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NOISE MEASUREMENT and PARAMETER EXTRACTION

Measurement began our might”

(W. B. Yeats)

  1. Urano Chiharu, Yamada Takahiro, Maezawa Masaaki, et al.: Measuring the Boltzmann's Constant Using Superconducting Integrated Circuit. IEEE Trans on Instr. & Meas., Vol. 66, no. 6, 2017, pp. 1323 – 1328. DOI 10.1109/TIM.2016.2637598

  2. Nigmatullin R.R., Maione G., Lino P., Saponaro F., Wei Zhang: The general theory of the Quasi-reproducible experiments: How to describe the measured data of complex systems? Communications in Nonlinear Science & Numerical Simulation, Vol. 42, 2017, pp. 324 – 341. https://doi.org/10.1016/j.cnsns.2016.05.019

  3. Urano C., Yamazawa K., Kaneko N-H: Measurement of the Boltzmann constant by Johnson noise thermometry using a superconducting integrated circuit. Metrologia, Vol. 54, no. 6, 2017, pp. 847 – 855. DOI 10.1088/1681-7575/aa7cdd

  4. Flowers-Jacobs N.E., Pollarolo A., Coakley K.J., et al.: A Boltzmann constant determination based on Johnson noise thermometry. Metrologia, Vol. 54, no. 5, 2017, pp. 730 – 737. DOI 10.1088/1681-7575/aa7b3f

  5. Qu Jifeng, Benz S.P., Coakley K., et al.: An improved electronic determination of the Boltzmann constant by Johnson noise thermometry. Metrologia, Vol. 54, no. 4, 2017, pp. 549 – 558. DOI 10.1088/1681-7575/aa781e

  6. Coakley K.J., Qu Jifeng: Spectral model selection in the electronic measurement of the Boltzmann constant by Johnson noise thermometry. Metrologia, Vol. 54, no. 2, 2017, pp. 204 – 217. https://doi.org/10.1088/1681-7575/aa5d21

  7. Shao Zilong, Zheng Gang, Efimov D., et al.: Identification, Estimation, and Control for Linear Uncertain Systems Using Measurements of Higher-Order Derivatives. J. of Dynamic Systems Measurement & Control - Trans of the ASME, Vol. 139, no. 12, 2017, Article # 124501, 6 pages. DOI 10.1115/1.4037007

  8. Mauch D.L., Zutavern F.J., Delhotal J.J., et al.: Ultrafast Reverse Recovery Time Measurement for Wide-Bandgap Diodes. IEEE Trans on Power Electronics, Vol. 32, no. 12, 2017, pp. 9333 – 9341. DOI 10.1109/TPEL.2017.2657491

  9. Rybalko Oleksandr: A cryogenic measurement setup for characterization microwave devices. Microwave & Optical Techn. Lett., Vol. 59, no. 12, 2017, pp. 3123 – 3127. DOI 10.1002/mop.30888

  10. Capo Sanchez J., de Campos M.F., Padovese L.R.: Comparison Between Different Experimental Set-Ups for Measuring the Magnetic Barkhausen Noise in a Deformed 1050 Steel. J. of Nondestructive Evaluation, Vol. 36, no. 4, 2017, Article # 66. DOI 10.1007/s10921-017-0445-1

  11. Awan Fahim Gohar, Kiran Asima: Cancellation of interference for emission measurement in open area test site. Measurement, Vol. 111, 2017, pp. 183 – 196. DOI 10.1016/j.measurement.2017.07.037

  12. Ding Xukai, Zhu Kunpeng, Li Hongsheng: A Switch-Bridge-Based Readout Circuit for Differential Capacitance Measurement in MEMS Resonators. IEEE Sensors Journal, Vol. 17, no. 21, 2017, pp. 6978 – 6985. DOI 10.1109/JSEN.2017.2755063

  13. Muduli Priya Ranjan, Mandal Atindra Kanti, Mukherjee Anirban: An Antinoise-Folding Algorithm for the Recovery of Biomedical Signals From Noisy Measurements. IEEE Trans on Instr. & Meas., Vol. 66, no. 11, 2017, pp. 2909 – 2916. DOI 10.1109/TIM.2017.2734018

  14. Zhang Huan, Wang Shuo, Li Yiming, et al.: Two-Capacitor Transformer Winding Capacitance Models for Common-Mode EMI Noise Analysis in Isolated DC-DC Converters. IEEE Trans on Power Electronics, Vol. 32, no. 11, 2017, pp. 8458 – 8469. DOI 10.1109/TPEL.2017.2650952

  15. Kono Naoto, Ito Fumihiko, Iida Daisuke, et al.: Impulse Response Measurement of Few-Mode Fiber Systems by Coherence-Recovered Linear Optical Sampling. J. of Lightwave Technology, Vol. 35, no. 20, 2017, pp. 4392 – 4398. DOI 10.1109/JLT.2017.2730845

  16. Umetani Kazuhiro, Aikawa Kyota, Hiraki Eiji: Straightforward Measurement Method of Common Source Inductance for Fast Switching Semiconductor Devices Mounted on Board. IEEE Trans on Industrial Electronics, Vol. 64, no. 10, 2017, pp. 8258 – 8267. DOI 10.1109/TIE.2017.2694411

  17. Delehaye M., Millo J., Bourgeois P.-Y., et al.: Residual Phase Noise Measurement of Optical Second Harmonic Generation in PPLN Waveguides. IEEE Photonics Technology Lett., Vol. 29, no. 19, 2017, pp. 1639 – 1642. DOI 10.1109/LPT.2017.2741667

  18. Gu Zhen, Wang Huifeng, Ying Yi-Lun, et al.: Ultra-low noise measurements of nanopore-based single molecular detection. Science Bulletin, Vol. 62, no. 18, 2017, pp. 1245 – 1250. DOI 10.1016/j.scib.2017.09.005

  19. Zhang Fangzheng, Shi Jingzhan, Pan Shilong: Wideband microwave phase noise measurement based on photonic-assisted I/Q mixing and digital phase demodulation. Optics Express, Vol. 25, no. 19, 2017, pp. 22760 – 22768. DOI 10.1364/OE.25.022760

  20. Tewari Sumit, Sabater Carlos, Kumar Manohar, et al.: Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime. Review of Scientific Instruments, Vol. 88, no. 9, 2017, Article # 093903. DOI 10.1063/1.5003391

  21. Escalona I., Avaria G., Diaz M., et al.: Electromagnetic Burst Measurement System Based on Low Cost UHF Dipole Antenna. Energies, Vol. 10, no. 9, 2017, Article # 1415. DOI 10.3390/en10091415

  22. Schweiger T., Krueger B., Wiedmann F.: Cyclostationary Stochastic Jitter Measurement Method With Uncertainty Prediction. IEEE Trans on Instr. & Meas., Vol. 66, no. 9, 2017, pp. 2371 – 2379. DOI 10.1109/TIM.2017.2706478

  23. Qiu Haimi, Fang Wenxiao, En Yunfei, et al.: Movable Noncontact RF Current Measurement on a PCB Trace. IEEE Trans on Instr. & Meas., Vol. 66, no. 9, 2017, pp. 2464 – 2473. DOI 10.1109/TIM.2017.2698900

  24. Cervellini P., Antoszczuk P., Garcia Retegui R., et al.: Current Ripple Amplitude Measurement in Multiphase Power Converters. IEEE Trans on Power Electronics, Vol. 32, no. 9, 2017, pp. 6684 – 6688. DOI 10.1109/TPEL.2017.2686784

  25. Pan Shilong, Yao Jianping: Photonics-Based Broadband Microwave Measurement. J. of Lightwave Technology, Vol. 35, no. 16, 2017, pp. 3498 – 3513. DOI 10.1109/JLT.2016.2587580

  26. Islam A.K.M. Mahfuzul, Nakai Tatsuya, Onodera Hidetoshi: Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement. IEEE Trans on Semiconductor Manufacturing, Vol. 30, no. 3, 2017, pp. 216 – 226. DOI 10.1109/TSM.2017.2715168

  27. Lin Han-Nien, Chen Hung-Chi, Kuo Chung-Wei, et al.: Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits. IET Science, Measurement & Technology, Vol. 11, no. 5, 2017, pp. 655 – 665. DOI 10.1049/iet-smt.2016.0348

  28. Hao Shilei, Hu Tongning, Gu Qun Jane: A 10-GHz Delay Line Frequency Discriminator and PD/CP-Based CMOS Phase Noise Measurement Circuit. IEEE Trans on MTT, Vol. 65, no. 7, 2017, pp. 2361 – 2372. DOI 10.1109/TMTT.2017.2650222

  29. Grobler Inus, Gitau Michael Njoroge: Analysis, modelling and measurement of the effects of aluminium and polymer heatsinks on conducted electromagnetic compatibility in DC-DC converters. IET Science, Measurement & Technology, Vol. 11, no. 4, 2017, pp. 414 – 422. DOI 10.1049/iet-smt.2016.0218

  30. Cardenas-Olaya A.C., Rubiola E., Friedt J.-M., et al.: Noise characterization of analog to digital converters for amplitude and phase noise measurements. Review of Scientific Instruments, Vol. 88, no. 6, 2017, Article # 065108. DOI 10.1063/1.4984948

  31. Freiberger K., Enzinger H., Vogel C.: A Noise Power Ratio Measurement Method for Accurate Estimation of the Error Vector Magnitude. IEEE Trans on MTT, Vol. 65, no. 5, Part: 1, 2017, pp. 1632 – 1645. DOI 10.1109/TMTT.2017.2654221

  32. Kukushkin S.S., Suprun A.S.: Methods for Detection and Correction of Errors in Data Based on Nontraditional Representation of Measurement Results by Image-Remainders. Measurement Techniques, Vol. 59, no. 12, 2017, pp. 1239 – 1244. DOI 10.1007/s11018-017-1122-6

  33. Abdul-Rahman Ahmed, Dong-Hyun Lee, Kyung-Whan Yeom: On-wafer noise parameters measurement using an extended six-port network and conventional noise figure analyzer. Int. J. of Microwave and Wireless Technologies, Vol. 9, no. 4, 2017, pp. 821 – 829. https://doi.org/10.1017/S1759078716000842

  34. Crescentini M., Tartagni M., Morgan H., Traverso P.A.: A compact low-noise broadband digital picoammeter architecture. Measurement, Vol. 100, 2017, pp. 194 – 204. https://doi.org/10.1016/j.measurement.2016.12.040

  35. Morikawa Takanori, Yokota Kazumichi, Tsutsui Makusu, et al.: Fast and low-noise tunnelling current measurements for single-molecule detection in an electrolyte solution using insulator-protected nanoelectrodes. Nanoscale, Vol. 9, no. 12, 2017, pp. 4076 – 4081. DOI 10.1039/c6nr09278k

  36. Kim Tae-Young, Song Younggul, Cho Kyungjune, et al.: Analysis of the interface characteristics of CVD-grown monolayer MoS2 by noise measurements. Nanotechnology, Vol. 28, no. 14, 2017, Article # 145702. DOI 10.1088/1361-6528/aa60f9

  37. Chen Xuesong, Chen Chih-Hung, Lee Ryan, et al.: Direct Deembedding of Noise Factors for On-Wafer Noise Measurement. IEEE Trans on MTT, Vol. 65, no. 3, 2017, pp. 916 – 922. DOI 10.1109/TMTT.2016.2627555

  38. Nagata K., Nakamura T., Batle J., et al.: Boolean Approach to Dichotomic Quantum Measurement Theories. J. of the Korean Physical Society, Vol. 70, no. 3, 2017, pp. 229 – 235. DOI 10.3938/jkps.70.229

  39. Ryger I., Harber D., Stephens M., et al.: Noise characteristics of thermistors: Measurement methods and results of selected devices. Review of Scientific Instruments, Vol. 88, no. 2, 2017, Article # 024707. DOI 10.1063/1.4976029

  40. Boudier D., Cretu B., Simoen E., et al.: Low frequency noise assessment in N- and P-channel sub-10 nm triple-gate FinFETs: Part II: Measurements and results. Solid-State Electronics, Vol. 128, Special Issue: SI, 2017, pp. 109 – 114. DOI 10.1016/j.sse.2016.10.013

  41. Kwon Dohyeon, Jeon Chan-Gi, Shin Junho, et al.: Reference-free, high-resolution measurement method of timing jitter spectra of optical frequency combs. Scientific Reports, Vol. 7, 2017, Article # 40719. DOI 10.1038/srep40917

  42. Turkmen S., Aktas B., Atlar M., et al.: On-board measurement techniques to quantify underwater radiated noise level. Ocean Engineering, Vol. 130, 2017, pp. 166 – 175. DOI 10.1016/j.oceaneng.2016.11.070

  43. Gras S., Yu H., Yam W., et al.: Audio-band coating thermal noise measurement for Advanced LIGO with a multimode optical resonator. Physical Review D, Vol. 95, no. 2, 2017, Article # 022001. DOI 10.1103/PhysRevD.95.022001

  44. Liu Fang, Zhou Yaoyao, Yu Juan, et al.: Squeezing-enhanced fiber Mach-Zehnder interferometer for low-frequency phase measurement. Applied Physics Lett., Vol. 110, no. 2, 2017, Article # 021106. DOI 10.1063/1.4973895

  45. Ahmed A.-R., Yeom K.-W.: A Low-Cost Noise Wave Correlator for the Extraction of 2-Port Noise Parameters from Cold Noise Power Measurement. Int. Journal of Wireless & Microwave Technology (IJWMT), Vol. 6, no. 5, 2016, pp. 10 – 21. DOI 10.5815/ijwmt.2016.05.02

  46. Hu Zhijian, Xiong Min, Shang Haozhi, et al.: Anti-Interference Measurement Methods of the Coupled Transmission-Line Capacitance Parameters Based on the Harmonic Components. IEEE Trans on Power Delivery, Vol. 31, no. 6, 2016, pp. 2464 – 2472. DOI 10.1109/TPWRD.2015.2465840

  47. Kim Youngwoo, Cho Jonghyun, Kim Jonghoon J., et al.: Measurement and Analysis of Glass Interposer Power Distribution Network Resonance Effects on a High-Speed Through Glass Via Channel. IEEE Trans on EMC, Vol. 58, no. 6, 2016, pp. 1747 – 1759. DOI 10.1109/TEMC.2016.2587824

  48. Chen Zhiming, Xiong Miao, Li Bohao, et al.: Electrical Characterization of Coaxial Silicon-Insulator-Silicon Through-Silicon Vias: Theoretical Analysis and Experiments. IEEE Trans on ED, Vol. 63, no. 12, 2016, pp. 4880 – 4887. DOI 10.1109/TEMC.2016.2587824

  49. Cao Zhewei, Yang Chun, Zhou Zhenghua: Cross-Correlation Measurements of Phase Noise Induced by Relative Intensity Noise in Photodetectors. J. of the Optical Society of Korea, Vol. 20, no. 6, 2016, pp. 694 – 697. DOI 10.3807/JOSK.2016.20.6.694

  50. D'Arco M., de Vito L.: A Novel Method for Phase Noise Measurement Based on Cyclic Complementary Autocorrelation. IEEE Trans on Instr. & Meas., Vol. 65, no. 12, 2016, pp. 2685 – 2692. DOI 10.1109/TIM.2016.2610138

  51. Blazek D., Neslusan M., Micica M., Pistora J.: Extraction of Barkhausen noise from the measured raw signal in high-frequency regimes. Measurement, Vol. 94, 2016, pp. 456 – 463. DOI 10.1016/j.measurement.2016.08.022

  52. Reboredo H., Renna F., Calderbank R., et al.: Bounds on the Number of Measurements for Reliable Compressive Classification. IEEE Trans on Signal Processing, Vol. 64, no. 22, 2016, pp. 5778 – 5793. DOI 10.1109/TSP.2016.2599496

  53. Nakaya Ryo, Ando Hidenawo, Anzai Daisuke, et al.: Statistical Measurement of Electromagnetic Noise Characteristics of ESD in Wireless Frequency Bands and Influence Evaluation on Communication Performance. IEICE Trans on Communications, Vol. E99B, no. 11, 2016, pp. 2399 – 2405. DOI 10.1587/transcom.2015EBP3527

  54. Himmelfarb Michael, Belostotski Leonid: Noise Parameters of Gilbert Cell Mixers. IEEE Trans on MTT, Vol. 64, no. 10, 2016, pp. 3163 – 3174. DOI 10.1109/TMTT.2016.2600327

  55. Tikhonov E.S., Shovkun D.V., Ercolani D., et al.: Noise thermometry applied to thermoelectric measurements in InAs nanowires. Semiconductor Science and Technology, Vol. 31, no. 10, 2016, Article # 104001. DOI 10.1088/0268-1242/31/10/104001

  56. Randa James: Detailed Study of Uncertainties in OnWafer Transistor Noise-Parameter Measurements. NIST Technical Note 1939, 2016. https://doi.org/10.6028/NIST.TN.1939

  57. Samoila C., Ursutiu D., Schleer Walter-Harald, et al.: Using Noise and Fluctuations for In Situ Measurements of Nitrogen Diffusion Depth. Materials, Vol. 9, no. 10, 2016, Article # 819. DOI 10.3390/ma9100819

  58. Sergeev V.A., Rezchikov S.E.: The Systematic Error of Measurement of the Exponent of the Frequency Dependence of the Spectrum of Low-Frequency Noise. Measurement Techniques, Vol. 58, no. 10, 2016, pp. 1160 – 1166. DOI 10.1007/s11018-015-0859-z

  59. Kalman O., Darazs Z., Brennecke F., et al.: Magnetic-noise-spectrum measurement by an atom laser in gravity. Physical Review A, Vol. 94, no. 3, 2016, Article # 033626. DOI 10.1103/PhysRevA.94.033626

  60. Kim Dong Sik: Noise Power Spectrum Measurements in Digital Imaging With Gain Nonuniformity Correction. IEEE Trans on Image Processing, Vol. 25, no. 8, 2016, pp. 3712 – 3722. DOI 10.1109/TIP.2016.2574985

  61. Adachi Y., Oyama D., Kawai J., et al.: Low-Noise Closed-Cycle Helium Recondensing for SQUID Biomagnetic Measurement System. IEEE Trans on Applied Superconductivity, Vol. 26, no. 5, 2016, Article # 1600704. DOI 10.1109/TASC.2016.2532805

  62. Karatsori T.A., Theodorou C.G., Mescot X., et al.: Study of Hot-Carrier-Induced Traps in Nanoscale UTBB FD-SOI MOSFETs by Low-Frequency Noise Measurements. IEEE Trans on ED, Vol. 63, no. 8, 2016, pp. 3222 – 3228. DOI 10.1109/TED.2016.2583504

  63. Barzegar Alireza Salehi, Banai Ali, Farzaneh Forouhar: Sensitivity Improvement of Phase-Noise Measurement of Microwave Oscillators Using IF Delay Line Based Discriminator. IEEE Microwave & Wireless Comp. Lett., Vol. 26, no. 7, 2016, pp. 546 – 548. DOI 10.1109/LMWC.2016.2575003

  64. Schmoele J., Dragosits M., Hepach H., Aspelmeyer M.: A micromechanical proof-of-principle experiment for measuring the gravitational force of milligram masses. Classical and Quantum Gravity, Vol. 33, no. 12, 2016, Article # 125031. DOI 10.1088/0264-9381/33/12/125031

  65. Giusi G., Giordano O., Scandurra G., et al.: High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors. Review of Scientific Instruments, Vol. 87, no. 5, 2016, Article # 059902. DOI 10.1063/1.4950949

  66. Huang Qiang, Teng Zhaosheng, Tang Xiang, et al.: Mass Measurement Method for the Electronic Balance Based on Continuous-Time Sigma-Delta Modulator. IEEE Trans on Instr. & Meas., Vol. 65, no. 6, 2016, pp. 1300 – 1309. DOI 10.1109/TIM.2015.2490358

  67. Lai Zhilu, Lei Ying, Zhu Songye, et al.: Moving-window extended Kalman filter for structural damage detection with unknown process and measurement noises. Measurement, Vol. 88, 2016, pp. 428 – 440. DOI 10.1016/j.measurement.2016.04.016

  68. Carla Marcello: Measure of 1/f noise using the sound card of a PC. American Journal of Physics, Vol. 84, no. 4, 2016, pp. 311 – 316. DOI 10.1119/1.4941305

  69. Xu Shanzhi, Wang Peng, Dong Yonggui: Measuring Electrolyte Impedance and Noise Simultaneously by Triangular Waveform Voltage and Principal Component Analysis. Sensors, Vol. 16, no. 4, 2016, Article # 576. DOI 10.3390/s16040576

  70. Antoniali M., Versolatto F., Tonello A.M.: An Experimental Characterization of the PLC Noise at the Source. IEEE Trans on Power Delivery, Vol. 31, no. 3, 2016, pp. 1068 – 1075. DOI 10.1109/TPWRD.2015.2452939

  71. Pala J., Soka M.: Investigation of Two-Stage Magnetic Barkhausen Noise Measurement Method at Power Line Frequency. Acta Physica Polonica A, Vol. 129, no. 3, 2016, pp. 383 – 387. http://dx.doi.org/10.12693/APhysPolA.129.383

  72. Auinger B., Freidl P., Gadringer M., et al.: EMC performance measurements for professional wireless microphone systems. Elektrotechnik und Informationstechnik, Vol. 133, no. 1, 2016, pp. 32 – 38. DOI 10.1007/s00502-016-0386-x

  73. Busko V.N., Vlasov G.G.: Experimental setup for modeling and study of complex stress state in ferromagnetic materials. Devices and Methods of Measurements, Vol. 7, no. 2, 2016, pp. 152 – 160. DOI 10.21122/2220-9506-2016-7-2-152-160

  74. Wu Minshun, Liu Zhiqiang, Xu Li, et al.: Accurate and cost-effective technique for jitter and noise separation based on single-frequency measurement. Electronics Lett., Vol. 52, no. 2, 2016, pp. 106 – 107. DOI 10.1049/el.2015.2333

  75. Al-Othman A.K., El-Naggar K.M., AlSharidah M.E.: On-line Estimation of Transmission Line Parameters Using Synchronized Measurements. Electric Power Components & Systems, Vol. 44, no. 2, 2016, pp. 233 – 239. DOI 10.1080/15325008.2015.1104564

  76. Torres L., Arcambal C., Delisle C., Dong Q., Jin Y., Rodriguez L., Cara C.: First Measurement of the Intrinsic Noise of a HEMT at Sub-Kelvin Temperatures. Journal of Low Temperature Physics, Vol. 184, no. 1, 2016, pp 466 – 472. DOI 10.1007/s10909-016-1565-1

  77. Bednyakov P.S., Shnaidshtein I.V., Strukov B.A.: Investigation of ferroelectric materials by the thermal noise method: Advantages and limitations. Ferroelectrics, Vol. 500, no. 1, 2016, pp. 203 – 217. DOI 10.1080/00150193.2016.1229523

  78. Hosten Onur, Engelsen Nils J., Krishnakumar Rajiv, Kasevich M.A.: Measurement noise 100 times lower than the quantum-projection limit using entangled atoms. Nature, Vol. 529, no. 7587, 2016, pp. 505 – 508. http://dx.doi.org/10.1038/nature16176

  79. Reschikoff S.E.: About algorithms for automated measurement of LF noise in semiconductor devices. XVI Int. Young Scientists' Conf. on Applied Physics, 2016, pp. 109 – 110.

  80. Martinovic M.M., Zaslavsky A., Maksimovic M., et al.: Quasi-thermal noise measurements on STEREO: Kinetic temperature deduction using electron shot noise model. J. of Geophysical Research - Space Physics, Vol. 121, no. 1, 2016, pp. 129 – 139. DOI 10.1002/2015JA021710

  81. Kuroda Rihito, Teramoto Akinobu, Sugawa Shigetoshi: Random Telegraph Noise Measurement and Analysis based on Arrayed Test Circuit toward High S/N CMOS Image Sensors. 29th IEEE Int. Conf. on Microelectronic Test Structures (ICMTS), 2016, pp. 46 – 51. DOI 10.1109/ICMTS.2016.7476172

  82. Chang Su-Wei, Aumentado Jose, Wong Wei-Ting, et al.: Noise Measurement of Cryogenic Low Noise Amplifiers Using a Tunnel-Junction Shot-Noise Source. IEEE MTT-S Int. Microwave Symp (IMS), 2016. DOI 10.1109/MWSYM.2016.7538226

  83. Soliman A., Janzen A., Weinreb S.: Thermal Modelling of Coaxial line for Cryogenic Noise Measurements. URSI Asia-Pacific Radio Science Conf. (URSI AP-RASC), 2016, pp. 900 – 903. DOI 10.1109/URSIAP-RASC.2016.7601381

  84. Salzenstein P., Wu T.Y.: Uncertainty analysis for a phase-detector based phase noise measurement system. Measurement, Vol. 85, 2016, pp. 118 – 123. DOI 10.1016/j.measurement.2016.02.026

  85. Groves P., Conroy P., Belostotski L., Okoniewski M.: Measuring antenna noise parameters using a set of Wheeler caps. 10th European Conf on Antennas and Propagation (EuCAP), 2016, pp. 1 – 4. DOI 10.1109/EuCAP.2016.7481866

  86. Fangzheng Zhang, Dengjian Zhu, Shilong Pan: Photonic-assisted wideband phase noise measurement of microwave signal sources. Electronics Lett., Vol. 51, no. 16, 2015, pp. 1272-1274 DOI 10.1049/el.2015.0810

  87. Andee Y.: Advanced Techniques for Noise Figure and Noise Parameters Measurement of Differential Amplifiers. Ph.D. dissertation, University of Lille 1, 2015, 114 pages. https://ori-nuxeo.univ-lille1.fr/nuxeo/site/esupversions/f2cba8d2-4f77-4335-917b-123ada6f5f50

  88. Weiming Yao, Gilardi G., Calabretta N., Smit M.K., Wale M.J.: Experimental and Numerical Study of Electrical Crosstalk in Photonic-Integrated Circuits. J. of Lightwave Technology, Vol. 33, no. 4, 2015, pp. 934 – 942. DOI 10.1109/JLT.2015.2391172

  89. Butta M., Ripka P., Kraus L.: Effect of Stress-Induced Anisotropy on the Noise of Ring-Core Fluxgate. IEEE Trans on Magnetics, Vol. 51, no.1, 2015, pp. 1 – 4. DOI 10.1109/TMAG.2014.2358793

  90. Tzu-Chien Hsueh, O'Mahony F., Mansuri M., Casper B.: An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements. IEEE Journal of Solid State Circ., Vol. 50, no. 7, 2015, pp. 1711 – 1721. DOI 10.1109/JSSC.2015.2431071

  91. Stadler A.W., Kolek A., Zawislak Z., Dziedzic A.: Noise Measurements of Resistors with the Use of Dual-Phase Virtual Lock-In Technique. Metrology and Measurement Systems, Vol. 22, no. 4, 2015, pp. 503 – 512. DOI 10.1515/mms-2015-0051

  92. Carniti P., Cassina L., Gotti C., Maino M., Pessina G.: A Technique for Noise Measurement Optimization with Spectrum Analyzers. Journal of Instrumentation, Vol. 10, 2015, Article # P08016. DOI 10.1088/1748-0221/10/08/P08016

  93. Zhu Dengjian, Zhang Fangzheng, Zhou Pei, et al.: Phase Noise Measurement of Wideband Microwave Sources Based on a Microwave Photonic Frequency Down-Converter. Optics Lett., Vol. 40, no. 7, 2015, pp. 1326 – 1329. DOI 10.1364/OL.40.001326

  94. Crossno J., Liu Xiaomeng, Ohki T.A., Kim Philip, Fong Kin Chung: Development of high frequency and wide bandwidth Johnson noise thermometry. Applied Physics Lett., Vol. 106, no. 2, 2015, Article # 023121. DOI 10.1063/1.4905926

  95. Katsivelis P.S., Gonos I.F., Stathopulos I.A.: Human-to-metal electrostatic discharge current measurements - Notes on the ESD current waveform. J. of Electrostatics, Vol. 77, 2015, pp. 182 – 190. DOI 10.1016/j.elstat.2015.08.006

  96. Andersen A., Dennison J.R., Sim A.M., et al.: Measurements of Endurance Time for Electrostatic Discharge of Spacecraft Materials: A Defect-Driven Dynamic Model. IEEE Trans on Plasma Science, Vol. 43, no. 9, 2015, Special no. SI, Part: 1, pp. 2941 – 2953. DOI 10.1109/TPS.2015.2428258

  97. Toyoda K., Kawano A., Miyazaki S., Cho M.: Flashover Discharge Measurement With Uniform Surface Charging and Modeling of Current Waveform. IEEE Trans on Plasma Science, Vol. 43, no. 9, 2015, Special no. SI, Part: 1, pp. 3064 – 3069. DOI 10.1109/TPS.2015.2404853

  98. Hoffmann R., Ferguson D., Patton J., et al.: AFRL Round-Robin Test Results on Plasma Propagation Velocity. IEEE Trans on Plasma Science, Vol. 43, no. 9, 2015, Special no. SI, Part: 1, pp. 3006 – 3013. DOI 10.1109/TPS.2015.2465865

  99. Lehmeyer B., M.T. Ivrlač, J.A. Nossek: LNA noise parameter measurement. European Conf on Circuit Theory and Design (ECCTD), 2015, pp. 1 – 4. DOI 10.1109/ECCTD.2015.7300071

  100. Sui Chunchun, Bai Siqi, Zhu Ting, et al.: New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter From Measurements. IEEE Trans on EMC, Vol. 57, no. 4, 2015, Special no. SI, pp. 877 – 884. DOI 10.1109/TEMC.2014.2388236

  101. Chobola Z., Lunak M., Vanek J., et al.: Low-Frequency Noise Measurements Used for Quality Assessment of GaSb Based Laser Diodes Prepared by Molecular Beam Epitaxy. J. of Electrical Engineering - Elektrotechnicky casopis, Vol. 66, no. 4, 2015, pp. 226 – 230. DOI 10.2478/jee-2015-0036

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