interpretation of instantaneous autospectrum of cyclostationary noise. Inter-noise, 2004, pp 1 – 6. http://www.kfy.tul.cz/katedra/vokurka/clanky/762.pdf

  141. Flores Md.G.C., Negreiros M., Carro L., Susin A.A.: INL and DNL estimation based on noise for ADC test. IEEE Trans on Instr. & Meas., Vol. 53, no. 5, 2004, pp. 1391 – 1395. DOI 10.1109/TIM.2004.834096

  142. Lopez-Martin A. J.: Teaching Random Signals and Noise: An Experimental Approach. IEEE Trans on Educ., Vol 47, no. 2, 2004, pp. 174 – 179. DOI 10.1109/TE.2004.824838

  143. R. Hu, S. Weinreb: A novel wide-band noise-parameter measurement method and its cryogenic application. IEEE Trans on MTT, Vol. 52, no. 5, 2004, pp. 1498 – 1507. DOI 10.1109/TMTT.2004.827029

  144. Long S., Escotte L., Graffeuil J., Brasseau F., Cazaux J.L.: On-wafer noise characterization of low-noise amplifiers in the Ka-band. IEEE Trans on Instr. & Meas., Vol. 52, no. 5, 2003, pp. 1606 – 1610. DOI 10.1109/TIM.2003.817156

  145. Engelberg S., Bendelac Y.: Measurement of physical constants using noise. IEEE Instrumentation & Measurement Magazine, Vol. 6, no. 4, 2003, pp. 49 – 52. DOI 10.1109/MIM.2003.1251483

  146. Ciofi C., Crupi F., Pace C., Scandurra G.: Micro-prober for wafer-level low-noise measurements in MOS devices. IEEE Trans on Instr. & Meas., Vol. 52, no. 5, 2003, pp. 1533 – 1536. DOI 10.1109/TIM.2003.817913

  147. Abadal G., Perez-Murano F., Barniol N., Aymerich X.: The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips. IEEE Trans on Instr. & Meas., Vol. 52, no. 3, 2003, pp. 859 – 864. DOI 10.1109/TIM.2003.814683

  148. Bergman D.I., Waltrip B.C.: A low-noise latching comparator probe for waveform sampling applications. IEEE Trans on Instr. & Meas., Vol. 52, no. 4, 2003, pp. 1107 – 1113. DOI 10.1109/TIM.2003.815982

  149. Stutzke N.A., Burkett S. L., Russek S.E.: High-frequency noise measurements in spin-valve devices. J. of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 21, no. 4, 2003, pp. 1167 – 1171. DOI 10.1116/1.1582458

  150. Pace C., Ciofi C., Crupi F.: Very low-noise, high-accuracy programmable voltage reference. IEEE Trans on Instr. & Meas., Vol. 52, no. 4, 2003, pp. 1251 – 1254. DOI 10.1109/TIM.2003.816823

  151. Tian Xia, Jien-Chung Lo: Time-to-voltage converter for on-chip jitter measurement. IEEE Trans on Instr. & Meas., Vol. 52, no. 6, 2003, pp. 1738 – 1748. DOI 10.1109/TIM.2003.818731

  152. Lee Y.J., Kane T., Lim J.-J., Schiano L., Kim Y.-B., Meyer F.J., Lombardi F., Max S.: Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE Trans on Instr. & Meas., Vol. 52, no. 6, 2003, pp. 1749 – 1755. DOI 10.1109/TIM.2003.818727

  153. N. A. Stutzke, S. L. Burkett, S. E. Russek: High-frequency noise measurements in spin-valve devices. J. Vac. Sci. Technol. A 21.4., 2003, pp. 1167 – 1171. DOI 10.1116/1.1582458

  154. Kolding T.E., Iversen C.R.: Simple Noise Deembedding Techniques for On-Wafer Shield-Based Test Fixtures. IEEE Trans on MTT, Vol 51, no 1, 2003, pp. 11 – 15. DOI 10.1109/TMTT.2002.806938

  155. Kantanen M., Lahdes M.,Vähä-Heikkilä T., Tuovinen J.: A Wide-Band On-Wafer Noise Parameter Measurement System at 50-75 GHz. IEEE Trans on MTT, Vol 51, no. 5, 2003, pp. 1489 – 1495. DOI 10.1109/TMTT.2003.810129

  156. Parvis M., Perrone G., Vallan A.: A precompliance EMC test-set based on a sampling oscilloscope. IEEE Trans on Instr. & Meas., Vol. 52, no. 4, 2003, pp. 1220 – 1223. DOI 10.1109/TIM.2003.816839

  157. Rubiola E., Salik E., Nan Yu, Maleki L.: Phase noise measurements of low power signals. Electronics Lett., Vol. 39, no. 19, 2003, pp. 1389 – 1390. DOI 10.1049/el:20030878

  158. Gao J, Law L., Wang H., Aditya S., Boeck G.: A New Method for pHEMT Noise-Parameter Determination Based on 50-W  Noise Measurement System. IEEE Trans on MTT, Vol 51, no. 10, 2003, pp. 2079 – 2089. DOI 10.1109/TMTT.2003.817680

  159. Chung-Bin Wu, Bin-Da Liu, Jar-Ferr Yang: A fuzzy-based impulse noise detection and cancellation for real-time processing in video receivers. IEEE Trans on Instr. & Meas., Vol. 52, no. 3, 2003, pp. 780 – 784. DOI 10.1109/TIM.2003.814677

  160. Ciofi C., Crupi F., Pace C.: A new method for high-sensitivity noise measurements. IEEE Trans on Instr. & Meas., Vol. 51, no. 4, 2002, pp. 656 – 659. DOI 10.1109/TIM.2002.803080

  161. De Dominicis M., Giannini F., Limiti E., Saggio G.: A novel impedance pattern for fast noise measurements. IEEE Trans on Instr. & Meas., Vol. 51, no. 3, 2002, pp. 560 – 564. DOI 10.1109/TIM.2002.1017728

  162. Collantes J.-M., Pollard R.D., Sayed M.: Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques. IEEE Trans on Instr. & Meas., Vol. 51, no. 6, 2002, pp. 1150 – 1156. DOI 10.1109/TIM.2002.808015

  163. Flammini A., Marioli D., Sardini E., Taroni A.: Robust estimation of magnetic Barkhausen noise based on a numerical approach. IEEE Trans on Instr. & Meas., Vol. 51, no. 6, 2002, pp. 1283 – 1288. DOI 10.1109/TIM.2002.807988

  164. Yilmaz T., DePriest C.M., Delfyett P.J. Jr.: Complete noise characterisation of external cavity semiconductor laser hybridly modelocked at 10 GHz. Electronics Lett., Vol. 37, no. 22, 2001, pp. 1338 – 1339. DOI 10.1049/el:20010919

  165. Belahrach H., Degerli Y., Lavernhe F., Karim M., Magnan P., Farre J.: Low-Frequency Noise Measurements on Submicrometre n-channel and p-channel MOSFETs at various Operating Regions. Int. J. Electronics, Vol 88, no. 4, 2001, pp. 411 – 421. http://degerli.free.fr/ije.pdf

  166. Geens A., Rolain Y.: Noise Figure Measurements on Nonlinear Devices. IEEE Trans on Instr. & Meas., Vol. 50, no. 4, 2001, pp. 971 – 975. DOI 10.1109/19.948309

  167. Coakley K.J., Hale P.: Alignment of noisy signals. IEEE Trans on Instr. & Meas., Vol. 50, no 1, 2001, pp 141 – 149. DOI 10.1109/19.903892

  168. Lowe A., Eren H., Tian Y.J., Kinsella B., Bailey S.: Continuous Corrosion Rate Measurement by Noise Resistance Calculation. IEEE Trans on Instr. & Meas., Vol. 90, no. 5, 2001, pp. 1059 – 1065. DOI 10.1109/19.963158

  169. Giakos G.C., Chowdhury S., Shah N., Vedantham S., Passerini A.G., Suryanarayanan S., Nemer R., Mehta K., Patnekar N., Sumrain S., Nataraj K., Scheiber C.: Signal-to-Noise Measurements Utilizing a Novel Dual Energy Multimedia Detector. IEEE Trans. on Instr. & Meas., Vol. 50, no. 4, 2001, pp. 910 – 913. DOI 10.1109/19.948298

  170. Randa J., Dunleawy L.P., Terrell L.A.: Stability Measurements on Noise Sources. IEEE Trans on Instr.& Meas., Vol. 50, no. 2, 2001, pp. 368 – 372. DOI 10.1109/19.918144

  171. Rolfes I., Musch T., Schiek B.: A highly linear digital detector for noise parameter measurements at microwave frequencies. Microwave Eng., Nov 2001, pp 61 – 65. http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=04140008

  172. Angrisani L., D'Apuzzo M., D'Arco M.: A digital signal-processing approach for phase noise measurement. IEEE Trans on Instr. & Meas., Vol. 50, no. 4, 2001, pp. 930 – 935. DOI 10.1109/19.948302

  173. Geens A., Rolain Y.: Noise figure measurements on nonlinear devices. IEEE Trans on Instr. & Meas., Vol. 50, no. 4, 2001, pp. 971 – 975. DOI 10.1109/19.948309

  174. Randa J., Dunleavy L.P., Terrell L.A.: Stability measurements on noise sources. IEEE Trans on Instr. & Meas., Vol. 50, no. 2, 2001, pp. 368 – 372. DOI 10.1109/19.918144

  175. Rolfes I., Musch T., Schiek B.: Cryogenic noise parameter measurements of microwave devices. IEEE Trans on Instr. & Meas., Vol. 50, no. 2, 2001, pp. 373 – 376. DOI 10.1109/19.918145

  176. Vujicic V.: Generalized low-frequency stochastic true RMS instrument. IEEE Trans on Instr. & Meas., Vol. 50, no. 5, 2001, pp. 1089 – 1092. DOI 10.1109/19.963164

  177. Rolfes I., Musch T., Schek B.: Cryogenic Noise Parameter Measurements of Microwave Devices. IEEE Trans. on Instr & Meas, Vol. 50, no. 2, 2001, pp. 373 – 376. DOI 10.1109/19.918145

  178. Carrica D., Benedetti M., Petrocelli R.: Random sampling applied to the measurement of a DC signal immersed in noise. IEEE Trans on Instr. & Meas., Vol. 50, no. 5, 2001, pp. 1319 – 1323. DOI 10.1109/19.963204

  179. Uchino M., Tagiri O., Shinozuka T.: Real-time measurement of noise statistics. IEEE Trans on EMC, Vol. 43, no. 4, 2001, pp. 629 – 636. DOI 10.1109/15.974644

  180. Su C.Y., Chen L.P., Chang S.J., Huang G.W., Ho Y.P., Tseng B.M., Lin D.C., Lee H.Y., Kuan J.F., Deng Y.M., Chen C.L., Leu L.Y., Wen K.A., Chang C.Y.: Effect of coplanar probe pad design on noise figures of 0.35 μm MOSFETs. Electronics Lett., Vol. 36, no. 15, 2000, pp. 1280 – 1281. DOI 10.1049/el:20000904

  181. J. E. Sanchez, G. Bosman: Measurements of 1/f noise amplitude modulated by a large signal carrier in bipolar junction transistors. Microelectronics Reliability, Vol. 40, 2000, pp. 1839 – 1845. doi:10.1016/S0026-2714(00)00082-2

  182. Brugidou V., Rolland P.A.: Measurement of residual phase noise of frequency divider using a single divider technique. Electron. Lett., Vol. 36, no. 16, 2000, pp. 1391 – 1393. DOI 10.1049/el:20000983

  183. Bruce S., Vandamme L.K.J., Rydberg A.: Improved Correlation Measurements Using Voltage and Transimpedance Amplifiers in Low-Frequency Noise Characterization of Bipolar Transistors. IEEE Trans on ED, Vol. 47, no. 9, 2000, pp. 1772 – 1773. DOI 10.1109/16.861592

  184. Xu J., Dai Y., Abbout D.: A Complete Operational Amplifier Noise Model: Analysis and Measurement of Correlation Coefficient. IEEE Trans on CAS I, Vol. 47, no. 3, 2000, pp. 420 – 424. DOI 10.1109/81.841928

  185. Chen C-Y., Kuan C-H.: Design and Calibration of a Noise Measurement System. IEEE Trans on Instr. & Meas.,Vol. 49, no. 1, 2000, pp. 77 – 82. DOI 10.1109/19.836313

  186. Sampietro M., Accomando G., Fasoli L., Ferrari G., Gatti E.C.: High Sensitivity Noise Measurement with a Correlation Spectrum Analyzer. IEEE Trans on Instr. & Meas, Vol. 49, no. 4, 2000, pp. 820 – 822. DOI 10.1109/19.863931

  187. Corbella I., Camps A., Torres F., Bara J.: Analysis of Noise-Injection Networks for Interferometric Radiometer Calibration. IEEE Trans. on MTT, Vol.48, no.4, 2000, pp. 545 – 552. DOI 10.1109/22.842026

  188. Murti M.R., Laskar J., Nuttinck S., Yoo S., Raghavan A., Bergman J.I., Bautista J., Lai R., Grundbacher R., Barsky M., Chin P., Liu P.H.: Temperature-Dependent Small-Signal and Noise Parameter Measurements and Modeling on InP HEMTs. IEEE Trans. on MTT, Vol. 48, no. 12, 2000, pp. 2579 – 2586. DOI 10.1109/22.899016

  189. Brugidou V., Rolland P.A.: Measurement of residual phase noise of frequency divider using single divider technique. Electronics Lett., Vol. 36, no. 16, 2000, pp. 1391 – 1393. DOI 10.1049/el:20000983

  190. See K.Y., Yang L.: Measurement of noise source impedance of SMPS using two current probes. Electronics Lett., Vol. 36, no. 21, 2000, pp. 1774 – 1776. DOI 10.1049/el:20001284

  191. Rubiola E., Giordano V.: Dual carrier suppression interferometer for measurement of phase noise. Electronics Lett., Vol. 36, no. 25, 2000, pp. 2073 – 2075. DOI 10.1049/el:20001476

  192. Sampietro N., Accomando G., Fasoli L.G., Ferrari G., Gatti E.C.: High sensitivity noise measurement with a correlation spectrum analyzer. IEEE Trans on Instr. & Meas., Vol. 49, no 4, 2000, pp. 820 – 822. DOI 10.1109/19.863931

  193. Chun-Yu Chen, Chieh-Hsiun Kuan: Design and calibration of a noise measurement system. IEEE Trans on Instr. & Meas., Vol. 49, no 1, 2000, pp. 77 – 82. DOI 10.1109/19.836313

  194. Carbone P., Petri D.: Average power estimation under nonsinusoidal conditions. IEEE Trans on Instr. & Meas., Vol. 49, no. 2, 2000, pp. 333 – 336. DOI 10.1109/19.843073

  195. Van der Wel A.P., Klumperink E.A.M., Gierkink S.L.J., Wassenaar R.F., Wallinga H.: MOSFET 1/f noise measurement under switched bias conditions. IEEE ED Letters, Vol. 21, no.1, 2000, pp. 43 – 46. DOI 10.1109/55.817447

  196. Chiorbolli G., Fontanili M.: Cross-Correlation Noise Measurements in A/D Converters. IEEE Trans. on Instr & Meas., Vol. 48, no. 6, 1999, pp. 1282 1286. DOI 10.1109/19.816149

  197. Lazaro A., Pradell L., O'Callaghan J.M.: FET Noise Parameter Determination Using a Novel Technique Based on 50-W Noise Figure Measurements. IEEE Trans. on MTT, Vol. 47, no. 3, 1999, pp. 315 – 324. DOI 10.1109/22.750233

  198. Di Paola A., Sanniono M.: A Novel Test Figure and Gain Test Set for Microwave Devices. IEEE Trans. on Instr.& Meas., Vol. 48, no. 5, 1999, pp. 921 – 926. DOI 10.1109/19.799648

  199. Randa J., Billinger R.L., Rice J.L.: On-Wafer Measurements of Noise Temperature. IEEE Trans on Instr & Meas., Vol. 48, no. 6, 1999, pp. 1259 1268. DOI 10.1109/19.816146

  200. Escotte L., Tartarin J.G., Graffeuil J.: A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set. IEEE Trans on Instr. & Meas., Vol. 48, no. 4, 1999, pp. 830 – 834. DOI 10.1109/19.779184

  201. Kerr A.R.: Suggestions for revised definitions of noise quantities, including quantum effects. IEEE Trans on MTT, Vol. 47, no. 3, 1999, pp. 325 – 329. DOI 10.1109/22.750234

  202. Rubiola E., Giordano V., Groslambert J.: Improved interferometric method to measure near-carrier AM and PM noise. IEEE Trans. on Instr. & Meas., Vol. 48, no. 2, 1999, pp. 642 – 646. DOI 10.1109/19.769677

  203. Beland P., Labonte S., Roy L., Stubbs M.: A novel on-wafer resistive noise source. IEEE Microwave and Guided Wave Letters, Vol. 9, no. 6, 1999, pp. 227 – 229. DOI 10.1109/75.769529

  204. Caddemi A., Di Paola A., Sannino M.: Determination of HEMTs Noise Parameters Versus Temperature Using Two Measurement Methods. IEEE Trans. on Instr. & Meas., Vol. 47, no.1,  1998, pp. 6 – 10. DOI 10.1109/19.728779

  205. Lazaro A., Pradell L., O'Callaghan J.M.: Method for measuring noise parameters of microwave two-port. Electronics Letters, Vol. 34, no. 13, 1998, pp. 1332 – 1333. DOI 10.1049/el:19980942

  206. Wait D., Randa J.: Amplifier Noise Measurements at NIST. IEEE Trans. on Instr. & Meas., Vol. 46, no. 2, 1997, pp 482 – 485. DOI 10.1109/19.571891

  207. Karar A., Tanaka R., Vanel J. C.: APD's excess noise measurements using spectral analysis (FFT). Nuclear Instruments and Methods in Physics Research Section A, Vol. 387, no. 1-2, 1997, pp 205 – 210. DOI 10.1016/S0168-9002(96)00991-6

  208. Caddemi A., Di Paola A., Sannino M.: Full Characterization of Microwave Low-Noise Packaged HEMTs: Measurements versus Modeling. IEEE Trans. on Instr. & Meas., vol. 46, no. 2, 1997, pp. 490 – 494. DOI 10.1109/19.571893

  209. Yassine A., Chen C. T.-M.: Electromigration Noise Measurements Using a Novel AC/DC Wafer-Level Noise Measurement System. IEEE Trans. on ED, Vol. 44, no. 1, 1997, pp. 180 – 184. DOI 10.1109/16.554808

  210. Wiatr W., Schmidt-Szalowski M.: The Multistate Radiometer: A Novel Means for Impedance and Noise Temperature Measurement. IEEE Trans. on Instr. & Meas., Vol. 46, no. 2, 1997, pp. 486 – 489. DOI 10.1109/19.571892

  211. Wiatr W.: Multistate Radiometry: Noise De-embedding and Unterminating. IEEE Trans. on Instr. & Meas., Vol. 46, no. 2, 1997, pp. 503 – 506. DOI 10.1109/19.571896

  212. Boudiaf A., Scavennec A.: Accuracy and verification of on-wafer noise parameter measurements. 26th EuMC, 1996, Prague, Czech Rep., pp 182 – 185. DOI 10.1109/EUMA.1996.337548

  213. Caddemi A., Di Paola A., Sannino M.: Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves. 26th EuMC, 1996, Prague, Czech Rep., pp 186 – 190. DOI 10.1109/EUMA.1996.337549

  214. Trofimenkoff F.N., Finvers I.G., Haslett J.W.: DC Measurement Errors Due to Auto-Zeroed Amplifier Noise. IEEE Trans. on Instr. & Measurem., vol. 45 no. 1, Febr. 1996, pp 317 – 318. DOI 10.1109/19.481358

  215. D'Alvano F., Badra R.E.: A Simple Low Cost Laboratory Hardware for Noise Generation. IEEE Trans. on Educ., vol. 39, no. 2, May 1996, pp 280 – 281. DOI 10.1109/13.502077

  216. Kirtania A., Das M. B., Chandrasekar S., Lamardi L., Qua G. J. Hamm R. A, Yang L.-W.: Measurement and Comparison of 1/f Noise and g-r Noise in Silicon Homojunction and III-V Hetero- junction Bipolar Transistors. IEEE Trans. on ED, vol. 43, no. 5, May 1996, pp 784 – 792. DOI 10.1109/16.491256

  217. Quéré R., Lalande M., Boutin J., Valente C.: An Automatic Characterization of a Gaussian Noise Source for Undergraduate Electronics Laboratory. IEEE Trans. on Educ., vol. 38, no. 2, May 1995, pp 126 – 130. DOI 10.1109/13.387213

  218. Fuss I.G.: An interpretation of the spectral measurement of optical pulse train noise. IEEE Journal of Quantum Electronics, vol. 30, no. 11, 1994, pp. 2707 – 2710. DOI 10.1109/3.333730

  219. Martines G., Sannino M.: The Determination of the Noise, Gain and Scattering Parameters of Microwave Transistors (HEMT's) Using Only an Automatic Noise Figure Test-Set. IEEE Trans. on MTT, Vol. 42, no. 7, 1994, pp. 1105 – 1113. DOI 10.1109/22.299717

  220. Ke Q., Feldman M.J.: A Technique for Noise Measurements of SIS Receivers. IEEE Trans. on MTT, Vol. 42, no. 4, 1994, pp. 752 – 755. DOI 10.1109/22.285091

  221. Sannino M.: Proposal of Up-to-Date Standards on Methods of Measuring Noise Parameters of Microwave Transistors. 44th ARFTG Conf. Digest-Fall, Vol. 26, 1994, pp. 81 – 88. DOI 10.1109/ARFTG.1994.327084

  222. Martines G., Sannino M.: Proposal of up-to-date standards on methods of measuring noise in linear two-ports. 1994 Conf. on Precision Electromagnetic Measurements Digest, 1994, pp. 482 – 483. DOI 10.1109/CPEM.1994.333208

  223. Ikalainen P.K.: Extraction of Device Noise Sources from Measured Data Using Circuit Simulator Software. IEEE Trans. on MTT, Vol. 41, no. 2, 1993, pp. 340 – 343. DOI 10.1109/22.216478

  224. Pastori W. E., Simpson G.R.: ATS for Power and Noise Characterization Using PC-AT Based Software. Microwave Journal, 1993, pp. 82 – 92.

  225. Dambrine G., Danneville F., Happy H., Cappy A.: A New Method for On Wafer Noise Measurement. IEEE Trans on MTT, Vol. 41, no. 3, 1993, pp. 375 – 381. DOI 10.1109/22.223734

  226. P.J. Tasker, W. Reinert, B. Hughes, J. Braunstein, M. Schlechtweg: Transistor noise parameter extraction using a 50 Ώ  measurement system. IEEE MTT-S Int. Microwave Symp. Digest, Vol.3, 1993, pp. 1251 1254.    DOI 10.1109/MWSYM.1993.277100

  227. Tasker P. J., Schlectweg M., Reinert W., Braunstein J.: A Novel Approach for MODFET Noise Parameter Extraction and its Application in mm-wave MMICs. Proc. of MIOP'93, Sindelfingen, Germany, 1993, pp. 212 – 216.

  228. Wedge S. W., Rutledge D. B.: Wave Techniques for Noise Modeling and Measurement. IEEE Trans on MTT, Vol. 40, no. 11, 1992, pp. 2004 – 2012. DOI 10.1109/22.168757

  229. Escotte L., Plana R., Rayssac J., Llopis O., Graffeuil J.: Using Cold FET to Check Accuracy of Microwave Noise Parameter Test Set. Electronics Letters, Vol. 27, no. 10, 1991, pp. 833 – 834. DOI 10.1049/el:19910522

  230. Cascade Microtech: NPTS Noise Parameter Test System. Applic. Note NPTSDS 691, 1991.

  231. Cascade Microtech: Product Overwiev: High Frequency Measurement Tools and Solutions. Beaverton, Oregon, 1990.

  232. Gupta M.S., Greiling P. T.: Microwave Noise Characterization of GaAs MESFET's: Determination of Extrinsic Noise Parameters. IEEE Trans on MTT, Vol. 36, no. 4, 1988, pp. 745 – 754. DOI 10.1109/22.3580

  233. Cappy A.: Noise Modeling and Measurements Techniques [HEMTs]. IEEE Trans. on MTT, Vol. 36, no. 1, 1988, pp. 1 – 10. DOI 10.1109/22.3475

  234. D'Ascenzo C.: Noise Measurements Indirectly Gauge Frequency Stability. Microwaves & RF, June 1988, pp. 105 – 110.

  235. Tong P. R., Moorehead J.M.: Noise Measurements at mm-Wave Frequencies. Microwave Journal, July 1988, pp. 69 – 75.

  236. Gupta M.S., Pitzalis O., Rosenbaum S., Greiling P.: Microwave Noise Characterization of GaAs MESFET's: Evaluation by On-Wafer Low-Frequency Output Noise Current Measurement. IEEE Trans. on MTT, Vol. 35, no. 12, 1987, pp. 1208 – 1218. DOI 10.1109/TMTT.1987.1133839

  237. Abidi A. A.: High-frequency noise measurements on FET’s with small dimensions. IEEE Trans on ED, vol. ED-33, no 11, 1986, pp 1801 – 1805. DOI 10.1109/T-ED.1986.22743

  238. Ward H.R.: A Method for Measuring Pulsed Amplifier Noise Using a Spectrum Analyzer. IEEE Trans. on Electromagnetic Compatibility, 1985, Vol. 27, no. 2, pp. 99 – 100. DOI 10.1109/TEMC.1985.304262

  239. Klein S., Innes W., Price J. C.: Audiofrequency measurement of JFET noise versus temperature in a high‐impedance preamplifier. Review of Scientific Instruments, Vol. 56, no. 10, 1985, pp. 1941 – 1945. DOI 10.1063/1.1138531

  240. Calandra E. F., Martines G., Sannino M.: Characterization of GaAs FET's in Terms of Noise, Gain, and Scattering Parameters Through a Noise Parameter Test Set. IEEE Trans. on MTT, Vol. 32, no. 3, 1984, pp. 231 – 237. DOI 10.1109/TMTT.1984.1132658

  241. Larock V. D., Meys R. P.: Automatic Noise Temperature Measurement Through Frequency Variation. IEEE Trans. on MTT, Vol. 30, no. 8, 1982, pp. 1286 – 1288. DOI 10.1109/TMTT.1982.1131242

  242. Strid E. W.: Measurement of Losses in Noise-Matching Networks. IEEE Trans.on MTT, Vol. 29, no. 3, 1981, pp. 247 – 252. DOI 10.1109/TMTT.1981.1130335

  243. Chovet A., Viktorovitch P.: Le bruit électrique (3ème partie): représentation symbolique et méthodes de mesures. L'Onde électrique, Vol. 58, no. 1, 1978, pp. 69 – 80.

  244. Adamian V., Uhlir A.: A Novel Procedure for Receiver Noise Characterization. IEEE Trans. on Instr. & Meas., Vol. 22, 1973, pp. 181 – 182. DOI 10.1109/TIM.1973.4314135

  245. Haslett J.W., E.J.M. Kendall: The Measurement of Low-Frequency Noise from 30 to 300 K. Journal of Physics E, (Scientific Instruments), Vol. 5, no. 12, 1972, pp. 1149 – 1151. DOI 10.1088/0022-3735/5/12/005

  246. Yajima H., Fujioka T.: New method of measuring noise parameters of electron beams using two fixed cavities. IEEE Trans on ED, Vol. 17, no. 2, 1970, pp. 166 – 168. DOI 10.1109/T-ED.1970.16944

  247. Haslett J.W., L.P. Dennis, F.N. Trofimenkoff, R.B. Streets Jr.: Noise Measurements at Audio and Sub-Audio Frequencies Using Statistical Analysis. Proc. IEEE, Vol. 58, no. 11, 1970, pp. 1874 – 1876. DOI 10.1109/PROC.1970.8056

  248. Bates C., Ettenberg M.: Measurement of the Probability Density Function of a Microwave Noise Generator. IEEE Trans. on MTT, Vol. 16, no. 9, 1968, pp. 793 – 795. DOI 10.1109/TMTT.1968.1126788

  249. Miller C. K. S., Daywitt W.C., Arthur M.G.: Noise Standards, Measurements and Receiver Noise Definitions. Proc. of the IEEE, Vol. 55, no. 6, 1967, pp. 865 – 877. DOI 10.1109/PROC.1967.5700

  250. M. M. Karliner, Yu, K. Sorokin: Calibration of diode noise generators on the basis of the duality principle. Measurement Techniques, Vol. 4, no. 10, 1961, pp. 830 – 834. DOI 10.1007/BF00980873 http://www.springerlink.com/content/j53x1r62u2452542/

  251. I.R.E. Subcommit. 7.9 on Noise: I.R.E. Standards on Methods of Measuring Noise in Linear Two Ports. Proc. of the IRE., Vol. 48, no. 1, 1960, pp. 60 – 68. DOI 10.1109/JRPROC.1960.287380

  252. Conrad J.T., Newmann N., Stansbury A.P.: A Recommended Standard Resistor-Noise Test System. IRE Trans on Component Parts, Vol. CP-7, no. 3, 1960, pp. 71 – 88. DOI 10.1109/TCP.1960.1136451

  253. S. Saito: New method of measuring the noise parameters of an electron beam. IRE Trans on Electron Devices, Vol. 5, no. 4, 1958, pp. 264 – 275. DOI 10.1109/T-ED.1958.14433

  254. Standards on Electron Devices: Methods of Measuring Noise. Proc of the IRE, Vol. 41, no. 7, July 1953, pp 890 – 896.

  255. Bell D. A.: Measurement of Shot and Thermal Noise. Wireless Eng., Vol. 18, March, 1941, pp. 95 – 98.

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